SIMPLIFIED TEST SETUP FOR CABLE HARNESS TESTING

Description

[0001] The invention relates to the testing of a wiring harness using a testing system.

[0002] A wiring harness is known, for example, from "Wikipedia: 'Wiring harness'", Wikipedia, website, https: / / de.wikipedia.org / wiki / Wiring_harness, accessed on September 5, 2022: The electrical function of a wiring harness can be tested using a test bench. The test bench is pre-programmed with the data from the circuit diagram.

[0003] Such test benches or test systems are known, for example, from "TSK: 'Test benches'", TSK, website, https: / / www.tsk.de / kabelpruefsysteme / prueftische / , accessed on September 5, 2022: A complete test system for the connection test (electrical test) of cable sets (cable harnesses) consists of test modules, test point cards, cable tester, PC, test software and test bench.

[0004] Document DE 10 2019 133 227 B3 discloses a test system for testing a wiring arrangement. The test system comprises a test table with a switching matrix; a computer controller configured to control the switching matrix of the test table; a test module; and a measuring device for measuring an electrical property. The test module comprises a control module for controlling at least one function of the test module. The control module is communicatively connectable to the computer controller via a control connection extending entirely outside the switching matrix. Furthermore, the test system has a localization function with which the position of the test module on the test table can be determined. For this purpose, a localization pattern is provided at contacts of the test module, which can be identified by the computer controller using the switching matrix and the measuring device.

[0005] The object of the present invention is to realize improvements with regard to the testing of a wiring harness using a testing system.

[0006] The object is achieved by a test arrangement according to patent claim 1. Preferred or advantageous embodiments of the invention and other categories of invention emerge from the further claims, the following description and the attached figures.

[0007] The test setup is one for a test system or component of a test system. The test system is used to test a wiring harness. The wiring harness has a plurality of wires.

[0008] The test setup includes a bus line. The bus line can be connected to a central unit of the test system or is connected during operation. The connection is made, for example, via an interface on the bus line. The interface can be a simple line connection on the bus line or a so-called control card. This card also performs signal adjustments, converts bus protocols, or similar functions between the bus line and the central unit.

[0009] In particular, a control card is connected to the bus line. The central unit can then be connected to the bus line via the control card. The control card is set up, for example, to convert signals between the bus line and the central unit. A signal protocol is converted in the control card, for example. Non-bus-based signals on the bus line are converted into bus-based signals on a data line from the control card to the central unit. The bus line can therefore be a conventional, non-bus-based line / wire bundle, e.g. in the form of one or more ribbon cables, power supply lines, etc. Alternatively, the bus line can also be implemented as a bus, e.g. as a CAN bus. The control card then converts the signals to an Ethernet bus, which runs from the control card to the central unit.

[0010] The central unit is, in particular, a higher-level PC for the test setup. The test setup and the central unit together form the aforementioned test system.

[0011] The test setup contains a plurality of test units, which are also to be understood here as logical / symbolic units (possibly shared use of the collective test point cards / connection modules, see below). Each of the test units contains exactly one connection module and exactly one test module. The test module is connected to the connection module (at least indirectly via other components). Each of the connection modules is connected or can be connected to the collective line and handles communication / signal forwarding, etc., between the test module and the collective line. In other words, each test module is connected to the collective line via exactly one connection module in a series connection.

[0012] Although each test unit has exactly one connection module, the same connection module can be assigned to or shared with multiple test units. This applies in particular if the collective test point card contains or is the connection module, see below. Each test module is structured as follows:

[0013] It has a specific number, here "connector pin count," of single-pole electrical connector contacts (connector pins / connector pin contacts) or connection contacts. Such a connector contact is, for example, a connector pin, a contact pin, or a terminal connection. The wires are electrically connected to the connector contact for the purpose of testing the wiring harness. In particular, exactly one wire is connected to each connector contact, which is the norm. In rare cases, this can be different, e.g., a so-called double stop can occur, i.e., two wires are routed to one connector contact. The word "connector" is therefore to be understood broadly or generally here and is chosen merely for the sake of clarity, since wiring harnesses are usually connected to a test system using connectors. However, an actual connector on the wiring harness / connector receptacle on the test module is not necessarily required.Any electrical contact can be made to the cable harness, e.g. via open cable ends or crimp contacts on cables.

[0014] In the test setup, exactly one cable of the wiring harness to be tested is usually connected between exactly two connector contacts of different test modules. However, this is not mandatory; if necessary, only one end of the cable can be connected to a connector contact and the other end not, for example, if inductive or capacitive detection of electrical quantities takes place there.

[0015] Each of the connector contacts must be electrically routed to the connection module to ultimately connect (at least in terms of information technology) to the bus line. However, multiple connector contacts can also be routed there on an at least partially shared line, as explained below.

[0016] Each test module also contains a specific number ("auxiliary pin count") of auxiliary electrical contacts. The auxiliary contacts are used for connection to the test module's electrical infrastructure. The auxiliary contacts must also be electrically connected to the connection module (if necessary, via shared cables, similar to the plug contacts above).

[0017] To make this text more readable, we refer to "auxiliary" numbers, lines, contacts, etc. However, these terms are essentially related to the infrastructure of the test modules. Therefore, we should more clearly refer to "infrastructure" numbers, lines, contacts, etc.

