Dynamic Aging Test System (D-ES)
CN310235394SActive Publication Date: 2026-09-29SHANGHAI CIRCULATION SEMICON TECH CO LTD
View PDF 0 Cites 0 Cited by
Patent Information
- Application Number
- CN202630392504.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2026-07-28
- Publication Date
- 2026-09-29
- Estimated Expiration
- 2041-07-28
Smart Images
Figure 000001_ABST
Abstract
1. Name of the product in this design: Dynamic Aging Test System Panel Inspection Machine (D-ES). 2. Purpose of this design: For dynamic aging testing of chips. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: a 3D model.
Need to check novelty before this filing date? Find Prior Art