Device and method for automatic data erasure

Abstract

The present invention relates to a device and an automated method for erasing data stored in non-volatile memories (M) of electronic devices (A), for example, portable devices such as smartphones or tablets, characterized in that they use an irradiation booth (1) comprising at least one X-ray source (S) confined in an X-ray-hermetically sealed enclosure and capable of successively receiving a plurality of electronic devices (A) introduced into the booth (1) by means of a conveyor belt (2), a control unit (CU) that controls the conveyor belt (2) and said X-ray source (S) to irradiate each of the electronic devices (A) with a controlled power and duration for the erasure of the data contained in the non-volatile memories (M) of said electronic devices (A).

Description

[0001] The present invention relates to the field of electronic devices containing non-volatile memories (NAND or NOR), such as smartphones or tablets, or any type of device containing such memories. The invention relates in particular to the erasure of data contained in such memories.

[0002] Indeed, a problem in this area concerns the erasure of data stored in these memories, particularly in the case of refurbishing or recycling these devices, to guarantee to users that their data cannot be recovered by third parties without their consent. Traditionally, erasing data in this type of memory involves resetting the bits by accessing the memory via computer using logic gates, which is cumbersome and requires booting the device, which must be at least partially functional. For example, when a device is no longer functional to the point that its motherboard and / or main components need to be repaired before a software erasure command can be executed, the preferred solution for now is to send the device to be destroyed by shredding and / or melting, which represents a clear waste in many respects (with significant economic and environmental implications).Furthermore, even when these devices remain functional enough for software access, a recurring problem arises from the fact that the numerous devices on the market have highly variable connection methods and operating systems, necessitating a wide variety of connectors and data access software. The time required for data erasure is therefore considerable and problematic. Automating data erasure is thus difficult to envision with the current state of the art. Moreover, the types of memory contained in these devices have diverse hardware architectures, with varying levels of performance and robustness, which also complicates data erasure.

[0003] Prior art, including documents US4393479 and JPS5975496, is known to provide solutions for erasing data in EPROM memories during their manufacture, but these solutions do not address the problems associated with programmable memories, particularly those found in various electronic devices such as those in the present application.

[0004] In this context, the present application proposes a device enabling reliable and rapid data erasure, avoiding unnecessary destruction of devices as much as possible and preferably in a way compatible with the automation of data erasure from electronic devices.

[0005] This goal is achieved by a device according to claim 1.

[0006] Other features and advantages of a device according to the present invention are detailed in claims 2 to 9.

[0007] Another objective of this application is to propose a method for reliable and rapid data erasure, avoiding unnecessary destruction of devices as much as possible and preferably in a manner compatible with the automation of data erasure from electronic devices.

[0008] This goal is achieved by a method according to claim 10.

[0009] Other features and advantages of a method according to the present invention are detailed in claims 11 to 14.

[0010] Other features and advantages of the present invention will become clearer upon reading the description of various embodiments below, made with reference to the accompanying drawings, in which: [ Fig 1 ] there figure 1 represents a schematic view of the automated data erasure device according to various embodiments; Fig 2 ] there figure 2 represents a schematic view of the automated data erasure device according to various embodiments including an inclined X-ray beam;

[0011] This application concerns an automated device for erasing data stored in non-volatile memories (M) of electronic devices (A), for example portable devices such as smartphones or tablets, or any type of electronic device or data storage device containing non-volatile memories, for example of the "Flash" type. The term "non-volatile memories" includes, for example, NAND or NOR type memories (i.e., flash and / or EEPROM) based on semiconductor technology (MOS, "metal-oxide semiconductors" according to Anglo-Saxon terminology) using floating-gate transistors that trap one or more electrons (technologies known by the acronyms SLC, MLC or TLC) in charge traps (or cells), arranged as floating grids in one or more (3D NAND technology) layers, each electron corresponding to a bit of data that can be recorded and erased at will.Traditionally, erasing data in this type of memory involves resetting the bits by accessing the memory via computer using logic gates. However, the present application proposes a faster method for erasing data without requiring computer access to this type of memory, through the use of calibrated X-rays to expel electrons trapped in charge traps. To this end, the present invention proposes an irradiation calibration that takes into account the architecture of non-volatile memories. The invention allows, for example, the rapid erasure of data, particularly personal data, stored in the memories of electronic devices, such as portable devices like smartphones or tablets, or any other device incorporating this type of memory (e.g., portable memory devices).The issue of data erasure is of particular importance with regard to preserving the confidentiality of users' personal data (for example, in the context of the GDPR), especially when these users' devices are intended for refurbishment or recycling. Data erasure is generally a cumbersome process, whereas the present invention allows for easy and rapid data erasure, providing advantages in terms of time and cost, regardless of the fate of the device whose data is to be erased from its non-volatile memory. Furthermore, for example in the case of refurbishment, this data erasure should preferably avoid damaging other components of the device, and various embodiments of the invention address this issue.

