Wafer burn-in test operation graphical user interface for electronic devices

Abstract

1. The name of the design product: electronic device wafer burn-in test operation graphical user interface. 2. The use of the design product: an electronic device. 3. The design points of the design product: in the graphical user interface. 4. The picture or photo that best indicates the design points: design 1 front view. 5. Design 2 is designated as the basic design. 6. The use of the graphical user interface: for testing wafer burn-in. 7. The human-computer interaction mode of the graphical user interface: design 1 front view is the wafer burn-in test main interface, in which "Drawers1", "Drawers2", "Drawers3", "Drawers4", "Drawers5", "Drawers6" can be clicked respectively to switch; design 2 front view has the same interaction mode as design 1 front view; in design 3 front view, the values below "Map Infor" on the right side can be edited. 8. Other circumstances that need to be explained: "X" in the interface represents text.

Images