High-temperature reverse polarization test equipment

CN310124086SActive Publication Date: 2026-07-31WUHAN JINGLI ELECTRONICS TECH
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
WUHAN JINGLI ELECTRONICS TECH
Filing Date
2025-12-24
Publication Date
2026-07-31

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Abstract

1. Name of the product in this design: High Temperature Reverse Bias Testing Equipment. 2. Purpose of this design: Reliability testing of semiconductor devices. 3. The key design features of this product are the combination of shape and pattern. 4. The image or photograph that best illustrates the design's key points: 3D view 1. 5. Other situations requiring explanation: The enlarged view of part A is an enlarged view of part A in 3D view 1, and the enlarged view of part B is an enlarged view of part B in 3D view 2.
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