High-frequency test contact device with impedance matching

Abstract

The present invention relates to a carrier unit (19) for a test contact device (20) for detachably contacting and testing a contact partner (30) with high-frequency signals, in particular a board-to-board connector, comprising an insulating base body with a plurality of recesses (19a) arranged parallel to each other therein, in particular slot-like recesses, each of which is designed to receive and guide a high-frequency signal-transmitting test contact element (10), wherein each of the recesses (19a) is formed between two opposing partition walls (41) that insulate the test contact elements (10).

Description

[0001] The present invention relates to a carrier unit for a high-frequency test device, as well as a test contact device or a test head comprising this device for releasably contacting a contact partner in the high-frequency range.

[0002] High-frequency test contact devices are well-known in the art and are used in test fields or other testing contexts to verify the functionality of a test partner, for example, an electronic assembly with a suitable socket section. The test contact device is attached to the contact partner under test as a plug or makes contact with it by means of end-mounted or extending test contact elements such as contact pins or contact lamellae. Test signals are then applied to the contact partner via a suitable contact mechanism.

[0003] In regular testing, contact is established, typically at periodic intervals, by bringing the test contact device and the test specimen into close proximity. Particularly in the field of high-frequency technology, high contact quality is essential during the testing process, as poor electrical contact not only leads to increased wear and thus a reduced service life, but also to poor resistance and therefore waveform matching, resulting in unwanted reflections and potentially faulty contact or measurement results. Simultaneously, there is a need for a design of the contact elements and the device optimized for the transmission characteristics of high-frequency signals, especially to minimize the probability of potential signal loss.

[0004] WO 2019 / 138505 A1 discloses a test contact pin for use in the high-frequency range, as well as a test contact device which accommodates a plurality of thin, plate-shaped test contact pins.

[0005] CN 109782034 A discloses a test contact pin and an associated test contact device for the high-frequency range. The test contact pin is designed as a continuous stamped part and has a contact section for contacting a contact partner and a connecting section for connecting to a circuit board of the test device, as well as an intermediate, elastic arm section. The test device comprises a main body with a plurality of parallel cavities extending in the installation direction of the test contact pins for inserting and securing the test contact pins accordingly.

[0006] WO 2021 / 151524 A1 discloses a high-frequency test contact device for detachably contacting a contact partner, comprising an inner housing with an end-arranged contact section for interacting with a contact partner for testing purposes and an outer housing in which the inner housing is guided at least partially, wherein the inner housing comprises a support unit which has a plurality of parallel guide receptacles separated by continuous wall sections, designed for arranging and guiding a plurality of lamellar test contact elements.

[0007] Based on the known state of the art, the object of the present invention is to provide an improved carrier unit for a test contact device and a test contact device comprising this, which enables optimized transmission of high-frequency signals and at the same time reliable contacting of a contact partner to be tested.

[0008] This problem is solved by the carrier unit and the test contact device according to the independent claims. The dependent claims describe advantageous embodiments of the present invention. The present invention also addresses further problems, as will be evident from the following description.

[0009] In a first aspect, the present invention relates to a carrier unit for a test contact device for detachably contacting and testing a contact partner with high-frequency signals, in particular a board-to-board connector, comprising an insulating base body with a plurality of recesses arranged parallel to one another, in particular slot-like recesses, each of which is designed to receive and guide a high-frequency signal-transmitting, in particular lamellar, test contact element, wherein each of the recesses is formed between two opposing partition walls that insulate the test contact elements. According to the invention, at least one partition wall of the carrier unit has a hole pattern which is formed along a direction of travel of a test contact element arranged adjacent to it in the recess.

[0010] The hole pattern arranged in relation to the adjacent test contact element enables impedance matching along the signal path of the test contact element guided in the carrier unit. In particular, this allows for local matching of the dielectric constant of the carrier unit material in the area of ​​the partition adjacent to the neighboring or directly adjoining test contact element, resulting in impedance matching. The hole pattern, or the resulting opening or recess in the carrier unit material, provides at least a locally limited area with a lower dielectric constant (or that of air) than that of the carrier unit material. In addition to optimizing the high-frequency properties of the carrier unit, this also ensures a mechanically stable mounting and guidance of the test contact elements within the slot-like recesses.In particular, a mechanically stable partition wall design can be provided for the carrier unit, which also prevents contact between adjacent test contact elements. The provided hole pattern and the resulting impedance matching also make it possible to reduce the pitch distance between adjacent test contact elements within the carrier unit while simultaneously maintaining the impedance within a preferred range, especially around 50 ohms. This enables a more compact design of the carrier element as well as optimized contacting and testing of more compact contact partners or test objects.

[0011] The term "arranged along the direction of the test contact element" means that the respective hole pattern, viewed from the side, is arranged with a direction, in particular an at least partially curved direction, of the adjacent test contact element or the element abutting the partition, at least partially overlapping and / or following it.

[0012] The hole pattern preferably comprises a plurality of openings in the otherwise advantageously continuous partition wall, which are arranged distributed along the direction of travel of the test contact element. The openings advantageously extend perpendicularly through the partition wall.

[0013] Furthermore, the hole pattern advantageously extends completely over a length or over the total length of the test contact element, in particular from an end-side first contact area to an opposite end-side second contact area of ​​the test contact element.

[0014] Preferably, the hole pattern in the side view of the carrier unit or the partition of the carrier unit is arranged overlapping with the contours of the test contact element, particularly in a compressed state of the test contact element and / or the carrier unit. Advantageously, the hole pattern in the carrier unit is designed such that the overlapping arrangement in the side view is present in a compressed state, i.e., contacting a test contact and thus in the signal-conducting state, of the test contact element and / or the carrier unit.

[0015] In a preferred embodiment, the hole pattern comprises openings and / or recesses with uniform or different geometric shapes, which may vary in shape and / or size. The openings may, in particular, have a round, longitudinally extending, and / or rhomboid geometric shape. The openings and / or recesses may extend into an edge region or edge section of the respective partition. The size of the openings or recesses and / or their spacing from one another allows the impedance along the signal path to be finely tuned in order to achieve a desired target value as accurately as possible. The size or spacing of the openings and / or recesses may vary within the transmission path.This can be advantageous if, for design reasons, it would be more cost-effective to include smaller openings in certain places, but several openings in total, or vice versa.

[0016] Preferably, the openings and / or recesses along the path or direction of the test contact element are designed differently with regard to their geometric shape and / or size, and further preferably with regard to their area adapted to the area of ​​the adjacent test contact element in the area overlapping with the opening. This allows the impedance to be adapted to a variation in the structural dimensions of the signal path, enabling different adjustments to the nominal impedance at different points in the transmission path.