[0012] The automated data erasure device according to various preferred embodiments of the invention is characterized in that it comprises an irradiation chamber (1) including at least one X-ray source (S) confined within an X-ray-proof enclosure and capable of successively receiving a plurality of electronic devices (A) brought into the chamber (1) by a conveyor (2) and previously identified by means for identifying each of said devices (A) in order to recognize the type of device (A) and / or memory (M) to be irradiated. Such an X-ray-proof chamber (1) is known in the field and necessary to protect users, particularly because of the irradiation powers used in the implementation of the present invention. The conveyor (2) can, for example, be a conveyor belt on which the devices (A) to be irradiated are placed successively, for example after their identification, as detailed below.Furthermore, the device includes a control unit (CU) that drives the conveyor (2) and the X-ray source (S) to irradiate each electronic device (A) with controlled power and duration, according to irradiation parameters corresponding to the devices (A) identified by the identification means, for the erasure of the data contained in the non-volatile memories (M) of said electronic devices (A). The booth (1) therefore comprises an X-ray-tight enclosure into which the devices (A) enter via the conveyor, through at least one door (for example, a single door if the conveyor makes back-and-forth movements through a single entry-exit of the booth, or two doors if the conveyor passes through the booth; such doors may, for example, slide perpendicularly to the plane of the conveyor, for example, vertically), preferably preventing any radiation from escaping the booth (1).These doors are controlled by the control unit (CU) during the transport of the devices (A) in front of the X-ray source (S). The opening and closing of the doors will therefore be controlled according to the irradiation times of the devices (A) in the booth (1), either individually, device by device, or in batches of several devices simultaneously. Regarding the irradiation and control of the source (S), the applicant of this application has observed that it is necessary to control both the power and the duration of irradiation of the various devices (A) due to the nature of the memory chips (M) and / or other components they contain, as detailed below.

[0013] In various preferred embodiments of the invention, the control unit (CU) drives the X-ray source by controlling the power and duration according to the type of memory (M) contained in said electronic devices (A). Indeed, depending on the type of memory (M) and its architecture, the applicant of this application has observed that the duration and power of irradiation must be adjusted to ensure data erasure. For example, "cheap" (or "low-end") memories are often more sensitive than higher-quality memories. On the other hand, some memories (M) are manufactured to be protected from radiation, particularly when the electronic devices (A) pass through airport scanners. Thus, these memories require greater power and duration than unprotected ones.Furthermore, the position of the memory chips (M) within the devices (A) varies considerably, to the point that some memory chips (M) are protected, whether intentionally or accidentally, by the presence of other components within the devices (A). Finally, there are three-dimensional memory chips, such as those using the technology known as 3D NAND, in which data is stored in multiple superimposed layers, requiring greater irradiation than single-layer memory chips. Consequently, depending on the model of the electronic device (A) from which data is to be erased, it is necessary to know the type of memory chip and its location to control the irradiation, adjusting its power and duration. This, in turn, affects the speed of the conveyor (2) that carries successive devices (A) into the booth (1).It is therefore necessary for the control unit (CU) to be able to control these parameters, based on knowledge of the type of devices (A) and / or memories (M) to be irradiated, for example, through the serial numbers of the devices (A). This knowledge can be provided by a user entering the parameters used by the control unit or selecting the parameters to be used from among a plurality of parameters stored in a memory of the control unit (CU). Preferably, the various devices (A) of the same type will be prepared in advance for sequential transport by the conveyor, so that the parameters and the rate are constant, but the invention provides for varying them according to the type of devices (A) prepared on the conveyor.In some embodiments, means for identifying electronic devices (A) will be provided for automatic recognition of the devices (A) and adjustment of the irradiation parameters by the control unit using a memory storing the parameters corresponding to the devices (A) thus recognized. In some embodiments, an illustrative and non-limiting example of which is shown in Figure 1. figure 2 , a human-machine interface (HMI) is planned to allow a user to control said irradiation parameters (using input or selection means) and / or to monitor the proper progress (using a display of the irradiation focus and the devices that follow one another, via image capture means in the cabin).