[0018] The infrastructure of a corresponding test module includes, for example, displays or sensors, such as LEDs or microswitches. The auxiliary contacts are used to electrically contact the corresponding displays / sensors, etc. In particular, the infrastructure of at least one of the test modules contains a lockable and electrically releasable holding device for the cable harness, in particular a connector / cables thereof. The holding device or at least the release of the holding device / release of the connector / cables can be controlled via at least one of the auxiliary contacts. In this way, the cable harness on the test module can be released electromechanically after the test has been completed. The locking is also achieved electrically, or alternatively in another way, for example by manual locking. The holding device is therefore used, for example, to mechanically lock or loosen cables / connectors of the cable harness.to hold securely on the connector contacts, for example to lock a connector of the wiring harness in a corresponding receptacle on the test module.

[0019] Instead of the electrical holding device, however, it can also be pneumatically operated. Removing cables from the test module, for example, ejecting a connector, is then done via a pneumatic drive. This relieves the test system of this task.

[0020] At least one of the test units contains one, in particular exactly one, plug-in pin compressor and / or one, in particular exactly one, auxiliary pin compressor. In particular, the test units contain either no compressor or only one auxiliary pin compressor, or an auxiliary pin compressor and a plug-in pin compressor. In particular, the test units contain either an auxiliary pin compressor or an auxiliary pin compressor and a plug-in pin compressor. The embodiments for plug-in pin compressors / auxiliary pin compressors mentioned below, or explanations thereof, always apply in the event that a test arrangement actually contains a corresponding plug-in pin compressor and / or a corresponding auxiliary pin compressor.

[0021] If the test setup includes a connector pin compressor, the connector contacts are routed from the test module to the connector pin compressor via connector pin lines. The number of connector pin lines is the number of connector pins. In other words, each of the connector contacts is routed to the connector pin compressor via exactly one of the connector pin lines. However, only a number of connector pin lines equal to the number of connector pins, namely a "connector pin collection number," leads from the connector pin compressor to the connection module.

[0022] The number of connector pins in the collective connector is therefore at least one less than the number of connector pins. The corresponding reduction in the number of connector pin lines relative to the connector pin lines is achieved by routing at least two of the connector pin lines in the connector pin compressor to one of the connector pin lines in a unique code. The corresponding connector pin line is thus assigned jointly to the two or more connector pin lines. However, the unique coding allows the test system to clearly reconstruct which of the connector pin lines, for example, carried which electrical signals to the connector pin line, etc.

[0023] The following applies analogously to the above if the test setup includes an auxiliary pin compressor: The auxiliary contacts are routed to the auxiliary pin compressor via the number of auxiliary pins of auxiliary lines ("one-to-one"). A "collected auxiliary pin number" of auxiliary pin lines then leads from the auxiliary pin compressor to the connection module. Here, too, the collective auxiliary pin number is at least one less than the number of auxiliary pins. Here, too, at least two of the auxiliary lines in the auxiliary pin compressor are uniquely coded to an auxiliary pin line. This auxiliary pin line is then also common to the at least two auxiliary lines that are routed to this auxiliary pin line.

[0024] Otherwise, i.e., in the case where the test setup does not include a connector pin compressor, the number of connector pins is routed from the test module to the connection module (directly or via intermediary processing stages, but still individually) in the corresponding test unit. The number of connector pins of the lines is therefore not reduced.

[0025] This also applies analogously to the missing auxiliary pin compressor: Otherwise, if the test arrangement does not contain an auxiliary pin compressor, the number of auxiliary pins is led from the test module to the connection module via auxiliary lines (directly or via the interposition of processing stages).

[0026] In particular, exactly one plug pin compressor and / or exactly one auxiliary pin compressor are provided per test unit.

[0027] According to the invention, at least a "compression" of connector pin lines and / or auxiliary lines takes place. At least one of the auxiliary lines and / or at least one of the connector pin lines is thus eliminated in the path between the respective compressor and the connection module. This eliminates cabling in the test setup, which leads to reduced cabling effort in a corresponding test setup / test system, i.e., when testing a wiring harness.

[0028] The reduced cabling effort during wire harness testing makes the test setup or test system, or its setup, more cost-effective. In particular, this makes it economically feasible to perform wire harness testing during wire harness production. A corresponding wire harness is typically assembled on an assembly table. The test setup can then be integrated into the assembly table or attached to it at an acceptable cost. In other words, thanks to the invention, wire harness testing can be successfully performed "online" in an assembly line. This results in a WHC (wire harness check) application in the assembly line. The invention results in a simpler system structure, a reduced or minimal amount of wiring, and good expandability of a test system. Overall, the reduction in the number of cables to be laid or used results in a simplified test setup for wire harness testing.The electrically releasable holding device simplifies the electromagnetic release of cables, especially connectors, at the end of a test. This avoids the need for a complex pneumatic solution.

[0029] According to the invention, auxiliary lines are thus suitably interconnected with respect to the infrastructure of a test module and / or connector pin lines with respect to the connector contacts in order to thereby achieve a test point reduction in the test system or on the bus line.

[0030] By reducing / condensing the number of required lines / cables (see below), standard cables, such as Ethernet cables, can be used to connect components where only a few lines are needed. This also saves effort and costs. In particular, test point condenser cards can be connected to collective test point cards (see below).

[0031] In a preferred embodiment, at least one of the test units contains exactly one active test point card. This test point card contains the test unit's connection module. The connection module is therefore located only in the test point card and nowhere else in the test unit. Such a test unit has a particularly simple design and can be configured flexibly. In particular, "passive" test units (only deriving measuring currents / voltages from the wiring harness) can also be easily constructed, which can also include a connector pin compressor.

