OPTICAL PROBE SYSTEM AND CALIBRATION CLAMPING DEVICE FOR IT, DISTANCE MEASURING METHOD, METHOD FOR PERFORMING OPTICAL TESTS AND ELECTRONIC TEST ITEM

DE102025150575A1Undetermined Publication Date: 2026-07-23MPI CORP
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Patent Information

Authority / Receiving Office
DE · DE
Patent Type
Applications
Current Assignee / Owner
MPI CORP
Filing Date
2025-12-04
Publication Date
2026-07-23
Patent Text Reader

Abstract

An optical probe system (S) and a calibration clamping device (2) therefor, a distance measurement method for at least one optical probe, a method for performing an optical test on an electronic test object (D) and an electronic test object (D) configured to be tested by the above-mentioned method.The calibration clamping device (2) for the optical probe system (S) can be equipped with a thermal control module (3) to ensure that a simulated test temperature environment applied to the calibration clamping device (2) and an actual test temperature environment applied to the optical probe system (S) can be provided for at least one optical probe at the same or similar temperatures, so that a calibrated fiber sensor distance (d1) measured at a simulated test temperature applied to the calibration clamping device (2) can remain consistent with a measured fiber sensor distance (d2) measured at an actual test temperature applied to a thermal main clamping device (1) of the optical probe system (S).
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Citation Information

Patent Citations

  • US63772801B1

  • US63746281B1