Wafer probe test apparatus
CN310257812SActive Publication Date: 2026-10-16SHENZHEN SEICHITECH TECHN CO LTD +1
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Patent Information
- Application Number
- CN202630244362.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2026-05-18
- Publication Date
- 2026-10-16
- Estimated Expiration
- 2041-05-18
Smart Images
Figure 000028_ABST
Abstract
1. The name of the design product: wafer probe test equipment. 2. The use of the design product: equipment for wafer level testing in semiconductor chip manufacturing. 3. The design points of the design product: in shape. 4. The picture or photo that best shows the design points: combination state figure 1.
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