Sensor test device (DIE)
CN310244162SActive Publication Date: 2026-10-09SHENZHEN SAIZHI SEMICONDUCTOR TECHNOLOGY CO LTD
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Patent Information
- Application Number
- CN202630284482.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2026-06-04
- Publication Date
- 2026-10-09
- Estimated Expiration
- 2041-06-04
Smart Images
Figure 000007_ABST
Abstract
1. The name of the design product: sensor testing device (DIE). 2. The use of the design product: the design product is used for function and performance testing of DIE sensor. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view 1.
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