Bench Microscope (BW-D2)
CN310102856SActive Publication Date: 2026-07-21NANTONG BAOWEI ELECTRONIC TECHNOLOGY CO LTD
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- NANTONG BAOWEI ELECTRONIC TECHNOLOGY CO LTD
- Filing Date
- 2026-02-28
- Publication Date
- 2026-07-21
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Figure 000007_ABST
Abstract
1. The name of the design product: the reticle instrument (BW-D2 type). 2. The use of the design product: for reticle instrument. 3. The design points of the design product: in the combination of shape and pattern. 4. The picture or photo that can best show the design points: perspective view.
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