Fully automated probe station and its body

Abstract

1. The name of the design product: full-automatic probe station and its main body. 2. The use of the design product: the overall use and partial use of the design product are for the electrical parameter test of semiconductor chips. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: design 1 perspective view. 5. The bottom of the design product is not easy to see or cannot be seen during use, and the design 1 top view is omitted; the bottom of the design product is not easy to see or cannot be seen during use, and the design 2 top view is omitted. 6. Design 1 is designated as the basic design. 7. Other circumstances that need to be explained: the features represented by dashed lines in design 2 are not required to be protected.

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