Graphical user interface for comprehensive scanning testing of electronic devices
CN310148506SActive Publication Date: 2026-08-14TUOTUO TECHNOLOGY (SUZHOU) CO LTD
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2026-01-04
- Publication Date
- 2026-08-14
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Figure 000001_ABST
Abstract
1. Name of the product in this design: Graphical User Interface for Comprehensive Scanning Test of Electronic Equipment. 2. Intended use of this design: for use in an electronic device. 3. The key design feature of this product is its graphical user interface. 4. The picture or photo that best illustrates the key design points: Design 1 front view. 5. As is customary, rear view, top view, and left and right views are omitted. 6. Design 1 is designated as the basic design. 7. Purpose of the graphical user interface: A graphical user interface used for comprehensive scanning tests of electronic devices. Design 1's main view is the main interface of the optoelectronic integrated scanning test software. Clicking the "Mapping" button at the top of the main view will take you to the Mapping scanning test interface. For example, design 1, the interface changes state diagram. Design 2's main view is the main interface of the optoelectronic integrated scanning test software. Click the "Spectrum" button at the top of Design 2's main view to enter the Spectrum scanning test interface. For example, design 2 interface change state diagram. Design 3's main view is the main interface of the optoelectronic integrated scanning test software. Click the "Polarization" button at the top of Design 3's main view to enter the Polarization scanning test interface. For example, design a diagram showing the state changes of the interface.
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