Combined acquisition of first and second projection measurement datasets

DE102025124742B3Undetermined Publication Date: 2026-07-23SIEMENS HEALTHINEERS AG
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Patent Information

Authority / Receiving Office
DE · DE
Patent Type
Patents
Current Assignee / Owner
SIEMENS HEALTHINEERS AG
Filing Date
2025-06-26
Publication Date
2026-07-23

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Abstract

A method for the combined acquisition of first projection measurement data (TPMD) and second projection measurement data (PMD) for a tomosynthesis image (TBD) and for a 2D image (2D-BD) is described. This involves the sequential acquisition of multiple first projection measurement datasets (TPMD) from an examination area with a first acquisition frequency (AF1) and a first image-specific X-ray dose (D1) per projection measurement dataset (TPMD) in a first angular range (WB1) from a plurality of first angular positions (W1). This is followed by the sequential acquisition of multiple second projection measurement datasets (PMD) from the same examination area with a second acquisition frequency (AF2) and a second image-specific X-ray dose (D2) per projection measurement dataset in a second angular range (WB2) from a plurality of second angular positions (W2).The second angular region (WB2) is part of the first angular region (WB1), and the second angular region (WB2) is omitted during the sequential acquisition of multiple first projection measurement data sets (TPMD), so that only one projection measurement data set (TPMD, PMD) is acquired from each of the angular positions (W1, W2). Furthermore, a method for the simultaneous generation of 2D image data (2D-BD) and depth image data (TBD) is described. A control device (40) is also described. A tomosynthesis system (50) is also described.
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