[0017] In a preferred embodiment, the width of each opening in the hole pattern, or the overall width of the hole pattern, is greater in at least one section of the hole pattern, preferably over the entire length of the test contact element, than the width of the section of the test contact element adjacent to the respective opening or recess. In other words, the hole pattern, or each opening of the hole pattern, extends further in a width direction than the overlapping test contact element.

[0018] The carrier unit is preferably made of a single material, in particular a plastic material. Each partition wall of the carrier unit advantageously has a thickness of 0.10 to 0.50 mm, preferably 0.12 to 0.20 mm. Each recess for receiving the test contact element of the carrier unit advantageously has a width of 0.09 to 0.35 mm, preferably 0.12 to 0.25 mm.

[0019] The carrier unit advantageously comprises a plurality of preferably adjacent partitions, each with a similarly arranged or designed hole pattern. In particular, the hole pattern of at least two adjacent partitions can be identical. Alternatively, the carrier unit can have a plurality of non-adjacent partitions, each with a similarly arranged or designed hole pattern. Furthermore, the carrier unit can have a plurality of preferably adjacent partitions, each with a differently designed hole pattern. The respective hole pattern of the partition is preferably adapted to the RF characteristics to be provided by the adjacent test contact element or adapted to optimize the RF characteristics of the respective signal path.

[0020] The hole pattern can further advantageously be formed only in a preferably contiguous area of ​​the carrier unit, which is designed for the arrangement and guidance of high-frequency signal-conducting test contact elements.

[0021] Furthermore, it is advantageous that no hole pattern is provided on partition walls of the carrier unit which are arranged adjacent to test contact elements that do not carry high-frequency signals and / or whose impedance is already in the correct range.

[0022] In a further aspect, the invention relates to a carrier unit as described above, comprising a plurality of test contact elements arranged in the recesses, wherein the test contact elements preferably each have a lamellar base body with an end-side first contact area for contacting a contact partner or test object, an opposing second contact area for contacting a test contact device receiving the carrier unit with the test contact elements and an intermediate meandering elastic area.

[0023] The test contact element preferably has a cavity extending in the direction of the elastic region, and more preferably a connecting bridge arranged therein. The cavity divides the lamellar base body longitudinally into two preferably parallel connecting elements. These, together with the cavity between them, preferably run parallel in the direction of the elastic region. The thickness of the lamellar base body of the test contact element is preferably constant. The thickness of the base body is preferably between 0.1 and 0.3 mm.

[0024] Furthermore, the test contact element can be advantageously designed as disclosed in WO 2021 / 151524 A1.

[0025] Preferably, two recesses for receiving and / or guiding a test contact element are arranged opposite each other in one plane of the carrier unit. The respective recesses are formed from opposite sides of the plastic body, particularly as slot-like recesses, with a test contact element arranged in each of the two recesses. The two test contact elements arranged in one plane are preferably oriented in opposite directions with respect to their elastic range. The plastic body, particularly as a continuous solid material, is arranged between the two recesses in one plane to separate the adjacent recesses. This preferably extends to the contact section of the test contact device.

[0026] In a preferred embodiment, the carrier unit can be designed in two parts, comprising a distal guide element which is movable relative to a rearwardly arranged base body, wherein an associated force storage element, in particular a spring element, more preferably a compression spring element, is arranged between the base body and the guide element. The spring element is preferably configured to bias the guide element towards a contact section or a contact partner to be contacted of a test contact device comprising the carrier unit. The spring element between the base body and the guide element of the plastic body is hereinafter referred to as the third spring element.

[0027] The guide element is preferably biased against a contacting limiting element, preferably against a pin or clamping pin arranged substantially orthogonally to the direction of movement of the guide element. This pin or clamping pin is preferably fixed in position within an inner housing of the test contact device that accommodates the carrier unit and can be arranged in a recess or bore of the guide element that extends substantially orthogonally to the direction of movement of the guide element. A side wall of the limiting element can serve as a stop surface for an inner wall of the recess or bore. A maximum stroke of the guide element can also be defined by the limiting element, in particular by means of its interaction with the aforementioned recess or bore. In this case, an opposite side wall of the limiting element can serve as a stop surface for an opposite inner wall of the recess or bore.

[0028] The guide element is preferably arranged to be movable relative to the individual test contact elements. In particular, the guide element can assume a first relative position to the test contact elements in which the respective contact areas of the test contact elements for contacting a contact partner are protected within end-formed openings or a lower area of ​​the slot-like recesses in the guide element, i.e., not protruding in a side view of the device, or preferably only partially protruding. This first relative position preferably corresponds to a position not subjected to external force or a position detached from the contact partner.In a second relative position, particularly one in contact with a contact partner, the respective contact areas for contacting the contact partner protrude at least partially from the respective openings in the guide element or protrude further from the associated openings compared to the first relative position. In the second relative position, the guide element is subjected to an external force against the preload force and towards the base body by a contact partner.

[0029] The end openings for the contact areas of the test contact elements are preferably integrally formed with the respective laterally arranged, slot-like recesses of the plastic body for mounting and / or guiding the individual contact elements. When contacting a contact partner, the individual test contact elements are movable independently of the guide element in their respective assigned recesses of the plastic body, particularly in the respective recesses of the guide element of the base body. This arrangement enables further improved tolerance compensation when contacting the individual contacts of a contact partner.

[0030] In a preferred embodiment, the guide element is designed or arranged relative to the test contact elements such that, upon contact with a contact partner, the guide element is first moved from its initial first relative position towards the second or compressed relative position, and during the further movement of the guide element, contact with the contact partner occurs through the contact areas of the test contact elements. During a continued, further stroke movement of the test contact device described in more detail below towards the contact partner, a simultaneous or parallel compression of the guide element and the test contact elements preferably occurs.

[0031] In a further aspect, the invention relates to a high-frequency test contact device for the releasable contacting of a multi-pole contact partner, in particular a board-to-board connector, comprising an inner housing with an end-arranged contact section for interaction with the contact partner for testing purposes, and an outer housing in which the inner housing is guided at least partially and relative to it, in particular along a longitudinal direction of the device, in such a way that in a first contact-free relative position the inner housing is arranged in a positionally secure manner, and in a second relative position contacting a contact partner it is mounted at least partially movable relative to the outer housing, in particular rotatable and / or tiltable, wherein the test contact device has a carrier unit preferably arranged in the inner housing as described above.and comprises a plurality of high-frequency test contact elements arranged in the carrier unit and extending to the contact section of the inner housing.