[0032] In a preferred variant of this embodiment, the number of connector pins of connector pin lines is then routed from the test module to the connection module (i.e., within the test point card). A connector condenser is therefore not included. Such an embodiment is particularly suitable for the active feeding of test signals into the wiring harness and / or for comparatively large test modules with a comparatively large number of connector pins, for example, more than eight or twelve connector contacts. Compression, if at all, occurs only within the active test point card. "Active" is to be understood in this context as meaning that the test point card contains logic circuits, active components, for example, a bus connection, and in particular the standard "control intelligence" for the test circuitry of the connector contacts (feed into the wiring harness).The active test point card enables complete, standard wiring of the connector pin count of the connector contacts on the test module. This is because the respective connector pin count of individual connector pin lines is completely continuous, i.e., present in the form of a one-to-one wiring between the connection module and the test module. Although such test units are complex and comparatively expensive, they are suitable for complete wiring harness testing, especially for the input of test signals, in a standard manner.

[0033] In a preferred variant of this embodiment, the test unit contains one, in particular exactly one, auxiliary pin compressor. The auxiliary pin compressor is contained, in particular, exclusively in the active test point card. As explained, the test unit does not contain a connector pin compressor. Therefore, the above statements regarding the auxiliary pin compressor apply: As a result, there are fewer auxiliary pin bus lines between the auxiliary pin compressor and the connection module than auxiliary lines between the test module and the auxiliary pin compressor. This again results in a corresponding savings in cabling and thus in costs and effort, but only with regard to the auxiliary contacts. Since in certain test systems the infrastructure of a test module, just like the connector pins, is supplied or connected via uniform "test points" of the test system, such test points are also eliminated in terms of the infrastructure.Fewer test points are needed to control the same infrastructure with the same functionality. This also leads to an advantage over conventional (especially "active") test units without auxiliary pin compressors.

[0034] In a preferred embodiment, at least one of the test units contains exactly one passive test point condenser card and exactly one collective test point card. Only the collective test point card contains the connection module or is the connection module. All components are again arranged in series for signaling purposes, i.e., in the following order: test module – passive test point card – active collective test point card (if applicable: – connection module contained therein). The number of connector pins of connector pin lines and the number of auxiliary pins of auxiliary lines are routed from the test module to the passive test point condenser card. This configuration is particularly suitable for comparatively small test modules with a comparatively small number of connector pins, for example, a maximum of eight connector contacts. Condensation is possible at various points in the test unit, starting with the test point condenser card and ending at the collective test point card or the connection module."Passive" here means that the test point concentrator card has no bus connection, is not bus-based, and contains no logic or "intelligence" regarding the test circuitry of the wiring harness. In particular, the passive test point card is constructed entirely of passive components, specifically resistors and diodes, and possibly also capacitors / inductors. The corresponding test point concentrator card therefore requires no supply voltage to perform its intended tasks, namely the (possibly coded / encoded) transmission of signals / values ​​from the connector contacts and auxiliary contacts from the test module to the connection module or vice versa.

[0035] In a preferred variant of this embodiment, the test unit contains one, in particular exactly one, auxiliary pin compressor and / or one, in particular exactly one, connector pin compressor. In particular, these are arranged exclusively in the passive test point compressor card. Thus, connector pin lines and / or auxiliary lines between the passive test point compressor card and the collective test point card are eliminated, or the corresponding number of connector pins and auxiliary pins of lines is reduced to the connector pin collective number or auxiliary pin collective number. This can result in significant savings in cabling effort and costs. The connector pin compressor also eliminates some of the "test points" of the test system explained above, here not in relation to the connection / control of infrastructure, but in relation to a reduced number of test points for wiring connector contacts / connector pins.

[0036] In a preferred variant of this embodiment, at least two of the test units share the same collective test point card. In other words, two or more of the test units share a single collective test point card or use it jointly. This provides significant savings potential for the effort and cost of the test setup.

[0037] This is especially true because the collective test point card is the only "active" unit in such test units, meaning that only there is the complex and expensive "intelligence" of the test system—that is, active / logic components—needed. The group of test units shared by the collective test point card can therefore be implemented particularly easily and cost-effectively. For example, up to sixteen test units are possible per collective test point card, meaning sixteen passive test point condenser cards, each with a test module (i.e., sixteen test modules) can be connected to a single, shared active collective test point card.

[0038] In a preferred variant of this embodiment, at least one, and in particular all, of the passive test point compressor cards are not configured to connect the plug contacts according to a test scheme of the test system. In particular, these cards do not have any logic / intelligence as explained above, i.e., no control and evaluation unit or the like, for implementing standard test circuitry in the corresponding test units. Corresponding logic / intelligence is therefore only included in the active test point cards and, if applicable, also in the active collective test point cards.

[0039] In a preferred combination of the above-mentioned embodiments, the number of test units with active test point cards for testing a specific and predeterminable wiring harness is minimized in the test arrangement according to an optimization method. In other words, a specific wiring harness is assumed to be known to be fault-free with regard to its structure and electrical properties. A test regime is then determined for this harness, and a test arrangement is then determined for this wiring harness. This is done in such a way that the smallest possible number of test units with active test point cards are used. The remaining wiring or connection of the wiring harness is then carried out via test units with passive test point cards and (as many shared as possible) collective test point cards.This results in a particularly cost-effective and uncomplicated setup of a test arrangement and thus a reduced investment: Achieved by extensive use of simple, cost-effective test units with test module, test point compactor card and collective test point card and use of as few test units as possible with test module and active test point card.

