Die test socket
CN310175868SActive Publication Date: 2026-08-28POWERTECH CO LTD
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Patent Information
- Application Number
- CN202630131040.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2026-03-24
- Publication Date
- 2026-08-28
- Estimated Expiration
- 2041-03-24
Smart Images
Figure 000007_ABST
Abstract
1. The name of the design product: the test seat of the bare chip. 2. The use of the design product: for testing the electrical parameters of the cut bare chip, such as testing the switching time, the reverse recovery time of the diode and the short circuit current and other parameters. 3. The design points of the design product: in shape. 4. The picture or photo that best shows the design points: perspective view.
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