Semiconductor device parameter tester

Abstract

1. Name of the product in this design: Semiconductor Device Parameter Tester. 2. Purpose of this design: For comprehensive testing of dynamic current-voltage characteristic parameters of semiconductor devices, etc. 3. The key design features of this product are: the overall shape of the product, the outline of each component, the panel layout, and the arrangement of interfaces. 4. Images or photos that best illustrate the design points: Refer to Figure 1 for the combined usage. 5. Other components requiring explanation: This product is a component product with a non-unique combination relationship, consisting of six components: the main body of the device, four different circuit boards, and a baffle; additionally, four reference diagrams of combined use are submitted to clearly demonstrate the combination effect and usage status of the product components.

Images