Procedure for reading and writing a working memory, device and storage medium
DE102026100742A1Undetermined Publication Date: 2026-07-23RAYSON HI-TECH (SZ) CO LTD
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Patent Information
- Authority / Receiving Office
- DE · DE
- Patent Type
- Applications
- Current Assignee / Owner
- RAYSON HI-TECH (SZ) CO LTD
- Filing Date
- 2026-01-08
- Publication Date
- 2026-07-23
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Abstract
Embodiments of the present application provide a method for read and write testing of a main memory, a device, and a storage medium belonging to the field of storage technology; the method comprises: obtaining the number of data blocks and the number of rows of the respective data block of data blocks of a target main memory to be tested; determining the number of threads of the test threads to be created according to the number of data blocks, the number of rows, and the read / write type; creating the test threads, the number of which corresponds to the number of threads, and determining a read / write start position of each test thread from the row range of each data block; synchronously calling each created test thread and outputting the test results, so that the read and write test can be performed synchronously from the corresponding read / write start position by each test thread.The embodiments described in this application can improve test efficiency.
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