Wafer Inspection Machine (WLD068G)
CN310192163SActive Publication Date: 2026-09-08VISINO TECH (XIAMEN) CO LTD
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Patent Information
- Application Number
- CN202630073321.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2026-02-09
- Publication Date
- 2026-09-08
- Estimated Expiration
- 2041-02-09
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Figure 000001_ABST
Abstract
1. Name of the product in this design: Wafer Inspection Machine (WLD068G). 2. Application of this design: This design is used for automated wafer inspection of semiconductors. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: a 3D model.
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