Tangent positioner for non-destructive test

Abstract

Apparatus and related techniques described herein can include or use a non- destructive inspection probe assembly comprising pivoting support arms that can adapt to different radii of an object under test while maintaining a specified probe height from a surface of the object under test.

Description

TANGENT POSITIONER FOR NON DESTRUCTIVE TESTCLAIM OF PRIORITY

[0001] This patent application claims the benefit of priority of Guimond, U.S. Provisional Patent Application Number 63 / 594,268, titled “TANGENT POSITIONER FOR NON-DESTRUCTIVE TEST,” filed on October 30, 2023 (Attorney Docket No. 6409.271PRV), which is hereby incorporated by reference herein in its entirety.FIELD OF THE DISCLOSURE

[0002] This document pertains generally, but not by way of limitation, to apparatus and techniques for non-destructive inspection such as facilitating eddy current inspection, and more particularly, to apparatus and techniques for performing eddy current inspection or other non-destructive inspection on structures that have different diameters.BACKGROUND

[0003] Non-destructive testing (NDT) can refer to use of one or more different techniques to inspect regions on or within an object, such as to ascertain whether flaws or defects exist, or to otherwise characterize the object being inspected. One class of non-destructive testing can include use of an eddy current testing approach where electromagnetic energy is applied to the object and resulting induced currents on or within the object are detected, with the values of a detected current (or a related impedance) providing an indication of the structure of the object under test, such as to indicate a presence of a crack, scratch, void, porosity, or other inhomogeneity (e.g., corrosion or pitting). Generally, an eddy current (EC) sensor includes one or more sensor elements such as inductive coils that can be excited using an alternating current (AC) source. Such coils (or other electromagnetic sensing elements such as hall sensors) can be used for receiving a signal indicative of an induced eddy current on or within the structure in response to such excitation, using either the same coil for both excitation and pickup (e.g., connected through a bridge circuit), or using one coil for transmission and another coil for pickup. Generally, eddy current inspection can be sensitive to variation in a distance between an EC sensor and the object under test,such as compromising sensitivity if the EC sensor is lifted away from a surface of an object under test.SUMMARY OF THE DISCLOSURE

[0004] Eddy current (EC) testing can be used as a non-destructive inspection technique, such as supporting inspection operations during or after manufacturing of an article. For example, steel structures such as a railway wheel set axle can be inspected as a portion of a production or acceptance process or during field inspection, such as using an eddy current technique or a combination of eddy current and other inspection modalities such as visual inspection or acoustic inspection. In one approach, an inspection can be performed by a technician using fixed-radius wedge or other probe configuration. Such an approach can present various challenges. For example, eddy current inspection generally involves maintaining a desired spatial relationship between an eddy current sensor and a surface of an object under test. For example, testing may be performed with an eddy current sensor maintained at a specified distance from the object under test. If the sensor is lifted away from the surface of the object under test, test coverage can be impacted, and re-scanning may be required. A fixed-radius wedge having a curved face can be used to match a corresponding radius of curvature of an object or probe assemblies. Use of fixed- radius wedges can impact inspection efficiency because wedges need to be swapped for inspection of different portions of an object under test having different radii.

[0005] By contrast, the present inventor has, among other things, developed apparatus and related techniques that can include using a probe assembly with pivoting support arms that can adapt to different radii while maintaining a specified probe height from a surface of the object under test. The apparatus and related approaches described herein can be referred to as including or using a “tangent positioner,” where an active surface of the probe assembly (e.g., an eddy current transducer or array of such transducers) can be at the specified height in a region that is at least roughly tangent to a surface of an object under test. If a curved or flexible eddy current sensor is used, the sensor need not be literally tangent to the surface and could follow a contour of the surface.

[0006] In an example, a non-destructive inspection probe assembly can include a probe support frame configured to support a non-destructive inspection transducerassembly, at least two pivoting arms extending from the probe support frame in opposite directions and configured to rotate symmetrically about a central pivot location on the probe support frame, and respective pivoting shoes located distally along the at least two pivoting arms with respect to the central pivot location. The pivoting shoes can be configured to rotate in response to contact of the pivoting shoes at symmetric locations along a curved cross-sectional profile of an object under test to adjust to a radius of curvature of the object under test. For example, the at least two pivoting arms can be configured to pivot outward from the probe support frame or inward toward the probe support frame to establish a specified distance between a face of the non-destructive inspection transducer assembly and a surface of the object under test for different radii of curvatures associated with the object under test. In an example, the non-destructive inspection transducer assembly comprises an eddy current transducer, such as a flexible eddy current transducer array. In an example, the object under test comprises a circular cross section, such as having differing radii of curvature along its axial extent.

