Wafer inspection machine

CN310259302SActive Publication Date: 2026-10-16창추안 테크놀로지 (수저우) 컴퍼니 리미티드
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Patent Information

Application Number
CN202630211080.9
Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
Filing Date
2026-04-29
Publication Date
2026-10-16
Estimated Expiration
2041-04-29

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Abstract

1. Name of the design product: wafer inspection machine. 2. Use of the design product: for inspecting wafer defects. 3. Design points of the design product: in shape. 4. Picture or photo best indicating the design points: perspective view 1.
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