Procedure for functional testing of random access memory, device and storage medium

DE102026100744A1Undetermined Publication Date: 2026-07-23RAYSON HI-TECH (SZ) CO LTD
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Patent Information

Authority / Receiving Office
DE · DE
Patent Type
Applications
Current Assignee / Owner
RAYSON HI-TECH (SZ) CO LTD
Filing Date
2026-01-08
Publication Date
2026-07-23

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Abstract

Embodiments of the present application provide a method for functional testing of random access memory, a device, and a storage medium belonging to the field of storage technology; the method comprises configuring the test function instructions, the input parameter fields, and the output verification fields corresponding to the test function instructions, as well as a parameter combination mode corresponding to the input parameter fields, in a preset test view; determining multiple target input data for the test function instructions according to the input parameter fields and the parameter combination mode; calling a test template for the test function instructions and generating multiple test cases according to the test template and the multiple target input data; generating a verification script according to the output verification fields; and releasing the test instructions according to the test cases to a target random access memory.Querying and subsequently outputting the test results according to the verification script at the target random access store. The implementation examples in this application can improve test efficiency.
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