[0007] In an example, a method can include performing non-destructive inspection, the method comprising establishing a specified distance between a face of a nondestructive inspection transducer assembly and a surface of an object under test, including adjusting to different radii of curvatures associated with the object under test, the adjusting comprising rotating at least two pivoting arms extending from a probe support frame in opposite directions, symmetrically about a central pivot location on the probe support frame, in conjunction with rotation of respective pivoting shoes located distally along the respective pivoting arms with respect to the central pivot location, and, in response, displacing the probe frame housing the nondestructive inspection transducer assembly upward or downward from a surface of the object under test including pivoting the at least two pivoting arms outward from the probe support frame or inward toward the probe support frame to establish the specified distance between the face of the non-destructive inspection transducer assembly and the surface of the object under test for different radii of curvatures associated with the object under test.

[0008] In an example, an eddy current non-destructive inspection system can be used to perform the method mentioned above or another method described herein, such as using a probe assembly as mentioned above or as described elsewhere herein. Theeddy current non-destructive inspection system can include a test instrument configured to excite and sense signals from an eddy current non-destructive transducer housed by the non-destructive inspection probe assembly, the test instrument comprising a processor circuit, and a memory circuit communicatively coupled with the processor circuit, where the memory circuit comprises instructions that, when executed by the processor circuit, cause the eddy current non-destructive inspection system to perform eddy current inspection of an object under test.

[0009] This summary is intended to provide an overview of subject matter of the present patent application. It is not intended to provide an exclusive or exhaustive explanation of the invention. The detailed description is included to provide further information about the present patent application.BRIEF DESCRIPTION OF THE DRAWINGS

[0010] In the drawings, which are not necessarily drawn to scale, like numerals may describe similar components in different views. Like numerals having different letter suffixes may represent different instances of similar components. The drawings illustrate generally, by way of example, but not by way of limitation, various embodiments discussed in the present document.

[0011] FIG. 1 illustrates generally an example comprising a non-destructive inspection system, such as can be used to perform at least a portion one or more techniques as shown and described herein.

[0012] FIG. 2A illustrates an end view of an example comprising a non-destructive inspection probe assembly and an object under test.

[0013] FIG. 2B illustrates a detail view of a portion of the example of FIG. 2A comprising a pivoting shoe and associated forces that can be established using an input force applied to the probe assembly.[0014JFIG. 3A, FIG. 3B, and FIG. 3C illustrate generally diagrams showing behavior of pivoting shoes and associated distance between a face of a non-destructive inspection transducer assembly and an object under test, for different diameters of test objects.

[0015] FIG. 4 illustrates generally a side view of a portion of a non-destructive inspection probe housing in a direction orthogonal to the view of the illustrative example of FIG. 2A and FIG. 2B.

[0016] FIG. 5 illustrates an isometric view of an example comprising a nondestructive inspection probe assembly, showing a configuration having four pivoting arms and respective pivoting shoes.

[0017] FIG. 6 illustrates generally an example comprising simulation results showing distance between a face of a non-destructive inspection transducer assembly and a surface of an object under test (annotated as “gap distance” in millimeters) versus different diameters of the object under test, with results for a reference approach (using fixed wedge radii) as compared to the adaptive positioner of the present subject matter.

[0018] FIG. 7 illustrates generally a technique such as a method that can include establishing a specified distance between a face of a non-destructive inspection transducer and a surface of an object under test, such as maintaining such a specified distance across a range of different radii of curvatures of the object under test.DETAILED DESCRIPTION

[0019] Non-destructive inspection can be performed using a probe assembly, such as scanned using a cradle, robotic manipulator, or gantry. Such a probe assembly can include a housing, interconnections, electronic circuitry, and a sensor (or array of sensors). For example, for eddy current array (ECA) inspection, a flexible printed circuit board can include respective eddy current sensor elements (e.g., planar inductive coils). The present inventor has recognized, among other things, that certain structures being inspected can have surfaces that vary in terms of their radii of curvature.

[0020] For example, a steel railway wheel axle can vary in diameter along its axial (long) dimension, such as having diameters ranging from about 160 millimeters (mm) to about 227.5mm, as an illustrative example. A single fixed-radius testing wedge (e.g., an eddy current array probe having a concave active surface) is generally unsuitable for testing an entirety of the axial length of a structure that has a curved cross-sectional profile that varies in radius of curvature. Accordingly, in one approach, different wedges are used for different portions of the object under test.

[0021] The present inventor has also recognized, among other things, that a probe support can be used that adjusts (e.g., adapts) to different radii of curvature to maintain an active surface of an inspection probe at a specified distance from thesurface of the object under test. In this manner, fewer (or as few as a single) EC A probe wedge can be used to inspect a larger portion (or an entirety) of a structure that varies in radius. Such an approach can be referred to as using a “tangent positioner,” in the sense that the active surface of the probe is positioned in a location at least roughly tangent to a surface of an object under test that varies in radius. The specified distance is generally on the order of a millimeter to provide measurement consistency or to avoid lift-off effects, or both. For example, such a distance can be about 0.5mm to 1mm nominally, as an illustrative but non-limiting example for the application of inspection of steel axle structures.

