Wafer defect pattern matching graphical user interface for electronic devices

Abstract

1. The name of the design product: wafer defect pattern matching graphical user interface for electronic device. 2. The use of the design product: wafer defect pattern matching and user interaction thereof. 3. The design points of the design product: in the graphical user interface. 4. The picture or photo that best indicates the design points: design 1 front view. 5. The electronic device is a conventional design, and other views of each design are omitted. 6. Design 1 is designated as the basic design. 7. The use of the graphical user interface: the design product is used for matching wafer defect patterns; the interface interaction process: based on the design 1 front view, click the "M" button in the upper right corner of the first wafer in design 1 interface change state figure 1, display design 1 interface change state figure 2, click "OK", display design 1 interface change state figure 3; based on the design 2 front view, frame the partial data in the four wafer figures, display design 2 interface change state figure 1, click the "M" button of the wafer figure in the lower right corner of design 2 interface change state figure 1, display design 2 interface change state figure 2, click "OK", display design 2 interface change state figure 3.

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