MicroLED-scale defect detection equipment
CN310211606SActive Publication Date: 2026-09-18SHENZHEN HAINA SEMICONDUCTOR EQUIPMENT CO LTD
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Patent Information
- Application Number
- CN202630112085.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2026-03-13
- Publication Date
- 2026-09-18
- Estimated Expiration
- 2041-03-13
Smart Images
Figure 000007_ABST
Abstract
1. The name of the design product: Micro LED defect detection equipment. 2. The use of the design product: for electroluminescent defect detection of wafer-level Micro LED. 3. The design points of the design product: in shape. 4. The picture or photo that best shows the design points: perspective view. 5. Other circumstances that need to be explained: A is transparent material.
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