[0022] FIG. 1 illustrates generally an example comprising a non-destructive inspection system 100, such as can be used to perform at least a portion one or more techniques as shown and described herein or can use apparatus as shown and described elsewhere in this document. The non-destructive inspection system 100 can include a test instrument 140, such as a hand-held or portable assembly. The test instrument 140 can be electrically coupled to a probe assembly 150, such as using a multi-conductor interconnect 130. The probe assembly 150 can include one or more sensors, such as an eddy current coil array 154 (ECA). The EC coils are electromagnetically coupled with a target 158 (e.g., a test specimen or “object-under- test”) and the system 100 can be used to detect a flaw 160 using one or more techniques shown and described in this document. The ECA 154 can be a four-coil planar cross-wound sensor (CWS) or an array of such sensors, or the ECA 154 can have another configuration, such as a one-dimensional array, or a two-dimensional array configuration, as illustrative examples. The ECA 154 can be flexible or can otherwise follow a linear or curved contour or can include an array of elements extending in multiple axes. Element size and pitch can be varied according to the inspection application. As shown and described elsewhere herein, a probe support can include a tangent positioner 156 that can support the EC coil array 154, such as to assist in positioning the EC coil array 154 at a specified distance from a surface of the target 158, including accommodating different radii of curvature of the surface of the target.

[0023] A modular probe assembly 150 configuration can be used, such as to allow a test instrument 140 to be used with various different probe assemblies. The test instrument 140 can include digital and analog circuitry, such as a front-end circuit 122including one or more transmit signal chains (forming a transmitter circuit), receive signal chains (forming a receiver circuit), or switching circuitry (e.g., a multiplexer circuit 123). The transmit signal chain can include amplifier and filter circuitry, such as to provide an alternating current (AC) excitation signal for delivery through an interconnect 130 to a probe assembly 150.

[0024] While FIG. 1 shows a single probe assembly 150 and a single EC A 154, other configurations can be used, such as multiple probe assemblies connected to a single test instrument 140, or multiple arrays 154 used with a single probe assembly 150. Similarly, a test protocol can be performed using coordination between multiple test instruments 140, such as in response to an overall test scheme established from a respective test instrument 140 or established by another remote system such as a compute facility 108 or general -purpose computing device such as a laptop 132, tablet, smart-phone, desktop computer, or the like. The test scheme may be established according to a published standard or regulatory requirement and may be performed upon initial fabrication or on a recurring basis for ongoing surveillance, as illustrative examples.

[0025] The front-end circuit 122 can be coupled to and controlled by one or more processor circuits, such as a processor circuit 102 included as a portion of the test instrument 140. The processor circuit can be coupled to a memory circuit 104, such as to execute instructions that cause the test instrument 140 to perform one or more of EC acquisition, processing, or storage of data relating to an EC inspection. The test instrument 140 can be communicatively coupled to other portions of the system 100, such as using a wired or wireless communication interface 120.

[0026] Performance of one or more techniques as shown and described herein can be accomplished on-board the test instrument 140 or using other processing or storage facilities such as using a compute facility 108 or a general-purpose computing device such as a laptop 132, tablet, smart-phone, desktop computer, or the like. For example, processing tasks that would be undesirably slow if performed on-board the test instrument 140 or beyond the capabilities of the test instrument 140 can be performed remotely (e.g., on a separate system, such as using physical or virtualized processing resources), such as in response to a request from the test instrument 140. The test instrument 140 can include a display 110, such as for presentation of configuration information or results, and an input device 112 such as including one or more of akeyboard, trackball, function keys or soft keys, mouse-interface, touch-screen, stylus, or the like, for receiving operator commands, configuration information, or responses to queries. As an illustrative example, an eddy current non-destructive inspection system can include at least a portion of the non-destructive inspection system 100 of FIG. 1, such as the probe assembly 150 and test instrument 140, including the processor circuit 102 and memory circuit 104.

[0027] FIG. 2A illustrates an end view of an example comprising a non-destructive inspection probe assembly 250 and an object under test 258. The object under test 258 can have a curved cross-sectional profile (such as a circular cross-sectional profile) that can have different regions that vary in diameter from each other. In the example of the view of FIG. 2A, the non-destructive inspection probe assembly 250 is shown with a first pivoting arm 273 A and a second pivoting arm 273B coupled to respective pivoting shoes locally distally with respect to the central pivot location 271. The pivoting shoes can include a first pivoting shoe 275 A and a second pivoting shoe 275B, shown in FIG. 2A as resting on the outer-most radius of the object under test 258. The first pivoting arm 273A and the second pivoting arm 273B extend from a probe support frame 255 and rotate in conjunction with each other, generally symmetrically in opposite directions (with respect to an axis of symmetry, “S”) about the central pivot location 271. The central pivot location 271 can include a pin or roller, as an example.

