Integrated circuit parallel-serial test handler (gravity straight back)
CN310163628SActive Publication Date: 2026-08-21FUZHOU PALIDE ELECTRONICS TECH
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Patent Information
- Application Number
- CN202530769558.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-12-26
- Publication Date
- 2026-08-21
- Estimated Expiration
- 2040-12-26
Smart Images
Figure 000007_ABST
Abstract
1. The name of the design product: IC testing and sorting machine (gravity straight back type). 2. The use of the design product: for testing and sorting of chips. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view 1.
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