[0040] This design is based on the practical observation that, in wiring harnesses, 80% of the wiring harness connectors typically have eight pins or fewer, making them contactable with inexpensive "small" test modules. Furthermore, it was determined that, as a rule, half of the wiring between the bus bar and the test module is used to connect the connector contacts, while the other half is used to connect auxiliary contacts.

[0041] Furthermore, the invention utilizes the practical knowledge that each end of a wiring harness must be connected to the bus bar via test modules. Each of the wires in the wiring harness only needs to be supplied on one ("first") side by a test module with "intelligence" (test units with "active" components, in this case, the active test point cards). The other "second" wire ends can be supplied by passive / "dumb" test modules (test units with "passive" components, in this case, test point compressor cards).

[0042] From all of this, it follows that a corresponding consolidation of auxiliary contacts is advisable for all test modules / test units, and a consolidation of plug contacts is certainly advisable for the test modules that are connected to the "second" end of a line under test. Because only the "first" end of the line needs to be wired according to a test scheme, which requires logic / intelligence in the test system.

[0043] In this respect, the invention utilizes the idea of ​​using as many "dumb" cost-effective test units as possible (ideally for all second line ends) with passive test point concentrator cards at the second line ends, which do not require corresponding intelligence. According to the optimization process, the connections of the wiring harness (optimally: only all first line ends) are distributed as optimally as possible among complex test units (active test point cards), while the rest is covered by simple test units (passive test point concentrator cards). Ideally, all first line ends would be connected to complex test units with active test point cards, and the remaining second line ends would be connected to simple, cost-effective test units with test point concentrator cards.

[0044] In a preferred embodiment, at least one, in particular all, of the

[0045] Test units on the side of the connection module facing away from the manifold in terms of signaling are designed without a data bus. In particular, this applies exclusively to one or all of the test units without a plug-in compressor. In particular, this applies exclusively to one or all of the test units with a test point compressor card and a manifold test point card. In particular, the manifold itself is designed as a data bus. The data bus is, in particular, a CAN bus. The remaining test unit (without the connection module) can thus be designed bus-free and therefore particularly simple, particularly purely passive.

[0046] In a preferred embodiment, the unique coding of the connector pin lines on the connector pin compressor is achieved as follows: at least two of the connector pin lines are each combined via an identification component to a common connector pin bus line. The identification components have different electrical characteristics in pairs. These are selected such that the electrical characteristics of the identification components can be reconstructed from an electrical signal flowing via the common connector pin bus line. The identification component is, for example, a resistor. The resistors then have different resistance values ​​as characteristics, or different resistance values ​​in pairs, e.g., 100, 200, 300, ... 1600 ohms for sixteen connector pin lines.From the current intensity in the connector pin bus line, the resistance value can then be determined as a characteristic value and thus the currently energized connector pin line, in particular if a test regime of the test system ensures that only one connector pin line is energized at a time.

[0047] The identification components can be located within the connector pin compressor itself or outside the connector pin compressor toward the wiring harness, for example, in the connector pin lines and / or in the test module. However, the identification components are typically located within the connector pin compressor. A corresponding connector pin compressor can be constructed passively, making it particularly simple and cost-effective.

[0048] In a preferred embodiment, the unique coding of the auxiliary lines on the auxiliary pin compressor is achieved as follows: Between two of the auxiliary pin bus lines, a branching circuit is connected - in the direction of the cable harness. This causes an opposite current flow between these two auxiliary pin bus lines to be routed to at least three, in particular four, different auxiliary lines. In other words, a current flow between the two auxiliary pin bus lines in the first direction is routed, for example, to two specific auxiliary lines. An opposite current flow between the two auxiliary pin bus lines (flow in the other direction), in contrast, is routed to two other auxiliary lines. This results in a two-to-four branching in the branching circuit. This effect is realized in particular by a selective current conduction, for example, a diode network. The aids for current branching, e.g.The diode network can be implemented in the branching circuit itself, in the test point card / test point compressor card, or beyond the branching circuit toward the test module (in the test module or in the auxiliary lines). For example, LEDs in the test modules cause the corresponding branching. The branching circuit can also be arranged in the auxiliary pin compressor or outside the auxiliary pin compressor toward the wiring harness. The branching circuit therefore has, in particular, two unidirectional current flow branches with opposite flow directions, which are connected in parallel between two auxiliary pin bus lines. Current can therefore only flow through the corresponding flow branches in one direction, for example, by connecting anti-parallel diodes in the corresponding flow branches. This also allows a particularly simple and cost-effective auxiliary pin compressor to be implemented.

[0049] However, especially with regard to LEDs as part of the infrastructure, a branching circuit can be omitted. The LEDs can then be connected to one of the auxiliary contacts on one side, with the other side then being routed to ground or a supply voltage on a common supply line.

[0050] In a preferred embodiment, the unique coding of the auxiliary lines on the auxiliary pin compressor is achieved as follows: A coding circuit is connected between two of the auxiliary pin bus lines (again in the direction of the cable harness). The coding circuit has an electrical characteristic - in particular an ohmic resistance. This characteristic can be determined via the auxiliary pin bus lines, e.g., by an input impedance measurement into the coding circuit. The characteristic can be changed using at least three auxiliary lines connected to the coding circuit. Here, too, a corresponding unique coding is realized, i.e., by determining the electrical characteristic, it can be determined which of the auxiliary lines is responsible for the corresponding change. This can, for example, determine which of the auxiliary lines caused the change.: the switch state of a switch connected between the two auxiliary lines can be determined. Corresponding coding circuits can be implemented particularly easily.