[0028] The first pivoting arm 273A and the second pivoting arm 273B are rotatably coupled to the first pivoting shoe 275A and second pivoting shoe 275B, respectively, using a first pivot arm coupling 277A and a second pivot arm coupling 277B, respectively (e.g., using a pin or other structure). In order to establish a specified distance, “D,” between a face of a non-destructive inspection transducer assembly 254 and a surface of the object under test, the first pivoting shoe 275 A and the second pivoting shoe 275B are also rotatably coupled to the probe support frame 255. As the first pivoting shoe 275A and the second pivoting shoe 275B are displaced outward (with increasing radius of curvature of the object under test 258) or inward (with decreasing radius of curvature of the object under test 258), the non-destructive inspection transducer assembly 254 is lowered downward or raised upward (from the perspective of the view of FIG. 2A), relative to the first pivoting shoe 275 A and the second pivoting shoe 275B, correspondingly, to maintain the specified distance, “D,”between the non-destructive inspection transducer assembly 254 and the object under test.

[0029] As mentioned above, the non-destructive inspection probe assembly 250 can be modular. For example, a transducer assembly housing 291 can be modular, housing a portion of circuitry or interconnections that feed the non-destructive inspection transducer assembly 254. A surface of the non-destructive inspection transducer assembly 254 can be curved to some nominal radius of curvature corresponding to a range of expected radii of curvature of the object under test. Because the non-destructive inspection transducer assembly 254 is not required to come into contact with a surface of the object under test 258, a radius of the face of the non-destructive inspection transducer assembly 254 (e.g., a “wedge” contour) need not exactly correspond to the object under test 258.

[0030] In another approach, a flexible cushion can be used to further adapt a face of the non-destructive inspection transducer assembly 254 to a varying radius of curvature. Generally, as shown illustratively in FIG. 2A and FIG. 2B and elsewhere herein, a tangent positioner scheme used for the non-destructive inspection probe assembly 250 can be used to maintain a distance “D” across a range of different radii of curvature (e.g., outer diameter of the object under test 258, or an intermediate diameter region 259A, or a smallest diameter region 259B).

[0031] The configuration shown illustratively in FIG. 2A can be referred to as a “five link” mechanical configuration, because there are five pivoting locations (the central pivot location 271, the first pivot arm coupling 277A, the second pivot arm coupling 277B, first probe support frame coupling 279A, and second probe support frame coupling 279B). The functioning of the five-link configuration is further described in view of the diagram of FIG. 2B, which illustrates a detail view of a portion of the example of FIG. 2A comprising a pivoting shoe and associated forces that can be established using an input force applied to the probe assembly.

[0032] An input force (e.g., oriented downward in the view of FIG. 2A along the axis of symmetry) can be applied to the central pivot location 271, and such force is transmitted through the pivot arms (e.g., first pivot arm 273A) and is applied to the first pivot arm coupling 277A (represented as force, FP, in FIG. 2B). The force FP is transferred through the first pivoting shoe 275 A including an oblique component FA that induces normal reaction forces N1 and N2 at the corresponding contact carbides281B and 281A, respectively. The component FA is coupled at an angle that is less than 180 degrees with respect to the orientation of the normal vectors N1 and N2 (such as represented as an angle 0 being greater than zero and less than 90 degrees, as shown in relation to Nl). This force actuates the pivot shoes 275A to rotate to conform to a surface of the object under test 258. A sum of forces including input force, and reaction forces, including a resulting lateral component FR (and corresponding complementary force from an opposite side where there is another pivot arm and pivoting shoe, with carbides 281C and 28 ID as shown in FIG. 2A) creates an equilibrium position establishing the specified non-destructive inspection transducer height nearby the tangent location. This equilibrium generally exists for a variety of different input force magnitudes, so that the specified height is determined by a radius of curvature of the object under test on which the pivoting shoes rest, and is generally not dependent on a magnitude of an input force, FP, once such a force exceeds a threshold to conform the pivoting shoe 275 A to the object under test 258. [0033JA behavior of a five-link configuration for different object-under-test radii of curvature is shown illustratively in FIG. 3A, FIG. 3B, and FIG. 3C, which illustrate generally diagrams showing behavior of pivoting shoes 375 A and 375B, and associated distance, “D,” between a face of a non-destructive inspection transducer assembly and an object under test, for different diameters of test objects 358A, 358B, and 358C. In the examples of FIG. 3A through FIG. 3C, two pivoting arms are rotatably coupled to pivoting shoes 375A and 375B, respectively. The pivoting shoes 375A and 375B make contact with the object under test to establish a proportional “three-point” geometry (where the three points corresponding to a vertex defining the central pivot location where force, F, is applied, and the two vertices that extend to the pivoting shoes 375 A and 375B). A tangent condition can be established for the different radii of curvature of the test objects 358A, 358B, and 358C to maintain the specified distance, “D.” For example, such a distance can be preserved for radii of curvature ranging from, as an illustration, 60mm to a flat surface (e.g., corresponding to an infinite or otherwise vary large radius of curvature). In this illustration, using a configuration as shown in FIG. 2A and FIG. 2B, as illustrated by the diagrams of FIG. 3 A, FIG. 3B, and FIG. 3C, the distance, “D” can be less than a millimeter, such as about 0.3mm, nominally, and less than 0.5mm generally, as an illustrative example.

