Integrated probe (J / B)
CN310197963SActive Publication Date: 2026-09-11SHANGHAI GND ETECH CO LTD
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Patent Information
- Application Number
- CN202630079959.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2026-02-11
- Publication Date
- 2026-09-11
- Estimated Expiration
- 2041-02-11
Smart Images
Figure 000007_ABST
Abstract
1. Name of the designed product: integrated probe (J type / B type). 2. Use of the designed product: test temperature. 3. Design points of the designed product: the overall structure and shape of the probe and the proportional relationship between the components. 4. Picture or photo that best shows the design points: Design 1 perspective view 1. 5. Design 1 is designated as the basic design.
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