BASE CURRENT COMPENSATION FOR PMU OUTPUT STAGE

A base current compensation technique using a scaled replica circuit and feedback network addresses the challenge of poor beta characteristics in PNP transistors, ensuring efficient power consumption and high-speed operation in test systems.

DE102025155299A1Undetermined Publication Date: 2026-07-09ANALOG DEVICES INC
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Patent Information

Authority / Receiving Office
DE · DE
Patent Type
Applications
Current Assignee / Owner
ANALOG DEVICES INC
Filing Date
2025-12-29
Publication Date
2026-07-09

AI Technical Summary

Technical Problem

Existing test systems face challenges in providing high-speed operation and accurate DC/low-speed parameter measurements while minimizing power consumption and stress effects on devices under test, particularly due to poor beta characteristics of PNP transistors in high-speed manufacturing processes.

Method used

Implementing a base current compensation technique using a scaled replica circuit and feedback network to maintain balanced operating conditions, ensuring efficient power consumption across varying DUT currents by using a scaled replica transistor and current mirrors to provide proportional base current compensation.

Benefits of technology

The solution optimizes power efficiency by adjusting base current based on DUT demands, maintaining high-speed operation and reducing power dissipation during low-current conditions, thus enhancing the performance of PMU output stages.

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Abstract

A test equipment system can include an output stage configured to deliver a device under test (DUT) signal to a device under test in response to a force control signal. The output stage can include a first and a second output transistor and a bias circuit that supplies bias current to the first output transistor. The system can include a sensing device configured to detect current information about the DUT signal and a control circuit that generates a supplemental current based on the detected current information. The supplemental current can be delivered to one of the output transistors. In one example, the sensing device includes a scaled replica of the first output transistor. The magnitude of the supplemental current can be continuously updated based on changes in the DUT signal.
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