[0034] FIG. 4 illustrates generally a side view of a portion of a non-destructiveinspection probe housing 491 of a probe assembly 455 in a direction orthogonal to the view of the illustrative example of FIG. 2A and FIG. 2B. The probe assembly 455 can include a curved region 487 that allows the probe assembly 455 to provide better coverage of a portion of the object under test 458 where the radius of curvature is changing (such as in the region 485). As discussed elsewhere herein, a nondestructive inspection transducer assembly 454 can include an eddy current sensor (e.g., a coil or array of coil sensors, such as formed on or within a flexible circuit 483 assembly, such as fed by an interconnect or other circuitry 489). An active surface 481 of the non-destructive inspection transducer assembly 454 can be maintained at a specified distance, “D,” from the object under test 458, using the probe support scheme shown in other examples herein (such as FIG. 2A, FIG. 2B, or FIG. 5, for example). A wear strip or membrane can be used at the active surface 481, such as to help protect the non-destructive inspection transducer assembly 454 from mechanical abrasion or damage, but where the inspection scheme does not require the nondestructive inspection transducer assembly 454 physically contact the object under test 458.

[0035] FIG. 5 illustrates an isometric view of yet another example comprising a nondestructive inspection probe assembly 550 that can adapt to differing radii of curvature of an object under test. The configuration of the non-destructive inspection probe assembly 550 of FIG. 5 can operate in a manner similar to other examples herein, such as shown above in FIG. 2A and FIG. 2B but showing a configuration having four pivoting arms (with three arms 575A, 575B, 575C visible in the view of FIG. 5), and respective pivoting shoes 575A, 575B, 575C, and 575D. The configuration shown in FIG. 5 can be used to scan a longitudinal (or long axis), “A,” of an object under test, using a probe support frame 555 having an associated housing similar to that shown in the view of FIG. 4 (with the axis, “A” labeled in FIG. 4 to show the orientation of that view). Referring back to FIG. 5, a probe support frame 555 can include features such as a flange or other structure so that the probe assembly 550 can act as an end effector for a robotic manipulator or gantry to facilitate automated scanning as part of a non-destructive inspection process. Generally, as discussed above and elsewhere herein, for an object under test having varying diameters (or corresponding radii of curvatures within a specified range), the nondestructive inspection probe assembly 550 and associated “wedge” (e.g., transducer554 active surface having curvature) configuration shown in FIG. 5 can adapt to such variation to establish or maintain a specified distance between the object under test and active surface of a non-destructive inspection transducer assembly.

[0036] FIG. 6 illustrates generally an example comprising simulation results showing distance between a face of a non-destructive inspection transducer assembly and a surface of an object under test (annotated as “gap distance” in millimeters) versus different diameters of the object under test, with results for a reference approach (using fixed wedge radii) as compared to the adaptive positioner of the present subject matter. Generally, for radii of curvature that are greater than about 30mm (corresponding to 60mm object under test diameter), the error in gap distance shown in FIG. 6 is much smaller using the adaptive probe of the present subject matter as compared to a fixed wedge that does not adapt to differing radii.

[0037] FIG. 7 illustrates generally a technique 700 such as a method that can include, at 705, establishing a specified distance between a face of a non-destructive inspection transducer and a surface of an object under test, such as maintaining such a specified distance across a range of different radii of curvatures of the object under test. As an illustrative example, the probe assembly of any other example in this document can be used, such as manipulated by a robot or gantry (or actuated manually). The probe assembly can be pressed against a surface of the object under test. At 710, respective pivoting shoes can be placed in contact with the surface of the object under test. The contact of the pivoting shoes (and their associated reaction forces) along with the input force can cause respective pivoting arms to rotate in conjunction with each other, where the pivoting arms extend from a probe support frame. In response, at 715, the probe frame, housing a non-destructive inspection transducer assembly, can be displaced to establish or maintain the specified distance. In this manner, consistent inspection data can be obtained by adapting to different radii of curvature of the object under test, suppressing or eliminating error or variation due to, for example, lift off effects.Various Notes and Examples

[0038] Example 1 comprises a non-destructive inspection probe assembly, comprising: a probe support frame configured to support a non-destructive inspection transducer assembly; at least two pivoting arms extending from the probe supportframe in opposite directions and configured to rotate symmetrically about a central pivot location on the probe support frame; and respective pivoting shoes located distally along the at least two pivoting arms with respect to the central pivot location; wherein the pivoting shoes are configured to rotate in response to contact of the pivoting shoes at symmetric locations along a curved cross-sectional profile of an object under test to adjust to a radius of curvature of the object under test.