[0032] The inventive design of the carrier unit optimizes the high-frequency properties of the test contact device, as already explained above with regard to the inventive carrier unit. Simultaneously, the inventive design enables precise alignment of the device with a contact partner in the first relative position and provides tolerance for any positional and / or dimensional deviations of the contact partner in the second relative position. The first relative position preferably corresponds to an end position of the inner housing within the outer housing, in which the inner housing is pre-tensioned in the outer housing by means of a force storage device, in particular a spring element. The second relative position preferably corresponds to a partially compressed state of the inner housing within the outer housing in the longitudinal direction of the device.

[0033] The inner and outer housings are pre-tensioned against each other in their first relative position, particularly by a spring element. The spring element is arranged such that a contact section of the inner housing is pushed away from the outer housing in one direction. The spring element located between the inner and outer housings is hereinafter referred to as the first spring element.

[0034] The outer housing preferably surrounds the inner housing completely, at least partially, or circumferentially around an outer diameter of the inner housing. The outer housing may include an inner cylindrical section in which the inner housing is guided. The outer housing preferably has fastening means for attaching the test contact device to a test fixture. These may be designed, in particular, as flanges to the rest of the housing. The outer housing may also have a substantially flange-like design, featuring a preferably central inner cylindrical section for guiding and / or passing through the inner housing.

[0035] The contact section is preferably multi-pole. The individual poles are formed by the test contact elements as described above. The contact elements are preferably arranged in the device in a selectively interchangeable manner. For this purpose, the device may have specifically designed locking or bearing means for the contact elements. The contact section of the test contact device preferably has an oval or polygonal, in particular rectangular, inner and / or circumferential contour. The inner and / or circumferential contour is preferably adapted or designed for contacting a so-called "board-to-board" connector or "multi-line" connector.

[0036] In a preferred embodiment, the contact section has a centering section that is spring-mounted in the longitudinal direction of the device, particularly relative to the high-frequency test contact elements, and is arranged at its end. The centering section is preferably spring-mounted relative to the test contact element(s) by means of associated energy storage means, in particular at least one spring element. The spring-mounted centering section enables further optimized positional alignment of the test pin device when contacting a contact partner for testing purposes.

[0037] In a preferred embodiment, the inner housing comprises a piston movably arranged at its end and acted upon by a spring force, on which, in turn, the contact section of the test pin device is formed at its end. The piston is preferably movably arranged relative to the rest of the inner housing, the support unit arranged therein, and relative to the individual test contact elements, and has a central opening or bore for the passage of the test contact elements and the support unit arranged between them.

[0038] The movable piston is preferably mounted on and / or at least partially within the base body of the plastic housing of the inner housing by means of at least one spring element, and particularly preferably by means of a plurality of circumferentially distributed spring elements, especially spring-loaded contact pins, and is biased in a direction away from the base body of the inner housing. The movable piston can be arranged to press against an inner shoulder of a piston surrounding the movable piston and fixed relative to the rest of the inner housing. The spring element arranged between the movable piston and the support unit or the rest of the inner housing is hereinafter referred to as the second spring element.

[0039] The movable piston can, in particular, assume an initial first relative position to the test contact elements and the associated carrier unit, in which the respective contact areas of the test contact elements for contacting a contact partner in the end-side contact section or an associated centering section are protected, i.e., when viewed from the side of the device, they do not protrude from a circumferential or side wall of the contact section. This first relative position corresponds to a position not subjected to external force or detached from the contact partner.In a second relative position, in particular contacting a contact partner, the movable piston is arranged recessed towards the base body of the inner housing, preferably such that the respective contact areas for contacting the contact partner protrude further from the contact section and towards a contact partner compared to the first relative position.

[0040] In a further preferred embodiment, the movable piston of the inner housing can be connected to shortened contact elements in a position-dependent manner. These shortened contact elements are provided in addition to the majority of the high-frequency test contact elements extending to the contact section of the inner housing and are arranged such that they can be connected to the movable piston in a signal-conducting manner, depending on its position. The shortened contact elements are arranged parallel to the remaining test contact elements and have a shortened first contact area compared to the remaining test contact elements. Otherwise, the shortened contact elements have a structure essentially corresponding to the test contact elements described above.

[0041] The movable piston is made of conductive material and is designed to make contact, in particular, with a ground contact of the contact partner. The movable piston has a rearward contact shoulder, preferably annular or stepped, which, when the movable piston is compressed from its initial first relative position to a second relative position, contacts the shortened contact elements. The shortened contact elements are advantageously arranged at radially outer positions relative to the remaining test contact elements. In particular, the shortened contact elements are arranged at four outer edge positions relative to the remaining contact elements.

[0042] Upon contact with a contact partner, the movable piston initially compresses against the spring force of the associated second spring element or the advantageously provided circumferentially distributed (second) spring elements. After completing a predefined working stroke, the piston, with its rear contact shoulder, contacts the shortened contact elements, which are thus connected to the contact partner, in particular to a ground contact of the contact partner, via the piston. Due to their inherent spring action, the shortened contact elements exert an additional spring force on the piston in the longitudinal direction of the device through their elastic range. When the piston is released from a contact partner, it is subjected to the provided spring force by the spring force of the shortened contact elements on the one hand and by the spring force of the associated second spring element on the other.the advantageously provided circumferentially distributed (second) spring elements are moved back into their initial first relative position.

[0043] In a preferred embodiment, the first spring element, which is arranged between the inner and outer housings, has a higher spring force than the second spring element, which is arranged between the movable piston and the base body of the inner housing or the support element. This delays deformation and thus the compression of the first spring element relative to the second spring element upon contact with a contact partner. In particular, the second spring element, and thus the movable piston, compresses relative to the support unit first, and only upon further or higher force application does the first spring element, and thus the inner housing, compress relative to the outer housing.

[0044] In a preferred embodiment, the first spring element also has a higher spring force than the third spring element, which is arranged between the base body of the support unit and the guide element. In a further preferred embodiment, the first spring element has a higher spring force than the sum of the spring forces of the second and third spring elements.

[0045] The second spring element can have a higher spring force than the third spring element, which is arranged between the base body of the support unit and the guide element. This means that, when the guide element makes contact with the contact partner, it preferably moves the guide element first, or even initially, against the force applied by the spring. This results in further improved guidance and thus contact of the individual contacts of the contact partner. This can also occur in parallel with at least partial compression of the movable piston, provided that the piston is first centered on the contact partner, particularly in the case of a lateral offset of the contact partner relative to the piston.

[0046] In an alternative embodiment, the spring force of the second and third spring elements can also be approximately the same. In this embodiment, the second and third spring elements preferably each have a lower spring force than the first spring element. Alternatively, the spring force of the third spring element can also be greater than that of the second spring element.