[0014] There figure 1 This represents a schematic view of the automated data erasure device according to various preferred embodiments. In some of these embodiments, the X-ray source includes a tungsten or molybdenum target (CX). This type of target is particularly advantageous for delivering an effective X-ray beam for erasing data in the memory chips (M) used in commercially available devices (A). Furthermore, the applicant of this application has observed that among the important parameters for irradiating the memory chips (M) to erase data, the supply voltage of the source is important, as is the target current of the source. Thus, the selection of a voltage, a target, and a target current is necessary to obtain the desired results.For example, in some of these embodiments, the control unit (CU) drives the irradiation power by controlling a supply voltage to the X-ray source between 175 and 300 kilovolts and a target current of the X-ray source between 250 and 900 microamperes, preferably 350 to 750 microamperes. Furthermore, the irradiation time depends heavily on the type of memory (M) installed in the devices (A) to be irradiated. Thus, in some embodiments, the control unit (CU) drives the X-ray source to deliver irradiation for a duration of between one and eight minutes, preferably two to five minutes.

[0015] In some of these embodiments, the X-ray source includes a beryllium window (F). This type of window has the advantage of filtering out high-energy rays while allowing lower energies to pass through. The use of a thin beryllium window has proven particularly advantageous for achieving efficient irradiation for data erasure.

[0016] In some of these embodiments, the distance between said source (S) and the conveyor carrying the devices is between two and five centimeters, preferably 2.5 to 4 centimeters (two and a half to four centimeters). Indeed, the applicant of this application has observed that erasure is more effective when the memory to be erased is separated from the source (S) by only 2 to 3 centimeters.

[0017] In certain embodiments, the source (S) generates an X-ray beam irradiating said devices (A) along a principal axis (AF) that is inclined or tiltable relative to the conveyor plane. Indeed, the applicant of this application has observed that irradiation by a beam not perpendicular to the conveyor plane can, in some cases, facilitate data erasure, particularly in the case of memories with three-dimensional structures. Furthermore, such an inclined beam often makes it possible to avoid damaging other components of the electronic devices (A) whose memory contents (M) are to be erased, or at least to limit the risk of damage. figure 2This represents an illustrative and non-limiting example of such embodiments with a main axis (FA) of an inclined X-ray beam. The control unit (CU) is then configured to control the beam's inclination, for example, under the control of a user via the human-machine interface (HMI) or under the control of parameters pre-recorded in memory, depending on the identification of the device (A) to be irradiated. It is not necessary to describe in more detail here the control of an X-ray beam's inclination, which is widely known to those skilled in the art. It will be understood from this application that the inclination can be a fixed angle, determined according to the preferred angles for most known devices (A), or it can be variable and adjusted by the control unit (CU) driving a motor that tilts the source and its beam, for example, according to the identification of successive devices (A) brought into the booth (1).In some embodiments, the control unit (CU) also controls the tilt of the main beam axis according to the type of device present in the cabin (1). Thus, the main axis can be tilted at various angles relative to the conveyor plane, so that the X-ray beam can optimally target the memories (M) according to their architecture and / or their positioning relative to the other components of the device (A) that contain them. Therefore, the source (S) can be mounted on at least one motor configured to move the source (S) relative to the conveyor. This movement can then be controlled by the control unit (CU), which determines a focal point on which the X-ray beam must be centered within the targeted device at any given time.

[0018] It is understood that the present invention also relates to a reliable and rapid data erasure method, avoiding unnecessary destruction of devices as much as possible and preferably in a manner compatible with the automation of data erasure from electronic devices. Indeed, thanks to the parameters identified by the applicant of this application, the invention also provides an efficient data erasure method allowing for time savings and better preservation of the materials and components of devices (A), which are a major source of pollution when destroyed.

[0019] The invention therefore relates to a method for erasing data stored in non-volatile memories (M) of electronic devices (A), for example portable devices such as smartphones or tablets, characterized in that it comprises an identification of each of said devices (A) to recognize the type of device (A) and / or memory (M) to be irradiated, a determination, by a control unit (CU), of irradiation parameters corresponding to the devices (A) identified by the identification means and an irradiation of said electronic devices (A) by at least one X-ray source (S) confined in an X-ray hermetically sealed enclosure of an irradiation booth (1) capable of successively receiving a plurality of electronic devices (A) brought into the booth by a conveyor (2),The conveyor (2) and said X-ray source (S) are controlled by said control unit (CU) according to said irradiation parameters, including the power and duration of irradiation, for erasing the data contained in the non-volatile memory (M) of said electronic devices (A). The various embodiments of the device described in this application also apply to the method, which may therefore comprise various steps and use various parameters according to the functionalities described in this application.

[0020] This application describes various technical features and advantages with reference to the figures and / or various embodiments. Those skilled in the art will understand that the technical features of a given embodiment can in fact be combined with features of another embodiment unless the contrary is explicitly stated, or it is obvious that such features are incompatible, or that the combination does not provide a solution to at least one of the technical problems mentioned in this application. Furthermore, the technical features described in a given embodiment can be isolated from the other features of that embodiment unless the contrary is explicitly stated.