[0051] In a preferred variant of this embodiment, the coding circuit contains a series and / or parallel connection of identification components, in particular resistors, with different electrical properties, in particular resistance values. The identification components differ in pairs, in particular with regard to these properties. Here, too, the properties can be reconstructed from an electrical signal that can be measured in or on the auxiliary pin bus lines. In particular, identification components are provided which have values ​​distributed in pairs according to a binary system or powers of ten, etc. This means that even with a combination of different resistance values, a clear assignment to individual values ​​is always possible. The electrical characteristic can be changed by connecting at least two of the identification components via at least three of the auxiliary lines. The connection can influence a property of the identification component.However, the respective circuitry primarily involves short-circuiting or bridging the respective characteristic component, so that its properties remain unchanged but the characteristic value is influenced. In particular, the coding circuit contains a series connection of resistors with binary resistance values, with each of the resistance values ​​being bridged, i.e., short-circuited, via a bridge between two auxiliary lines. Such a circuit can also be constructed and electrically evaluated particularly easily and inexpensively.

[0052] In a preferred variant of the combination of the above-mentioned embodiments, the branching circuit and the coding circuit are connected between the same two auxiliary pin bus lines. In other words, the branching circuit and the coding circuit are connected in parallel to two of the auxiliary pin bus lines. The above-mentioned properties of the branching circuit and the coding circuit can thus be combined between two auxiliary pin bus lines. This leads to a particularly effective densification of the auxiliary lines (reduction in the number of auxiliary pin bus lines compared to the number of auxiliary pins).

[0053] The object of the invention is also achieved by a test bench according to patent claim 16. The test bench is a test bench for a wiring harness. The test bench is designed to test the wiring harness on it. The test bench contains a test arrangement according to the invention, which is designed to test the wiring harness on the test bench. The term "test bench" is to be understood more functionally here and refers to any arrangement on which the wiring harness can be subjected to testing.

[0054] The test table and at least some of its possible embodiments as well as the respective advantages have already been explained in connection with the test arrangement according to the invention.

[0055] In a preferred embodiment, the test bench is a test assembly bench. The test assembly bench is designed to allow the wiring harness to be tested and manufactured. The term "test assembly bench" is also to be understood functionally as distinct from a pure "test bench." Here, too, it refers to an arrangement on which both the assembly / manufacturing and testing of the wiring harness can take place. Therefore, the test assembly bench does not have to be a test bench actually equipped for assembly, but can differ from it in various aspects. This manufacturing process is usually carried out by arranging / bundling the wires of the wiring harness and fitting them with connectors.

[0056] The test assembly table contains the test arrangement according to the invention. This is then configured to test the wiring harness at least after assembly on the test assembly table. In particular, however, the test is performed during production, particularly continuously, successively, or at intervals, for example, after the assembly of a particular cable or the completion of a particular connector, etc. This allows for cost-effective wiring harness testing, particularly during wiring harness production. Errors, such as the use of a defective cable or incorrect installation of a cable (routing between incorrect connectors, incorrect connector pins) in the wiring harness, can thus be immediately detected and corrected.

[0057] Further features, effects, and advantages of the invention will become apparent from the following description of a preferred embodiment of the invention and the accompanying figures. Each of these figures shows a schematic diagram: Figure 1a test system with test arrangement on a test table for one and with a cable harness, Figure 2one of the test units from Figure 1 with active test point card, Figure 3one of the test units from Figure 1 with passive test point compressor card and collective test point card, Figure 4 the plug pin compressor from Figure 3 , Figure 5the infrastructure compressor from Figures 2 and 3 .

[0058] Figure 1shows a test system 2. This contains a central unit 4 and a test device 6 connected to the central unit 4. Both are connected to each other via an interface 10 of the test device 6, in this case a control card. A data line 8, in this case an Ethernet bus or an Ethernet cable, leads from the test device 6 or the interface 10 to the central unit.

[0059] Test setup 6 contains a bus line 12 connected to interface 10, in this case a CAN bus based on an Ethernet cable. Interface 10 / control card handles the protocol conversion between the two buses.

[0060] The test setup 6 is arranged on a test table 14, in this case a test assembly table, for a wiring harness 16. The wiring harness 16 consists of a plurality of cables 18, of which only a portion is shown here for reasons of clarity. The cables are to be routed between connectors 20 of the wiring harness 16. The test system 2 is thus capable of continuously testing the wiring harness 16 during its production or creation on the test table 14. Errors, for example, the use of a defective cable 18 or the incorrect assembly of a cable 18 (routed between incorrect connectors 20) in the wiring harness 16, can thus be immediately detected and corrected.

[0061] The test system 2 has a series of test modules 22a-j, which serve to accommodate the connectors 20 and thus to connect the wiring harness 16 or its lines 18. The test modules 22a,b are comparatively "large," i.e., they each have 64 connector contacts 24 for contacting a respective single line 18 of the wiring harness 16 via the connectors 20 (only a small selection is shown in the figure).

