X-ray inspection equipment (XVT5100)
CN310146826SActive Publication Date: 2026-08-14苏州盛源视界测量技术有限公司
View PDF 0 Cites 0 Cited by
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2026-03-03
- Publication Date
- 2026-08-14
Smart Images
Figure 000007_ABST
Abstract
1. Name of the product in this design: X-ray inspection equipment (XVT5100). 2. Purpose of this design: To perform non-destructive testing of internal defects and precise dimensional measurement of parts. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: a 3D model.
Need to check novelty before this filing date? Find Prior Art