Method for determining measurands using multiple atomic ensembles and measuring equipment for this purpose

DE102025123719B3Undetermined Publication Date: 2026-07-23DEUTSCHES ZENTRUM FÜR LUFT UND RAUMFAHRT E V +1
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Patent Information

Authority / Receiving Office
DE · DE
Patent Type
Patents
Current Assignee / Owner
DEUTSCHES ZENTRUM FÜR LUFT UND RAUMFAHRT E V
Filing Date
2025-06-18
Publication Date
2026-07-23

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Abstract

A method for determining measurands with several atomic ensembles (Ei), such as time, frequency, magnetic field or inertial forces, with a measuring instrument (2i) has the steps: - Determining the measurands using a plurality of atomic ensembles (Ei), each with an influencing parameter (xi) that differs from the influencing parameters (xj) of the same type of measurement of the other ensembles (Ei), and - Extrapolating the measurement results (&Dgr;&phgr;i') obtained from the measurements with the different influencing parameters (xi) to the value (&Dgr;&phgr;(x0= 0)) where there is no influence from the influencing quantity y(xi).
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