[0062] The remaining test modules 20c-j are comparatively "small" test modules for smaller connectors, each with eight connector contacts 24. Not all connector contacts 24 of all test modules 20a-j are occupied, since the wiring harness 16 does not have as many wires 18.

[0063] Each of the test modules 22a-j is part of a test unit 26a-j of the test assembly 6. For clarity, only the test units 26a, d, g, and h are marked with dashed borders in the figure. Each of the test units 26a-j has, in addition to the one test module 22a-j, one connection module 28a-j.

[0064] The two test units 26a-d each have exactly one active test point card 30a-d. The respective connection module 28a-d is contained in or integrated into the test point card 30a-d. The test units 26e-j, on the other hand, each have exactly one passive test point condenser card 32e-j and (logically speaking) exactly one collective test point card 28e-j. However, all test units 26e-j share the same single active collective test point card "28e-j." Therefore, separate test point cards "28f-j" do not exist. The collective test point card(s) 34e-j form or are the connection modules 28e-j of the test units 26e-j.

[0065] In this case, Ethernet cables are used to connect the test point compressor card 32e-j with the (or the only common) connection module(s) 28e-j or the collective test point card(s) 34e-j. These are used here as simple electrical connection cables without fulfilling any bus functionality. This results in the advantage that no special cables are required for the corresponding connection. Due to the reduction in the number of required individual cables (see below for Fig. 3 , number is only HSA + SSA) such a standard Ethernet cable is sufficient.

[0066] Figure 2 the test unit 26a represents one of the test units 26a-d.

[0067] Each of the test modules 22a-j has a specific number of connector pins (SA) of 24 connector contacts, in this case connector pins; the test module 22a here has SA=16. Each of the connector contacts 24 is connected to the connection module 28a-j for signaling purposes. The connection module 28a-d has a connector plug 29, in this case a CAN bus plug, for connection to the bus line 12.

[0068] The test modules 22a-j have an auxiliary pin count HA of 36 auxiliary contacts. These are: two auxiliary contacts 36 for connecting a respective LED (the other side of the LED is connected to a supply voltage), two auxiliary contacts 36 for connecting a micro-lifting magnet, and eight two auxiliary contacts 36 for connecting a respective microswitch, i.e. HA = 20. Each of the auxiliary contacts 36 must also be connected to the connection module 28a-j for signaling purposes. The components to be connected (LEDs, lifting magnet, microswitch, etc.) form an infrastructure 60 of the test module 22a-j.

[0069] In the test units 26a-d, all SA connector contacts 24 and all HA auxiliary contacts 36 are connected to the active test point card 30a-d via a separate connector pin line 38 (number of SA) and auxiliary line 40 (number of HA). In the figure, the individual lines are only indicated and symbolized by bands of different widths. The change in the width of the bands in the path of electrical signals is intended to illustrate a change in the number of individual lines contained therein. The number of SA connector pins of the connector pin lines 38 is connected (i.e., as a respective individual line) to the connection module 28a-d. The electrical signals on the respective connector pin lines 38 are further processed in a processing unit 42.

[0070] The test modules 22a-d each contain an auxiliary pin condenser 44. The auxiliary pin number HA of auxiliary lines 40 leads from the test module 22a-d to the auxiliary pin condenser 44. There, a "condensation" of the HA auxiliary lines 40 takes place in that only a few, namely only a single auxiliary pin number HSA=5, of auxiliary pin condenser lines 46 lead from the auxiliary pin condenser 44 to the connection module 28a-d. This reduces the cabling effort in the active test point card 30a-d and reduces the number of lines required to be controlled via the condenser line 12 from SA + HA to SA + HSA.

[0071] Without further explanation here, the respective active "base" test point card 30a-d can be expanded by expansion units 50 with additional SA=16 connector pins 24 or connector pin lines 38 with the associated processing unit 42. Thus, with up to seven expansion units 50, a maximum of 128 connector pins / connector contacts 24 in test modules 22a-d can be supplied with a single test unit 26a-d.

[0072] The test units 26a-d do not contain a plug pin compressor 52 (see below).

[0073] Figure 3 shows the structure of the respective test units 26e-j using the example of the test unit 26e. The test units 26e-j each contain an auxiliary pin compressor 44 in the passive test point card 32e-j, for which the explanations for Figure 2apply. However, smaller test modules 22e-j are available here. These only contain SA=12 connector contacts 24 and HA=14 auxiliary contacts 36 (2 x 1 for LED as above, 2 x 1 for micro-lift motor as above, 5 x 2 for microswitches).

[0074] The number of connector pins SA of connector pin lines 38 and the number of auxiliary pins HA of auxiliary lines 40 are routed from the test module 22e-j to the test point compactor card 32e-j. There, the compaction of the auxiliary lines 40 is adjusted accordingly. Figure 2 carried out by compressing them with the aid of the auxiliary pin compressor 44 to the auxiliary pin collection number HSA = 5 of auxiliary pin collection lines 46.

[0075] The test point compressor cards 32e-j also contain a connector pin compressor 52. In the connector pin compressor 52, the number of connector pins SA of connector pin lines 38 is reduced to the number of connector pins collectively SSA = 1, here only one connector pin collectively 54. Only these six lines in total (HSA + SSA = 5 + 1) lead from the test point compressor card 32e-j to the collective test point card 34e-j in the form of the connection modules 28e-j, which are finally connected to the CAN bus in the form of the collective line 12 via the connection plug 29 or CAN bus plug.