[0039] Example 2 comprises the non-destructive inspection probe assembly of Example 1, further comprising the non-destructive inspection transducer assembly; wherein the non-destructive inspection transducer assembly comprises an eddy current transducer.

[0040] Example 3 comprises the non-destructive inspection probe assembly of Example 2, wherein the non-destructive inspection transducer assembly comprises a flexible eddy current transducer array.

[0041] Example 4 comprises the non-destructive inspection probe assembly of any of Examples 1 through 3, wherein the object under test comprises a circular cross section.

[0042] Example 5 comprises the non-destructive inspection probe assembly of any of Examples 1 through 4, wherein the at least two pivoting arms are configured to pivot outward from the probe support frame or inward toward the probe support frame to establish a specified distance between a face of the non-destructive inspection transducer assembly and a surface of the object under test for different radii of curvatures associated with the object under test.

[0043] Example 6 comprises the non-destructive inspection probe assembly of any of Examples 1 through 5, wherein the at least two pivoting arms are configured to pivot outward from the probe support frame as the radius of curvature of the object under test increases; and wherein the at least two pivoting arms are configured to pivot inward toward the probe support frame as the radius of curvature of the object under test decreases.

[0044] Example 7 comprises the non-destructive inspection probe assembly of any of Examples 1 through 6, wherein the object under test comprises an axle having different radii of curvature at different axial locations along the axle.

[0045] Example 8 comprises the non-destructive inspection probe assembly of Example 7, wherein the axle comprises a steel railway wheel axle.

[0046] Example 9 comprises the non-destructive inspection probe assembly of any of Examples 1 through 8, wherein the respective pivoting shoes comprise two carbide elements per shoe to contact the object under test.

[0047] Example 10 comprises the non-destructive inspection probe assembly of any of Examples 1 through 9, wherein the respective pivoting shoes are rotatably coupled to their respective pivot arms and rotatably coupled to the probe support frame.

[0048] Example 11 comprises the non-destructive inspection probe assembly of any of Examples 1 through 10, wherein the at least two pivoting arms are amongst two pairs of pivoting arms and respective pivoting shoes at different axial locations along the non-destructive inspection transducer assembly.

[0049] Example 12 comprises the non-destructive inspection probe assembly of any of examples 1 through 11, wherein the at least two pivoting arms and associated pivoting shoes are configured to be actuated by force applied downward toward the object under test at the central pivot location.

[0050] Example 13 comprises an eddy current non-destructive inspection system comprising: the non-destructive inspection probe assembly of any of Examples 1 through 12; and a test instrument configured to excite and sense signals from an eddy current non-destructive transducer housed by the non-destructive inspection probe assembly, the test instrument comprising: a processor circuit; and a memory circuit communicatively coupled with the processor circuit; wherein the memory circuit comprises instructions that, when executed by the processor circuit, cause the eddy current non-destructive inspection system to perform eddy current inspection of an object under test.

[0051] Example 14 comprise a method for performing non-destructive inspection, the method comprising: establishing a specified distance between a face of a nondestructive inspection transducer assembly and a surface of an object under test, including adjusting to different radii of curvatures associated with the object under test, the adjusting comprising: rotating at least two pivoting arms extending from a probe support frame in opposite directions, symmetrically about a central pivot location on the probe support frame, in conjunction with rotation of respective pivoting shoes located distally along the respective pivoting arms with respect to the central pivot location; and in response, displacing the probe frame housing the nondestructive inspection transducer assembly upward or downward from a surface of theobject under test including pivoting the at least two pivoting arms outward from the probe support frame or inward toward the probe support frame to establish the specified distance between the face of the non-destructive inspection transducer assembly and the surface of the object under test for different radii of curvatures associated with the object under test.

[0052] Example 15 comprises the method of Example 14, wherein the nondestructive inspection transducer assembly comprises an eddy current transducer.

[0053] Example 16 comprises the method of Example 15, wherein the nondestructive inspection transducer assembly comprises and a flexible eddy current transducer array.

[0054] Example 17 comprises the method of any of Examples 14 through 16, wherein the object under test comprises a circular cross section.

[0055] Example 18 comprises the method of any of Examples 14 through 17. wherein the at least two pivoting arms pivot outward from the probe support frame as a radius of curvature of the object under test increases.

[0056] Example 19 comprises the method of any of Examples 14 through 18, wherein the at least two pivoting arms pivot inward toward the probe support frame as a radius of curvature of the object under test decreases.

[0057] Example 20 comprises the method of any of Examples 14 through 19, wherein the object under test comprises an axle having different radii of curvature at different axial locations along the axle.

