High-temperature reverse polarization test equipment
CN310124086SActive Publication Date: 2026-07-31WUHAN JINGLI ELECTRONICS TECH
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- WUHAN JINGLI ELECTRONICS TECH
- Filing Date
- 2025-12-24
- Publication Date
- 2026-07-31
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Figure 000007_ABST
Abstract
1. Name of the product in this design: High Temperature Reverse Bias Testing Equipment. 2. Purpose of this design: Reliability testing of semiconductor devices. 3. The key design features of this product are the combination of shape and pattern. 4. The image or photograph that best illustrates the design's key points: 3D view 1. 5. Other situations requiring explanation: The enlarged view of part A is an enlarged view of part A in 3D view 1, and the enlarged view of part B is an enlarged view of part B in 3D view 2.
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