Scanning electron microscope and methods for its use
The scanning electron microscope with three objective lenses and a condenser lens system provides high resolution, large depth of field, and wide field of view, addressing limitations of conventional systems by enabling flexible imaging modes and supporting diverse sample types and ion beam processing.
Patent Information
- Authority / Receiving Office
- DE · DE
- Patent Type
- Patents
- Current Assignee / Owner
- TESCAN GRP AS
- Filing Date
- 2017-05-19
- Publication Date
- 2026-07-09
AI Technical Summary
Conventional scanning electron microscopes typically lack the ability to simultaneously achieve high resolution, a large depth of field, and a large field of view, with limited degrees of freedom in adjusting imaging modes due to the use of a single objective lens with predetermined properties.
A scanning electron microscope equipped with at least one condenser lens and three objective lenses, including a distal and proximal conventional lens and an immersion lens, allowing independent control and combination of lens activities for various imaging modes, including an electrostatic field generation for improved resolution.
Enables high resolution, large depth of field, and wide field of view with adjustable imaging modes, suitable for diverse sample types and simultaneous use with a focused ion beam for processing and examination.
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