[0047] The spring force of the first spring element is preferably 4 to 18 N, more preferably 4 to 8 N, and further preferably 5.5 to 6.5 N. The spring force of the second spring element is preferably 2 to 7 N, more preferably 2.5 to 4.5 N, and further preferably approximately 2.5 to 3 N. The spring force of the second spring element preferably comprises a plurality of spring forces from parallel (second) spring elements. Advantageously, the second spring element comprises four circumferentially distributed spring elements, wherein the aforementioned spring force represents the resultant spring force of the four spring elements.

[0048] The spring force of the third spring element is preferably 0.1 to 2 N, more preferably 0.3 to 1.2 N, and further preferably 0.5 to 0.8 N. The spring force of the high-frequency test contact elements according to the invention, as well as of the shortened test contact elements in the longitudinal direction of the test contact elements, is preferably 0.1 to 0.5 N, more preferably 0.15 to 0.3 N, and further preferably 0.18 to 0.25 N.

[0049] Details, advantageous effects and specifics of the present invention are explained below with reference to the purely schematic, merely exemplary drawings.

[0050] It shows: Fig. 1 a preferred embodiment of the high-frequency test contact device in perspective side view; Fig. 2 an exploded view of the high-frequency test contact device according to Fig. 1; Fig. 3a, Fig. 3b a partially cut-away side view of the high-frequency test contact device according to Fig. 1 and Fig. 2; Fig. 4a-c a lateral sectional view of the high-frequency test contact device according to Fig. 1 and Fig. 2; Fig. 5a, Fig. 5b a lateral sectional view of the contact section of the high-frequency test contact device for interaction with a contact partner; Fig. 6a-d a lateral sectional view of a preferred embodiment of the high-frequency test contact device with test contact elements arranged therein and associated detail views; Fig. 7 a perspective side sectional view of the high-frequency test contact device according to Fig. 6; Fig. 8a-c lateral sectional views of another preferred embodiment of the high-frequency test contact device; Fig. 9a,b a perspective side view of the carrier unit with test contact elements guided therein and a perspective partial sectional view of the high-frequency test contact device according to Fig. 8a-c; Fig. 10a-c Side partial sectional views of a movable piston of the test contact device according to Fig. 8a-c with test contact elements guided therein and the carrier element arranged between them when contacting a multipole contact partner; Fig. 11a,b lateral sectional views of the test contact device according to Fig. 8a-c in a contactless relative position of the device components and a relative position of the device components contacting a contact partner; Fig. 12a,b lateral sectional views of a preferred embodiment of the support element according to the invention; Fig. 13 a perspective side view of an embodiment according to the invention Fig. 12a; Fig. 14 a perspective side view of the test contact elements guided in the carrier unit; and Fig. 15 a characteristic curve of the attenuation (db) versus the frequency (GHz) for the inventive design (Graph K1) of a carrier unit compared to the prior art (Graph K2).

[0051] Identical elements or elements with the same function are provided with the same reference numerals in the figures. The carrier unit 19 according to the invention is initially shown only schematically in the following figures in the context of the test contact device according to the invention, with reference to the further figures. Fig. 12a, Fig. 12b, Fig. 13 described in more detail.

[0052] Fig. Figures 1-3b show a preferred embodiment of the high-frequency test contact device 20 for detachably contacting a multi-pole contact partner 30 (see Figures 1-3b). Fig. 10a-c), in particular a "board-to-board" or "multi-line" connector. The test contact device 20 has an inner housing 11 with a contact section 12 arranged at the end for interaction and, in particular, contacting the contact partner 30 for testing purposes, as well as an outer housing 13. The outer housing 13 preferably has a flange 13a projecting, in particular from a central housing section, with mounting and / or connecting means 13b formed therein. The outer housing 13 can thus be mounted on a fastening device such as a mounting grid of a movable test unit.

[0053] On the rear side of the device 20, at an end section opposite the contact section 12, the inner housing 11 has a connection section 9, which serves for the input and / or output of electrical signals, in particular by means of electrical conductors or cables 17a, 17b, and is connected to the contact section 12.

[0054] The inner housing 11 is at least partially supported and guided within the outer housing 13. The inner housing 11 is movably guided within the outer housing 13 essentially along a longitudinal direction L1 of the device. A force storage element 21, preferably a first spring element, arranged between the inner and outer housings 11, 13, provides a preload force which holds the device 20 in the position shown in the diagram. Fig. 1 and Fig. 3a shows the contactless end position or first relative position between the inner and outer housings 11,13. Fig. Figure 3b shows a second relative position of the inner and outer housings 11, 13, in which the inner housing 11 is mounted so as to be movable relative to the outer housing 13, in particular rotatable, tiltable and / or laterally displaceable, whereby, when contacting a test contact or contact partner 30, several degrees of freedom are preferably provided for the movement of the inner housing 11 and thus an effective tolerance compensation between contact section 12 of the inner housing 11 and contact partner 30 is enabled.

[0055] As in Fig. As shown in Figure 2, the device 20 further comprises at least one, preferably two, printed circuit boards 14a, 14b and a plurality of high-frequency test contact elements 10 contacted with the printed circuit boards and extending to the contact section 12, which are Fig. 14 are shown in more detail. The printed circuit boards are arranged on a carrier unit 19, in particular an insulating medium designed as a plastic body, in the inner housing 11. Here, the printed circuit boards 14a, 14b can be fastened to the carrier unit 19, for example, by means of provided fastening or mounting means, such as a screw connection 22a, 22b. The carrier unit 19 is also designed to accommodate a plurality of high-frequency test contact elements 10 (see Figure 14). Fig. 14) trained, who are trained to directly contact contact partner 30.

[0056] The contact section 12 can have a centering section 12a that is spring-mounted relative to the rest of the inner housing and, in particular, relative to the high-frequency test contact elements 10, and is arranged at its end. This centering section 12a can be mounted on the carrier unit 19 by means of associated force storage means 23, in particular a second spring element, for example, comprising several preferably circumferentially distributed spring elements 23. The contact section 12 and the centering section 12a associated with it are preferably formed in a movable piston 27 of the inner housing 11, in particular arranged at its end and aligned with a contact partner 30 to be contacted. The piston 27 is arranged at its end on the inner housing 11 and is subjected to spring force by the second spring element 23.

[0057] The movable piston 27 is biased in a direction away from the base body 11a of the inner housing 11, preferably a hollow cylindrical base body. The movable piston 27 can be arranged to press against an inner shoulder 34a of a piston 34 surrounding the movable piston 27 and fixed relative to the rest of the inner housing.

