SYSTEM AND METHOD FOR OPERATING THE SYSTEM
DE102025149592A1Undetermined Publication Date: 2026-07-16TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
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Patent Information
- Application Number
- DE102025149592
- Authority / Receiving Office
- DE · DE
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2025-04-24
- Filing Date
- 2025-11-28
- Publication Date
- 2026-07-16
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Abstract
A system comprises a first circuit, a converter circuit, and a test system. The first circuit is configured to generate an RF signal (RF: radio frequency) with a first oscillation frequency. The converter circuit is connected to the first circuit and is configured to receive the RF signal and convert it into a first voltage representative of a value of the first oscillation frequency. The first voltage is a DC voltage. The test system is connected to the converter circuit and is configured to receive the first voltage and, in response to the first voltage, perform a wafer acceptance test (WAT) at the first oscillation frequency.
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