[0076] In the single collective test point card "34e-j", the compressed signals are processed (separately for each of the 16 connectable test point cards) on the auxiliary pin collective lines 46 and the connector pin collective lines 54 on one of 16 processing units 53 each.

[0077] Figure 4shows how the compression in the connector pin compressor 52 works: The unique coding of the SA connector pin lines 38 is achieved by routing each of them via an identification component 56 and a diode (not further designated) to a single (SSA = 1) common connector pin bus line 54. Each of the identification components 46 has pairs of different electrical properties in the form of a parameter K, here a different ohmic resistance. In the order from top to bottom in Fig. 4: 100, 200, 300, ... up to 1200 ohms at SA=12 and 1600 ohms at SA=16. A respective measuring current flowing through one of the connector pin lines 38 and finally via the connector pin bus line 54 can now be evaluated. Since test system 2 ensures that only one of the connector pin lines 38 is energized at a time, the characteristic value K can be determined based on an appropriate current intensity, thus clearly identifying the respective ohmic resistance value and thus the relevant characteristic component 56 and thus the relevant connector pin line 38.

[0078] Figure 5Finally, FIG. 1 shows the auxiliary pin compressor 44. Here, a branching circuit 58 is connected to two of the auxiliary pin bus lines 46, which leads to a total of four auxiliary lines 40. An opposite current flow in the auxiliary pin bus lines 46 results in current flowing through two of the auxiliary lines 40 at a time. This is achieved by connecting differently or oppositely oriented light-emitting diodes (with series resistors not designated) to these four auxiliary lines 40 in the infrastructure 60 of the test modules 22a-j. By applying differently directed current to the two auxiliary pin bus lines 46, two different light-emitting diodes can be operated as part of the infrastructure 60 of the test module 22.

[0079] A coding circuit 62 (with a series resistor not labeled) is also connected to the same two auxiliary pin bus lines 46 in parallel with the branching circuit 58. This coding circuit has an electrical characteristic K, in this case an ohmic series resistance. The series resistance is achieved by a series connection of identification components 56. These, in turn, have different electrical properties, in this case ohmic resistance values. The characteristic K can be measured via the auxiliary pin bus lines 46 (here by measuring the input resistance, indicated by an arrow) and can be changed using additional, here six, auxiliary lines 40. This is achieved by connecting two of the auxiliary lines 40 to three microswitches of the infrastructure 60 of the test modules 22a-j. By actuating the microswitches, one of the series-connected identification components 56 is bridged or short-circuited.The electrical characteristic K, in this case the total electrical resistance, changes as a result. The characteristic components 56 are again ohmic resistors, whose values ​​are distributed according to a binary system, in the figure from top to bottom: 5120, 2560, ... 320 ohms for five characteristic components 56 or

[0080] Microswitches (test units 26e-j) or up to 40 ohms (eight 56-element microswitches, test units 26a-d). Even if several microswitches are short-circuited, a characteristic value K is generated that is distributed according to the binary system and can be clearly assigned: The characteristic value K clearly indicates which of the 56-element microswitches are currently bridged and which are not.

[0081] Finally, two of the auxiliary pin bus lines 46 are routed to the above-described micro-lifting magnet 64 of the infrastructure 60, which serves to electrically eject a respective connector 20 from a respective test module 22 when energized. The micro-lifting magnet 64 thus implements the above-described electrically detachable, in this case electromagnetic, holding device.

[0082] In Figure 1According to an optimization process not explained in detail here, the test modules 22a-j are selected and assigned to the respective test units 26a-j in such a way that the number of complex and expensive test units 26a-d with active test point cards 30 and without connector pin compressors 52 is minimized, and as many simple, cost-effective and passive test units 26e-j as possible are used. The complexity lies solely in the control and supply of the cable harness 16 with test signals exclusively via the test units 26a-d. Thanks to the test units 26e-j, the signals transmitted through the cable harness 16 can be received and evaluated cost-effectively and easily. List of reference symbols

[0083] 2Test system 4Central unit 6Test setup 8Data line 10Interface 12Collective line 14Test table 16Cable harness 18Cable (cable harness) 20Connector (cable harness) 22a-jTest module 24Connector contact 26a-jTest unit 28a-jConnection module 29Connector 30a-dTest point card (active) 32e-jTest point compressor card (passive) 34e-jCollective test point card (active) 36Auxiliary contact 38Connector pin line 40Auxiliary line 42Processing unit (connector pin line) 44Auxiliary pin compressor 46Auxiliary pin collector 50Extension unit 52Connector pin compressor 53Processing unit (connector / auxiliary pin collector) 54Connector pin bus 56Identification component 58Branch circuit 60Infrastructure 62Coding circuit 64Lifting magnet SAConnector pin number SSAConnector pin collection number HAAuxiliary pin number HSAHuxiliary pin collection number KParameter