[0058] The inner housing 11 preferably comprises a plurality of individual parts 11a-11e, which can be mounted in particular. These can preferably be screwed together in the longitudinal direction L1 of the device to form a unit.

[0059] Fig. Figures 4a-4c show several lateral sectional views of the high-frequency test contact device 20 to illustrate the first and second relative positions of the inner and outer housings 11 and 13. As shown in the figures, the inner housing 11 has an outer contour that interacts with an inner contour of the outer housing 13 depending on its position. In particular, the inner housing 11 has a bearing axis section 24 with a varying outer contour extending axially between the contact section 12 and the connection section 9 at the other end. This bearing axis section is at least partially received or guided in a guide recess 25 of the outer housing 13 extending along the longitudinal direction L of the device. The bearing axis section 24 has at least one projection 24a, preferably substantially conical, which is supported in a complementary recess 25a of the guide recess 25 in the first relative position.To prevent rotation in this position, the projection 24a and the recess 25a preferably have a non-rotationally symmetrical shape in the circumferential direction. For example, the projection 24a can be rectangular in plan view (see . Fig. 2).

[0060] The inner housing 11 and outer housing 13 are pre-tensioned against each other and axially pressed apart by the action of the first spring element 21, in particular a coil spring, wherein the coil spring 21 engages at one end a first annular shoulder 26a of the inner housing 11 and at the other end a second annular shoulder 26b of the outer housing 13 opposite along the longitudinal direction L1 of the device, thus driving the inner housing 11 and outer housing 2 apart. The maximum stroke of the inner housing 11 within the outer housing 13 is limited by a centering section 24b of the bearing axis section 24 of the inner housing 11, arranged on the outer shell side, which engages in an end-side expansion of the outer housing 25b or rests against it at maximum stroke.

[0061] If the inner housing 11 is partially compressed into the outer housing 13 upon contact with a contact partner 30 (second relative position) as in Fig. 4b and Fig. As shown in Figure 4c, the projection 24a and the associated recess 25a are spaced apart. Furthermore, the bearing axis section 24 has a smaller outer diameter than the associated guide recess 25 of the outer housing 13, so that in this second position, rotation, tilting, and / or offset within predefined limits of the inner housing 11 in the outer housing 13 is now possible.

[0062] Fig. 4c shows a sectional view in a view opposite the Fig. 4b radially offset plane, in which the spring-loaded position of the centering section 12a of the contact section 12 is shown by means of the preferably circumferentially distributed force storage means, in particular the second spring element or spring elements 23. The second spring elements 23 preferably comprise spring-loaded contact pins which are arranged parallel to the longitudinal direction L1 of the device 20.

[0063] Fig. Figure 5a shows the contact section 12 with a centering section 12a arranged at its end. The latter is spring-mounted, in particular, relative to the test contact elements 10 projecting into the centering section 12a. This is preferably achieved by arranging the contact section 12 in or at the end of the movable and spring-loaded piston 27. The centering section has an inner contour that tapers towards the test contact elements, preferably with circumferentially arranged centering chamfers 12b. Fig. Figure 5b shows the contact section 12 during contact with a contact partner 30. This is centered by the centering section 12a with the circumferential centering chamfers 12b during the approach between contact section 12 and contact partner 30 and thus brought into positionally secure contact with the contact section 12.

[0064] Fig. Figures 6a-d show a lateral sectional view of a preferred embodiment of the high-frequency test contact device 20 with test contact elements 10 arranged therein and associated detail views B, C, D. Fig. Figure 7 shows a corresponding perspective sectional view of the test contact device.

[0065] As in Fig. As shown in Figure 6a, the device 20 preferably has two spaced-apart and opposing printed circuit boards 14a, 14b. These are arranged laterally on the centrally arranged support unit 19 in the longitudinal direction L1 of the device. Fig. Figure 6b shows the basic arrangement of the test contact elements 10, which extend from each end of the printed circuit boards 14a, 14b, where they are contacted, to the opposite contact area 12 of the device. The contact elements 10 are preferably arranged on both sides of the centrally located carrier unit 19. The respective contact elements 10 run in respective recesses 19a of the carrier unit 19 (see also Figure 6b). Fig. 7) The recesses 19a are designed in such a way that a springing of the contact elements 10 in the device longitudinal direction L1 or longitudinal extension direction L of the test contact element 10 is enabled.

[0066] Fig. Figure 6c shows a detailed view of the mounting of the test contact element 10 on the printed circuit board 14a. Here, the test contact element 10 rests on the printed circuit board 14a with its curved end section 2a, contacting a respective conductor track 15a of the printed circuit board 14a via a corresponding contact section of this printed circuit board. A laterally projecting lug 2b of the test contact element 10 engages in a designated recess 19b of the carrier unit 19 for locking purposes. As shown in the detailed view. Fig. As shown in 6d, an opposite end of the test contact element 10, in particular its first contact area 1, lies at least partially against a guide section 12c of the inner housing 11 or of the movable piston 27 or is guided linearly along this in the longitudinal direction L1 of the device.

[0067] The test contact elements 10 and the circuit boards 14a, 14b are arranged in the inner housing 11 such that they extend essentially in the longitudinal direction of the device L1 or parallel thereto. A longitudinal direction L (cf. Fig. 14) The respective test contact elements 10 run in particular parallel to the longitudinal direction L1 of the device. This essentially linear orientation enables optimized signal transmission from the contact partner 30 to the signal tap at the connection section 9 located at the rear of the device. Conductor traces arranged on the printed circuit board preferably also extend essentially in the longitudinal direction L1 of the device or parallel thereto and preferably do not have any bend section or bend or bending element with a bending angle greater than 70°, more preferably greater than 45°, in their longitudinal extension L1 or parallel thereto.

[0068] Fig. Figures 8a-c show lateral sectional views of another preferred embodiment of the high-frequency test contact device 10. The illustration in Fig. 8c is in a plane orthogonal to the cutting plane of the representation in Fig. Cut 8b.

[0069] In this embodiment, the carrier unit 19, which receives the contact elements, is designed in two parts. In particular, the carrier unit comprises a base body 19c, which is fixedly positioned as a stationary unit within the inner housing and on which the printed circuit boards 14a,b are arranged, as well as a guide element 19d that is movable relative to it. Lateral recesses 19a arranged in the carrier unit for the storage and guidance of the individual test contact elements 10 are formed conformally in both the base body 19c and the guide element 19d. As in Fig. As shown in Figure 8b, preferably two lateral recesses 19a are arranged opposite each other in a plane, with solid material of the carrier unit 19 arranged between them. A force storage element, in particular a third spring element 19e, is arranged between the base body 19c and the guide element 19d. The third spring element 19e is designed as a compression spring and provides a preload force on the guide element 19d in the direction of the contact section or a contact partner to be contacted.