[0058] Example 21 comprises the method of Example 20, wherein the axle comprises a steel railway wheel axle.

[0059] Example 22 comprises the method of any of Examples 14 through 21, wherein the respective pivoting shoes comprise two carbide elements per shoe to contact the object under test.

[0060] Example 23 comprises the method of any of Examples 14 through 22, wherein the respective pivoting shoes are rotatably coupled to their respective pivot arms and rotatably coupled to the probe support frame.

[0061] Example 24 comprises the method of any of Examples 14 through 23, wherein the at least two pivoting arms are amongst two pairs of pivoting arms and respective pivoting shoes at different axial locations along the transducer assembly.

[0062] Example 25 comprises the method of any of Examples 14 through 24, whereinthe at least two pivoting arms and associated pivoting shoes are actuated by force applied downward toward the object under test at the central pivot location.

[0063] Each of the non-limiting Examples above can stand on its own or can be combined in various permutations or combinations with one or more of the other Examples or other subject matter described in this document.

[0064] The above detailed description includes references to the accompanying drawings, which form a part of the detailed description. The drawings show, by way of illustration, specific embodiments in which the invention can be practiced. These embodiments are also referred to generally as “examples.” Such examples can include elements in addition to those shown or described. However, the present inventor also contemplates examples in which only those elements shown or described are provided. Moreover, the present inventor also contemplates examples using any combination or permutation of those elements shown or described (or one or more aspects thereof), either with respect to a particular example (or one or more aspects thereof), or with respect to other examples (or one or more aspects thereof) shown or described herein.

[0065] In the event of inconsistent usages between this document and any documents so incorporated by reference, the usage in this document controls.

[0066] In this document, the terms “a” or “an” are used, as is common in patent documents, to include one or more than one, independent of any other instances or usages of “at least one” or “one or more.” In this document, the term “or” is used to refer to a nonexclusive or, such that “A or B” includes “A but not B,” “B but not A,” and “A and B,” unless otherwise indicated. In this document, the terms “including” and “in which” are used as the plain-English equivalents of the respective terms “comprising” and “wherein.” Also, in the following claims, the terms “including” and “comprising” are open-ended, that is, a system, device, article, composition, formulation, or process that includes elements in addition to those listed after such a term in a claim are still deemed to fall within the scope of that claim. Moreover, in the following claims, the terms “first,” “second,” and “third,” etc., are used merely as labels, and are not intended to impose numerical requirements on their objects.

[0067] Method examples described herein can be machine or computer-implemented at least in part. Some examples can include a computer-readable medium or machine- readable medium encoded with instructions operable to configure an electronic deviceto perform methods as described in the above examples. An implementation of such methods can include code, such as microcode, assembly language code, a higher-level language code, or the like. Such code can include computer readable instructions for performing various methods. The code may form portions of computer program products. Such instructions can be read and executed by one or more processors to enable performance of operations comprising a method, for example. The instructions are in any suitable form, such as but not limited to source code, compiled code, interpreted code, executable code, static code, dynamic code, and the like.Further, in an example, the code can be tangibly stored on one or more volatile, non- transitory, or non-volatile tangible computer-readable media, such as during execution or at other times. Examples of these tangible computer-readable media can include, but are not limited to, hard disks, removable magnetic disks, removable optical disks (e.g., compact disks and digital video disks), magnetic cassettes, memory cards or sticks, random access memories (RAMs), read only memories (ROMs), and the like.

[0068] The above description is intended to be illustrative, and not restrictive. For example, the above-described examples (or one or more aspects thereof) may be used in combination with each other. Other embodiments can be used, such as by one of ordinary skill in the art upon reviewing the above description. The Abstract is provided to allow the reader to quickly ascertain the nature of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims. Also, in the above Detailed Description, various features may be grouped together to streamline the disclosure. This should not be interpreted as intending that an unclaimed disclosed feature is essential to any claim. Rather, inventive subject matter may he in less than all features of a particular disclosed embodiment. Thus, the following claims are hereby incorporated into the Detailed Description as examples or embodiments, with each claim standing on its own as a separate embodiment, and it is contemplated that such embodiments can be combined with each other in various combinations or permutations. The scope of the invention should be determined with reference to the appended claims, along with the full scope of equivalents to which such claims are entitled.

Claims

THE CLAIMED INVENTION IS:

1. A non-destructive inspection probe assembly, comprising: a probe support frame configured to support a non-destructive inspection transducer assembly; at least two pivoting arms extending from the probe support frame in opposite directions and configured to rotate symmetrically about a central pivot location on the probe support frame; and respective pivoting shoes located distally along the at least two pivoting arms with respect to the central pivot location; wherein the pivoting shoes are configured to rotate in response to contact of the pivoting shoes at symmetric locations along a curved cross-sectional profile of an object under test to adjust to a radius of curvature of the object under test.