Claims

1. A test set-up (6) for a test system (2) for testing a cable harness (16), - with a collective line (12) which can be connected to a central unit (4) of the test system (2), - with a plurality of test units (26a-j), wherein each of the test units (26a-j) has exactly one connection module (28a-j) connected to the collective line (12) and exactly one test module (22a-j) connected to said connection module, - wherein each of the test modules (22a-j) has: - a connector pin number (SA) of respective single-pole electrical connector contacts (24) for the cable harness (16), and - an auxiliary pin number (HA) of electrical auxiliary contacts (36) for an infrastructure (60) of the test module (22a-j), - wherein at least one of the test units (26a-j) comprises a connector pin consolidator (52) and / or an auxiliary pin consolidator (44), - wherein, in the case of the connector pin consolidator (52), the connector contacts (24) are routed via the connector pin number (SA) of connector pin lines (38) to the connector pin consolidator (52), and a smaller connector pin collective number (SSA) of connector pin collective lines (54) is routed from the connector pin consolidator (52) to the connection module (28a-j), wherein the connector pin consolidator (52) is arranged such that in said connector pin consolidator (52) at least two of the connector pin lines (38) are routed in a uniquely coded manner to one of the connector pin collective lines (54), - wherein, in the case of the auxiliary pin consolidator (44), the auxiliary contacts (36) are routed via the auxiliary pin number (HA) of auxiliary lines (40) to the auxiliary pin consolidator (44), and a smaller auxiliary pin collective number (HSA) of auxiliary pin collective lines (46) is routed from the auxiliary pin consolidator (44) to the connection module (28a-j), wherein the auxiliary pin consolidator (44) is arranged such that in said connector pin consolidator (52) at least two of the auxiliary lines (40) are routed in a uniquely coded manner to one of the auxiliary pin collective lines (54), - wherein, otherwise, in the test units (26a-j), the connector pin number (SA) of connector pin lines (38) and / or the auxiliar pin number (HA) of auxiliary lines (40) is routed from the particular test module (22a-j) to the particular connection module (28a-j).

2. The test set-up (6) according to Claim 1, characterised in that - at least one of the test units (26a-d) comprises exactly one active test point card (30a-d), which comprises the connection module (28a-d).

3. The test set-up according to Claim 2, characterised in that - in at least one of the test units (26a-d), the connector pin number (SA) of connector pin lines (38) is routed from the test module (22a-d) to the connection module (28a-d), and - said test units (26a-d) do not comprise a connector pin consolidator (52).

4. The test set-up (6) according to Claim 2 or 3, characterised in that - the test unit (26a-d) comprises one of the auxiliary pin consolidators (44).

5. The test set-up (6) according to any one of the preceding claims, characterised in that at least one of the test units (26e-j) comprise exactly one passive test point consolidator card (32e-j) and exactly one active collective test point card (34e-j), wherein the collective test point card (34e-j) comprises or is the connection module (28e-j), - wherein the connector pin number (SA) of connector pin lines (38) and the auxiliar pin number (HA) of auxiliary lines (40) are routed from the test module (22e-j) to the passive test point consolidator card (32e-j).

6. The test set-up (6) according to Claim 5, characterised in that the test unit (26e-j) comprises one of the auxiliary pin consolidators (44) and / or one of the connector pin consolidators (52).

7. The test set-up (6) according to any one of Claims 5 to 6, characterised in that at least two of the test units (26e-j) have the same collective test point card (34e-j) in common.

8. The test set-up (6) according to any one of Claims 5 to 7, characterised in that at least one of the passive test point consolidator cards (32e-j) is not arranged for connection of the connector contacts (24) in accordance with a test scheme of the test system (2).

9. The test set-up (6) according to any one of Claims 2 to 4 in conjunction with any one of Claims 5 to 8, characterised in that according to an optimisation method, the number of test units (26a-d) with active test point cards (30a-d) for testing a specific and predeterminable cable harness (16) is minimised.

10. The test set-up (6) according to any one of the preceding claims, characterised in that the collective line (12) is designed as a data bus, and at least one of the test units (26a-j), on the side of the connection module (28a-j) facing away from the collective line (12), is designed without a data bus.

11. The test set-up (6) according to any one of the preceding claims, characterised in that in the connector pin consolidator (52), the unique coding of the connector pin lines (38) is achieved by at least two of the connector pin lines (38) being routed to a shared connector pin collective line (54) via respective characteristic components (56) that are of different electrical characteristics (K) in pairs.

12. The test set-up (6) according to any one of the preceding claims, characterised in that in the auxiliary pin consolidator (44), the unique coding of the auxiliary lines (40) is achieved by a branching circuit (58) being connected between two of the auxiliary pin collective lines (46), through which branching circuit an opposite current flow between the two auxiliary pin collective lines (46) is guided to at least three different auxiliary lines (40).

13. The test set-up (6) according to any one of the preceding claims, characterised in that in the auxiliary pin consolidator (44), the unique coding of the auxiliary lines (40) is achieved by a coding circuit (62) being connected between two of the auxiliary pin collective lines (46), which coding circuit (62) has an electrical characteristic (K) that can be changed by means of at least three of the auxiliary lines (40).

14. The test set-up (6) according to Claim 13, characterised in that the coding circuit (62) comprises a series and / or parallel connection of characteristic components (56) of different electrical properties, wherein it is possible to change the electrical characteristic (K) by at least two of the characteristic components (56) being able to be connected via at least three of the auxiliary lines (40).

15. The test set-up (6) according to Claim 12 in conjunction with any one of Claims 13 to 14, characterised in that the branching circuit (58) and the coding circuit (62) are connected between the same two auxiliary pin collective lines (46).

16. A test table (14) for a cable harness (16), - wherein the test table (14) is arranged such that the cable harness (16) is tested thereon, - with a test set-up (6) according to any one of the preceding claims, which is arranged to test the cable harness (16) on the test table (14).

17. The test table (14) according to Claim 16, characterised in that the test table (14) is a test assembly table, which is arranged such that the cable harness (16) can be manufactured and tested thereon.