Method for characterizing a polycrystalline material by diffractometry for the purpose of crystallographic analysis

FR3171280A1Pending Publication Date: 2026-07-17BRGM +1
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Patent Information

Authority / Receiving Office
FR · FR
Patent Type
Applications
Current Assignee / Owner
BRGM
Filing Date
2025-01-14
Publication Date
2026-07-17
Patent Text Reader

Abstract

A method (100) for characterizing a polycrystalline material by diffractometry for crystallographic analysis, characterized in that the method further comprises: - a step of dividing the angular range of deviation into different angular regions (IA1, IA2, IA3, IA4, IA5, IA6, IA7, IA8, IA9), and - in the iteration: * an integration step (140) of each angular region (IA1, IA2, IA3, IA4, IA5, IA6, IA7, IA8, IA9) to obtain an integration result for each angular region (IA1, IA2, IA3, IA4, IA5, IA6, IA7, IA8, IA9), * an estimation step (150) if all the integration results are stable, and in that the result of The estimation step as a stopping criterion (150). Figure for the abstract: Figure 5
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