[0070] The guide element 19d is preloaded against a pin or dowel pin 28, which is arranged substantially orthogonally to the direction of movement of the guide element and is preferably fixed in position within the inner housing 11. The dowel pin is located in a bore 19e of the guide element 19d, the bore 19e being arranged substantially orthogonally to the direction of movement of the guide element. A side or cylindrical surface of the dowel pin 28 serves as a stop surface for an inner wall of the bore 19e. The maximum stroke of the guide element 19d can also be limited by the interaction of the dowel pin 28 with an opposing inner wall of the bore 19e.

[0071] In this first relative position, the respective contact sections 1a of the test contact elements 10 for contacting a contact partner 30 are preferably arranged within end-facing openings 29 in the guide element 19d and are at least partially protected, i.e., not completely protruding in a side view of the device. In a second relative position of the guide element 19d, it is moved against the preload force of the third spring element 19e towards the base body 19c, wherein the contact sections 1a of the test contact elements 10 preferably protrude further in the associated openings 29 than in the first relative position. The aforementioned end-facing openings 29 for the contact areas 1a of the test contact elements 10 are preferably integrally formed with the respective laterally arranged, slot-like recesses 19a of the carrier unit 19 for mounting and / or guiding the individual contact elements 10.form the end sections of the recesses 19a (cf. . Fig. 9a, Fig. 9b).

[0072] The guide element 19d preferably comprises at least one distal centering section 31, which is arranged at an end section of the guide element 19d associated with the contact partner 30 to be contacted. The centering section 31 advantageously has at least one projection or recess, preferably oriented centrally in the contact section 12 of the device 20, which is configured to engage in a respective central recess or projection in the contact partner 30 to be contacted when the contact partner is contacted. As shown in Fig. As shown in Figures 9a and 9b, the centering section 31 can include a recess arranged at the end face and centrally. The centering section 31 also has a plurality of projections 31a, which extend laterally to the centrally arranged recess and at least partially surround the partially projecting contact sections 1a of the contact element 10.

[0073] As in Fig. As shown in Figures 9a and 9b, the embodiment preferably has shortened contact elements 32, which are contacted with the circuit board 14a and 14b analogously to the high-frequency test contact elements 10. The contact elements 32 are advantageously arranged at radially outer positions relative to the remaining high-frequency test contact elements 10. In particular, the shortened contact elements 32 are arranged at four outer edge positions relative to the remaining test contact elements 10. The shortened contact elements 32 are designed for position-dependent interaction with the movable piston 27, in particular such that in a first relative position of the piston 27 there is no contact between the contact elements 32 and the piston 27, and in a force-applied second relative position of the piston 27 the contact elements 32 make contact with it, thus enabling signal acquisition via the piston 27, in particular a ground contact.The position-dependent contacting is effected via a rear-mounted and preferably ring- or step-shaped contact shoulder 33 of the piston 27 (cf. . Fig. 8c), on which the shortened contact elements 32 rest or press in a spring-loaded relative position of the piston 27 with a respective contact end face 32a.

[0074] Fig. Figures 10a-c show lateral partial sectional views of the movable piston 27 of the test contact device 20. Fig. 8a-c during the contacting of a contact partner 30 and the position-dependent interaction of the movable piston 27 with the shortened contact elements 32. As in Fig. As shown in Figure 10a, the contact partner 30 can first be centered by means of the centering section 12b of the device or the piston 27. A relative movement between the movable piston 27 and the inner and / or outer housing 11, 13 preferably does not yet occur. The resulting positioning is also in Fig. 11a shown. However, particularly with a greater offset of the contact partner 30 to the piston 27, the movable piston 27 can partially spring back against the spring force of the second spring element 23 relative to the rest of the inner housing 11a.

[0075] With continued force applied to the device 20 towards the contact partner 30, as in Fig. As shown in Figure 10b, the movable piston 27 deflects relative to the rest of the inner housing 11 against the spring force of the second spring element or the circumferentially distributed second spring elements 23. After the piston 27 has completed a predefined stroke, its rear contact shoulder 33 makes contact with the shortened contact elements 32, which are thus connected to the contact partner 30, in particular to a ground contact of the contact partner, via the piston 27. Due to their inherent spring action, the shortened contact elements 32 exert an additional spring force on the piston 27 in the longitudinal direction L1 of the device through their elastic section 3. Parallel to the aforementioned relative movement of the piston 27, the guide element 19d of the carrier unit 19 deflects upon contact with the contact partner 30. This can provide further centering or...Optimization of the alignment of the contact partner 30 to the device 20 is achieved by means of the centering section 31 of the guide element 19d. The resulting positioning is also in . Fig. 11b shown.

[0076] In a preferred embodiment, the first spring element 21, which is arranged between the inner and outer housings 11, 13, has a higher spring force than the second spring element 23 or the sum of the spring forces of the second spring elements 23, which are arranged between the movable piston 27 and the base body 11a of the inner housing 11 or the carrier unit base body 19c. This delays deformation and thus compression of the first spring element 21 relative to the second spring element 23 upon contact with a contact partner 30. In particular, preferably, compression of the second spring element(s) 23, and thus of the movable piston 27, relative to the carrier unit base body 19c occurs first, and only upon further or higher force application does compression of the first spring element 21, and thus of the inner housing 11, relative to the outer housing 13, occur.

[0077] Fig. Figures 12a and 12b show a preferred embodiment of the carrier unit 19. As already mentioned with reference to the preceding figures, Fig. As explained in 11a,b, the carrier unit preferably comprises a base body 19c and a guide element 19d movably arranged therein. Fig. Figures 12a and 12b show the compressed state of the carrier unit 19 and the carrier unit 19 in the state contacting a contact partner 30, respectively.

[0078] According to the invention, the support unit 19 has at least a partial hole pattern 40 in a respective partition 41, which is formed between two adjacent recesses 19a of the support unit 19. The respective partition 41 is preferably integral with the support unit 19 and has a width preferably between 0.10 and 0.30 mm, more preferably between 0.12 and 0.20 mm.

[0079] The hole pattern 40 is advantageously formed in the partition 41 such that it is arranged along the path of a test contact element 10 located adjacent to the partition 41. The hole pattern 40 is preferably designed such that it extends along the path of the test contact element 10 in both the compressed state and the contacted state of the test contact element 10 and / or the carrier unit 19.

[0080] Advantageously, the hole pattern 40 is arranged uniformly in each of two opposing partition walls 41, wherein the two opposing partition walls 41 flank a respective recess 19a for receiving a test contact element 10.

