Integrated circuit test module
CN310103023SActive Publication Date: 2026-07-21CHINA ELECTRONICS STANDARDIZATION INST
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- CHINA ELECTRONICS STANDARDIZATION INST
- Filing Date
- 2026-02-13
- Publication Date
- 2026-07-21
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Figure 000001_ABST
Abstract
1. The name of the design product: integrated circuit test module. 2. The use of the design product: the design product is used for testing the output high level voltage of integrated circuit. 3. The design points of the design product: the shape of the product. 4. The picture or photo that best indicates the design points: front view.
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