SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREFOR

DE602022016250T2Active Publication Date: 2025-06-18CHANGXIN MEMORY TECH INC
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Patent Information

Application Number
DE602022016250
Authority / Receiving Office
DE · DE
Patent Type
Patents
Current Assignee / Owner
Priority Date
2022-08-04
Filing Date
2022-08-17
Publication Date
2025-06-18
Estimated Expiration
2042-08-17

AI Technical Summary

Technical Problem

Existing semiconductor structures, such as dynamic random access memory (DRAM), face challenges in miniaturization due to complex manufacturing processes and high power consumption, particularly in capacitor-less two-transistor (2T0C) DRAM structures.

Method used

The semiconductor structure comprises a substrate with a semiconductor pillar and a gate pillar extending perpendicular to the substrate plane, surrounded by a first word line and a semiconductor layer that covers the semiconductor pillar and surrounds the gate pillar, allowing for reduced area occupation and improved integration.

Benefits of technology

This configuration significantly reduces the area occupied by transistor projections on the substrate, enhancing the integration level of the semiconductor structure and reducing power consumption by eliminating the need for capacitors and re-writing operations.

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