[0081] The hole pattern 40 enables the permittivity of the carrier unit 19 to be adjusted along the signal path of the adjacent test contact element 10. In particular, the permittivity of the plastic carrier unit 19 can be significantly reduced, thereby enabling an increase in impedance.

[0082] Advantageously, the hole pattern 40 is provided not on all, but only on a portion of the partition walls 41 of the carrier unit 19. In particular, the hole pattern 40 is arranged on partition walls 41 that are adjacent to a high-frequency signal-carrying test contact element 10. Fig. 12a, Fig. 12b, for example, the hole pattern 40 is provided only in the left area of ​​the support unit 19 or on the partition walls 41 flanking the left recess 19a.

[0083] The hole pattern 40 comprises a plurality of openings or recesses 42, which may have similar or different geometric shapes and / or sizes. The individual recesses are arranged at regular or irregular intervals along the path of the test contact element 10. A respective width B1 of the openings of the hole pattern 40 or a respective width extent B2 of the hole pattern 40 in at least one subsection of the hole pattern is preferably greater than a respective width extent B3 of the section of the test contact element 10 adjacent to the respective opening or recess.

[0084] The hole pattern 40 advantageously includes, in particular, diamond-shaped openings, as shown in Fig. 12a shown and / or round openings, as in Fig. Figure 12b shows that the adjacent openings or recesses can have different sizes. Furthermore, the openings can extend at least partially towards the contour or side wall defining the respective partition, so that the opening is open to the outside or forms a laterally open recess 42. The openings can also extend in the longitudinal direction of the adjacent test contact element 10, similar to a type of elongated hole 43.

[0085] As in Fig. As shown in Figure 13, the openings are arranged only partially or only in a partial area of ​​the partition walls 41. In particular, the hole pattern 40 can be formed only in centrally arranged partition walls 40, each of which adjoins a test contact element 10 that also receives high-frequency signals from the contact partner 30. Preferably, the support walls 41, which are associated with the outer and shorter test contact elements 32 and which do not serve for RF signal transmission, are free of a hole pattern arranged therein.

[0086] Fig. Figure 14 shows a plurality of test contact elements 10 in an arrangement as provided in the carrier unit 19, wherein two adjacent test contact elements 10 are each separated from each other by an intermediate partition 41 (not shown). As explained previously, the outermost test contact elements 32 can be shortened.

[0087] Each test contact element 10 preferably has a substantially lamellar base body 10a with a preferably homogeneous thickness t. The test contact element 10 is designed as an integral, i.e., continuous, component, preferably as a component produced by stamping, etching or electroforming, and extends along a longitudinal direction L.

[0088] As in Fig. Figure 14 shows that the test contact element is at least partially curved and, in top view, has a curved or swept direction V which meanders along the longitudinal direction L. The direction V of the test contact element preferably lies in a plane.

[0089] The test contact element or its base body 10a has an end-side, first contact area 1 for contacting a contact partner 30 (see e.g. Fig. 10a), a second contact area 2 arranged at an opposite end of the base body 10a for contact by the test contact device 20, and an intermediate meandering elastic area 3. The first and second contact areas 1 and 2 preferably extend substantially in the longitudinal direction L and preferably have a homogeneous width in side view. The width of the first and second contact areas 1 and 2 is preferably the same and can in particular be between 0.25 and 0.45 mm.

[0090] The area 3 has a cavity 5, preferably formed centrally within it and extending in the direction V. This cavity divides the base body 10a in area 3 into two preferably uniformly shaped and parallel connecting elements 4a, 4b. The resulting total thickness of the contact element 10 in the meandering area is preferably greater than the respective width of the first and second contact sections 1, 2 and is preferably between 0.35 and 0.65 mm. The meandering design with cavity 5 provides elasticity to area 3, particularly along the longitudinal direction L of the test contact element 10.

[0091] In a preferably central section, the elastic area 3 has a connecting bridge 7 at which the cavity extending along the direction V is interrupted. The thickness of the lamellar base body of the test contact element is preferably constant. The thickness of the base body is preferably between 0.1 and 0.3 mm.

[0092] The first contact area 1 has a contacting section 1a at its distal end, which serves to contact a contact partner 30. This section can have a flat contact surface perpendicular to the rest of the contact area 1 or a V-shaped tip. Alternatively, the contacting section 1a can have a tapered shape or a spreading shape, for example, an inverted V- or U-shaped shape.

[0093] The second contact area 2 has a curved end section 2a opposite the contact area 1 or its distal contacting section 1a, which is designed to contact a contact section 18 on the test contact device 20 (see Fig. 6c). Adjacent to this, the second contact area 2 has a laterally projecting nose 2b, which is designed for fastening and, in particular, clamping the test contact element in a receptacle of the test contact device (cf. Fig. 6c).

[0094] Fig.Figure 15 shows a characteristic curve of attenuation (dB) versus frequency (GHz) for the inventive design (Graph K1) of a carrier unit 19 compared to the prior art (Graph K2). As can be seen from this, the inventive design allows the impedance to be adapted to the nominal or target value of 50 ohms, resulting in an improvement in the return loss of approximately 5 dB over a wide frequency range. Furthermore, the present invention enables the achievement of a target return loss of -20 dB across the entire frequency range. Reference symbol list 1. First contact area 1a Contact section 2 second contact area 2a curved end section 2b Nose 3 elastic range 4a,b Connecting elements 5 Cavity 6a, b Bending sections 7 Connecting bridge 8a-d Bending elements 9 Connection section 9a Contact medium 9b external leader 10 High-frequency test contact elements 10a lamellar base body 11 Inner casing 11a Inner housing base body 11a-e Individual parts Inner housing 12 Contact section 12a Centering section 12b Centering chamfer(s) 12c Leadership section 13 Outer casings 13a Flange 13b Fasteners 14a, b Printed circuit boards 15a,b conductor track 16 longitudinal slots 17a,b electrical conductors 18 Contact section 19 Carrier unit, plastic body 19a Recesses Carrier unit 19b Nose recess 19c Basic body 19d Guide element 19e third spring element 19f bore for dowel pin 20 Test contact device 21 first spring element 22a, b Screw connection 23 second spring element 24 Bearing axle section 24a advantage 24b Centering section 25 Management entry 25a Return 25b Widening of outer casing 26a, b Ring heel 27 movable pistons 27a Contacting chamfer 27b Piston attachment element 28 spring pin 29 end openings in the guide element 30 contact partners 30a Recess Contact partner 30b central recess 31 Centering section 31a Projections 32 shortened contact elements 32a Contact face 33 Contact sales 34 stationary pistons 34a Inner paragraph 40 hole patterns 41 Partition wall 42 cutouts 43 Slotted hole B1 Wide opening B2 Wide hole pattern B3 Wide test contact element section K1 curve according to the invention K2 curve state of the art L Longitudinal direction L1 Device longitudinal direction t Thickness Base body V Direction of travel QUOTES INCLUDED IN THE DESCRIPTION

