A support structure for a device under test allowing rotation

Abstract

The present invention introduces a support structure for a device under test, DUT (12, 22, 32, 42), allowing rotation, i.e. a rotatable inner compartment (11, 21, 31, 41) applicable to fix, rotate and / or move the DUT. The inner compartment is manufactured of polymethacrylimide or other substantially RF-transparent material, and the inner compartment encloses the DUT or holds the DUT or attaches to the DUT so that the inner compartment is thus made immobile in relation to the DUT. The inner compartment can be rotated by a first motor (43a) so that the DUT can be placed in a desired alignment angle between two conducted measurements requiring two different alignment angles. When measuring, the inner compartment can be kept in its place and fixed with the DUT. A second motor (43b) can be applied for linear movement of the whole arrangement. Also a respective testing method for the DUT is presented. Testing in different temperatures is made possible by two concentric (inner and outer) compartments, and by feeding air with desired temperature to the intermediate volume, and by having through-holes (23) on the wall of the inner compartment.