[0021] Detailed list of references in the figures: M: Non-volatile memory A: Electronic device 1: Cabin S: X-ray source 2: Conveyor CU: Control unit AF: Main axis of the X-ray beam CX: X-ray source target XF: X-ray source window HMI: Human-machine interface

Claims

1. Automated device for erasure of data stored in non-volatiles memories (M) of electronic equipment (A), for example portable devices such as smartphones or tablets, comprising an irradiation unit (1) comprising at least one X-ray source (S) enclosed in a housing hermetic to X-rays and able to receive a plurality of electronic devices (A) fed into the unit (1) successively by a conveyor (2), means of identification of each of the said devices (A) in order to recognize the type of device (A) and / or of memory (M) to be irradiated, a control unit (CU) controlling the conveyor (2) and the said source (S) of X-rays so as to irradiate each of the electronic devices (A) with a power and a duration controlled as a function of irradiation parameters corresponding to the devices (A) identified by the means of identification, for the erasure of the data contained in the non-volatile memories (M) of the said electronic devices (A).

2. Device according to Claim 1, characterized in that the said control unit (CU) determines, by virtue of the said means of identification, the location and the type of memory of the devices to be irradiated and controls the said conveyor (2) and the said X-ray source (S) as a function of this location and this type of memory determined.

3. Device according to Claim 2, characterized in that the source (S) generates a beam of X-rays irradiating the said devices (A) along a main axis (AF) which is tilted or tiltable with respect to the plane of the conveyor, the angle of this main axis (AF) being determined by the said control unit (CU) by virtue of the said means of identification.

4. Device according to either of Claims 1 and 2, characterized in that the control unit (CU) controls the X-ray source by controlling the power and the duration according to the type of memory (M) contained in the said electronic devices (A).

5. Device according to one of Claims 1 to 3, characterized in that the control unit (CU) controls the irradiation power by controlling a power supply voltage of the X-ray source in the range between 175 and 300 kilovolts and a target intensity of the X-ray source in the range between 250 and 900 microamps, preferably 350 to 750 microamps.

6. Device according to one of the preceding claims, characterized in that the control unit (CU) controls the X-ray source so as to deliver an irradiation over a duration in the range between 1 and 8 minutes, preferably 2 to 5 minutes.

7. Device according to one of the preceding claims, characterized in that the X-ray source comprises a target (CX) made of Tungsten or Molybdenum.

8. Device according to one of the preceding claims, characterized in that the X-ray source comprises a window (F) made of Beryllium.

9. Device according to one of the preceding claims, characterized in that the distance between the said source (S) and the conveyor transporting the devices is in the range between 2 and 5 centimetres, preferably 2.5 to 4 centimetres.

10. Method for erasing data stored in non-volatile memories (M) of electronic equipment (A), for example portable devices such as smartphones or tablets, the said method comprising: - an identification of each of the said devices (A) in order to recognize the type of device (A) and / or of memory (M) to be irradiated, - a determination, by a control unit (CU), of irradiation parameters corresponding to the devices (A) identified by the means of identification, - an irradiation of the said electronic devices (A) by at least one X-ray source (S) enclosed within a housing hermetic to X-rays of an irradiation unit (1) able to successively receive a plurality of electronic devices (A) fed into the unit by a conveyor (2), the conveyor (2) and the said X-ray source (S) being controlled by the said control unit (CU), as a function of the said irradiation parameters including the power and the duration of irradiation for the erasure of the data contained in the non-volatile memory (M) of the said electronic devices (A).

11. Method according to Claim 10, characterized in that the said irradiation parameters include a main axis (AF) of a beam of X-rays generated by the said source, this axis (AF) being tilted or tiltable with respect to the plane of the conveyor and the angle of this main axis (AF) being determined by the said control unit (CU) by virtue of the said means of identification.

12. Method according to either of Claims 10 and 11, characterized in that the control unit (CU) controls the X-ray source by controlling the power and the duration according to the type of memory (M) contained in the said electronic devices (A).

13. Method according to one of Claims 10 to 12, characterized in that the control unit (CU) controls the irradiation power by controlling a power supply voltage of the X-ray source in the range between 175 and 300 kilovolts and a target intensity of the X-ray source in the range between 250 and 900 microamps, preferably 350 to 750 microamps.

14. Method according to one of Claims 10 to13, characterized in that the control unit (CU) controls the X-ray source so as to deliver an irradiation over a duration in the range between 1 and 8 minutes, preferably 2 to 5 minutes.

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