[0000] This list of documents cited by the applicant was automatically generated and is included solely for the reader's convenience. The list is not part of the German patent or utility model application. The DPMA accepts no liability for any errors or omissions. Cited patent literature

[0000] WO 2019 / 138505 A1

[0004] CN 109782034 A

[0005] WO 2021 / 151524 A1 [0006, 0024]

Claims

[1] Carrier unit (19) for a test contact device (20) for detachably contacting and testing a contact partner (30) with high-frequency signals, in particular a board-to-board connector, comprising an insulating base body with a plurality of recesses (19a) arranged parallel to each other therein, in particular slot-like recesses, each of which is designed to receive and guide a high-frequency signal-transmitting test contact element (10), wherein each of the recesses (19a) is formed between two opposing partition walls (41) that insulate the test contact elements (10), characterized by , that at least one partition (41) has a hole pattern (40) which is formed along a direction (V) of a test contact element (10) arranged adjacent to it in the recess (19a). [2] Carrier unit according to claim 1, characterized by, that the hole pattern (40) in the otherwise continuous partition (41) comprises a plurality of openings which are distributed along the direction (V) of the test contact element (10). [3] Carrier unit according to claim 1 or 2, characterized by , that the hole pattern (40) extends completely over a length of the test contact element (10), in particular from an end-side first contact area (1) to an opposite end-side second contact area (2) of the test contact element (10). [4] Carrier unit according to any one of the preceding claims, characterized by , that the hole pattern (40) in side view of the carrier unit (19) is arranged overlapping with the contours of the test contact element (10), in particular in a spring-loaded state of the test contact element (10) and / or the carrier unit (19). [5] Carrier unit according to any one of the preceding claims, characterized by, that the hole pattern (40) has openings and / or recesses with a round, longitudinally extending and / or diamond-shaped geometric form. [6] Carrier unit according to any one of the preceding claims, characterized by , that the formation of the hole pattern (40), in particular the formation of openings and / or recesses of the hole pattern (40) along the direction (V) of the test contact element (10), differ in their geometric shape and / or size. [7] Carrier unit according to claim 5 or 6, characterized by , that a respective width (B1) of the openings or recesses of the hole pattern (40) or a respective width extent (B2) of the hole pattern (40) in at least one subsection of the hole pattern (40) is greater than a respective width extent (B3) of the section of the test contact element (10) arranged adjacent to the respective opening or recess. [8] Carrier unit according to any one of the preceding claims, characterized by , that the carrier unit (19) is made of a uniform material, in particular plastic material. [9] Carrier unit according to any one of the preceding claims, characterized by , that each partition wall (41) has a thickness of 0.10 and 0.50 mm, preferably of 0.12 to 0.20 mm. [10] Carrier unit according to any one of the preceding claims, characterized by , that each recess (19a) for receiving the test contact element (10) has a width of 0.09 to 0.35mm, preferably 0.12 to 0.25mm. [11] Carrier unit according to any one of the preceding claims, characterized by , that the carrier unit (19) is designed in two parts, comprising a distal guide body (19d) which is movable relative to a rearwardly arranged base body (19c), wherein an associated force storage means (19e) is arranged between the base body (19c) and the guide element (19d). [12] Carrier unit according to any one of the preceding claims, characterized by that the support unit (19) has a plurality of preferably adjacent partitions (41) with each having a similarly designed hole pattern (40). [13] Carrier unit according to any one of the preceding claims 1 to 11, characterized by , that the support unit (19) has a plurality of preferably adjacent partitions (41) each with a differently designed hole pattern (40). [14] Carrier unit according to any one of the preceding claims, characterized by , that the hole pattern (40) in adjacent partition walls (41) is formed only in a continuous area of ​​the carrier unit (19), which is designed for the arrangement and guidance of high-frequency signal-conducting test contact elements (10). [15] Carrier unit according to any one of the preceding claims, characterized by, that the carrier unit (19) has a plurality of test contact elements (10) arranged in the recesses (19a), wherein the test contact elements (10) preferably each have a lamellar base body (10a) with an end-side first contact area (1) for contacting a contact partner (30), an opposite second contact area (2) for contacting a test contact device (20) receiving the carrier unit (19) with the test contact elements (10) and an intermediate meandering elastic area (3). [16] High-frequency test contact device (20) for releasably contacting a multi-pole contact partner (30), in particular a board-to-board connector, comprising an inner housing (11) with an end-arranged contact section (12) for interacting with the contact partner (30) for testing purposes, and an outer housing (13) in which the inner housing (11) is guided at least partially and relative to it, in particular along a longitudinal direction (L1) of the device, in such a way that in a first contact-free relative position the inner housing is arranged in a position-secure manner, and in a second relative position contacting a contact partner (30) is mounted at least partially movable relative to the outer housing (13), in particular rotatable and / or tiltable. characterized by , that the test contact device (20) comprises a carrier unit (19) preferably arranged in the inner housing (11) according to one of claims 1 to 15, comprising a plurality of high-frequency test contact elements (10) arranged in the carrier unit (19) and extending to the contact section (12) of the inner housing (11). [17] High-frequency test contact device according to claim 16, characterized by , that the contact section (12) of the test contact device has a centering section (12a) which is spring-mounted and arranged at the end, in particular relative to the high-frequency test contact elements (10), in the longitudinal direction (L1) of the device. [18] High-frequency test contact device according to claim 16 or 17, characterized by, that the inner housing (11) and the outer housing (13) are pre-tensioned against each other in the first relative position by a first spring element (21) and / or that the inner housing (11) has a piston (27) arranged movably at its end and acted upon by the spring force of a second spring element (23), on which in turn the contact section (12) of the test contact device (20) is formed at its end. [19] High-frequency test contact device according to one of claims 16 to 18, characterized by , that a first spring element (21) of the device (20), which is arranged between inner and outer housing (11,13), has a higher spring force than a second spring element (23), which is arranged between a movable piston (27) of the inner housing (11) and a base body (11a) of the inner housing (11). [20] High-frequency test contact device according to claim 19, characterized by, that the first and second spring elements (21,23) have a higher spring force than a third spring element (19e) which is arranged between a base body (19c) and a guide element (19d) of the carrier unit (19).

Images