2. The non-destructive inspection probe assembly of claim 1, further comprising the non-destructive inspection transducer assembly; wherein the non-destructive inspection transducer assembly comprises an eddy current transducer.

3. The non-destructive inspection probe assembly of claim 2, wherein the nondestructive inspection transducer assembly comprises a flexible eddy current transducer array.

4. The non-destructive inspection probe assembly of any of claims 1 through 3, wherein the object under test comprises a circular cross section.

5. The non-destructive inspection probe assembly of any of claims 1 through 4, wherein the at least two pivoting arms are configured to pivot outward from the probe support frame or inward toward the probe support frame to establish a specified distance between a face of the non-destructive inspection transducer assembly and a surface of the object under test for different radii of curvatures associated with the object under test.

6. The non-destructive inspection probe assembly of any of claims 1 through 5, wherein the at least two pivoting arms are configured to pivot outward from the probe support frame as the radius of curvature of the object under test increases; and wherein the at least two pivoting arms are configured to pivot inward toward the probe support frame as the radius of curvature of the object under test decreases.

7. The non-destructive inspection probe assembly of any of claims 1 through 6, wherein the object under test comprises an axle having different radii of curvature at different axial locations along the axle.

8. The non-destructive inspection probe assembly of claim 7, wherein the axle comprises a steel railway wheel axle.

9. The non-destructive inspection probe assembly of any of claims 1 through 8, wherein the respective pivoting shoes comprise two carbide elements per shoe to contact the object under test.

10. The non-destructive inspection probe assembly of any of claims 1 through 9, wherein the respective pivoting shoes are rotatably coupled to their respective pivot arms and rotatably coupled to the probe support frame.

11. The non-destructive inspection probe assembly of any of claims 1 through 10, wherein the at least two pivoting arms are amongst two pairs of pivoting arms and respective pivoting shoes at different axial locations along the non-destructive inspection transducer assembly.

12. The non-destructive inspection probe assembly of any of claims 1 through 11, wherein the at least two pivoting arms and associated pivoting shoes are configured to be actuated by force applied downward toward the object under test at the central pivot location.

13. An eddy current non-destructive inspection system comprising:The non-destructive inspection probe assembly of any of claims 1 through 12; and a test instrument configured to excite and sense signals from an eddy current non-destructive transducer housed by the non-destructive inspection probe assembly, the test instrument comprising: a processor circuit; and a memory circuit communicatively coupled with the processor circuit; wherein the memory circuit comprises instructions that, when executed by the processor circuit, cause the eddy current non-destructive inspection system to perform eddy current inspection of an object under test.

14. A method for performing non-destructive inspection, the method comprising: establishing a specified distance between a face of a non-destructive inspection transducer assembly and a surface of an object under test, including adjusting to different radii of curvatures associated with the object under test, the adjusting comprising: rotating at least two pivoting arms extending from a probe support frame in opposite directions, symmetrically about a central pivot location on the probe support frame, in conjunction with rotation of respective pivoting shoes located distally along the respective pivoting arms with respect to the central pivot location; and in response, displacing the probe frame housing the non-destructive inspection transducer assembly upward or downward from a surface of the object under test including pivoting the at least two pivoting arms outward from the probe support frame or inward toward the probe support frame to establish the specified distance between the face of the non-destructive inspection transducer assembly and the surface of the object under test for different radii of curvatures associated with the object under test.

15. The method of claim 14, wherein the non-destructive inspection transducer assembly comprises an eddy current transducer.

16. The method of claim 15, wherein the non-destructive inspection transducer assembly comprises and a flexible eddy current transducer array.

17. The method of any of claims 14 through 16, wherein the object under test comprises a circular cross section.

18. The method of any of claims 14 through 17. wherein the at least two pivoting arms pivot outward from the probe support frame as a radius of curvature of the object under test increases.

19. The method of any of claims 14 through 18, wherein the at least two pivoting arms pivot inward toward the probe support frame as a radius of curvature of the object under test decreases.

20. The method of any of claims 14 through 19, wherein the object under test comprises an axle having different radii of curvature at different axial locations along the axle.

21. The method of claim 20, wherein the axle comprises a steel railway wheel axle.

22. The method of any of claims 14 through 21, wherein the respective pivoting shoes comprise two carbide elements per shoe to contact the object under test.

23. The method of any of claims 14 through 22, wherein the respective pivoting shoes are rotatably coupled to their respective pivot arms and rotatably coupled to the probe support frame.

24. The method of any of claims 14 through 23, wherein the at least two pivoting arms are amongst two pairs of pivoting arms and respective pivoting shoes at different axial locations along the transducer assembly.

25. The method of any of claims 14 through 24, wherein the at least two pivoting arms and associated pivoting shoes are actuated by force applied downward toward the object under test at the central pivot location.

Images