A system for optimising a calibration and measurement of a spectral measurement device

Abstract

The present invention relates to a system (100) for optimising a calibration and measurement of a spectral measurement device (20). The system (100) is configured to optimise a calibration and measure

Description

[0001] A SYSTEM FOR OPTIMISING A CALIBRATION AND MEASUREMENT OF A SPECTRAL MEASUREMENT DEVICE

[0002] FIELD OF INVENTION

[0003] The present invention relates to a system for optimising a calibration and measurement of a spectral measurement device. More particularly, the present invention relates to a system for optimising a calibration and measurement of a spectral measurement device by controlling the position of an object with respect to an arrangement of a plurality of light sources and detectors.

[0004] BACKGROUND OF THE INVENTION

[0005] Spectroscopy is a scientific technique used to study the interaction between matter and electromagnetic radiation. It involves analysing the spectrum of light emitted or absorbed by a substance to obtain valuable information about the composition, structure, and properties of the substance. Some notable applications of spectroscopy are in chemical analysis and material characterisation, whereby spectroscopy is used to identify and quantify various chemical compositions present in a sample. To address the growing demand for fast, convenient, and cost-effective solutions for spectroscopy analysis, portable spectroscopy devices have been widely developed. These devices offer swift analyses to enhance efficiency, accessibility and informed decision-making across various industries and applications that utilise spectroscopy analysis.

[0006] One example of such devices is disclosed in a United States Patent Application Publication No. US 20170153142 A1. This publication discloses a spectrometer system that comprises a handheld spectrometer in wireless communication with a cloud-based storage system. The spectrometer comprises an illumination module used to illuminate a sample with light, a temperature sensor module used to measure and record the temperature of the sample during measurement, and one or more spectrometer modules that include a plurality of filters used to transmit a range of wavelengths and a detector used to detect light in the wavelengths of interest. The spectrometer can be combined with a protective cover comprising a sheath. The protective cover may comprise an internal calibration material that allows the spectrometer to be calibrated when placed in the sheath. Spectroscopic devices find application across a wide range of fields due to their ability to provide detailed information about the composition, structure, and properties of matter. Such devices typically incorporate conventional light source and detector arrangements in relation to the sample placement during calibration and measurement processes. These conventional arrangements may suffer from several limitations that hinder optimal results and impede accurate analysis. These limitations may include interference caused by background noise and sample impurities, variations in the measured spectra due to inconsistent angle of incidence at which light interacts with the sample, etc. Addressing these limitations is critical for improving the accuracy, efficiency, and reliability of calibration and measurement processes in spectroscopy analysis. Therefore, there is a need to address the abovementioned drawbacks.

[0007] SUMMARY OF INVENTION

[0008] According to an aspect of the present invention, a system (100) for optimising a calibration and measurement of a spectral measurement device (20) is provided. The system (100) comprises the spectral measurement device (20) configured to optically analyse an object to generate at least one spectral property of the object; and a calibration jig (30) configured to hold the spectral measurement device (20) during a calibration process. The system (100) is characterised in that the calibration jig (30) includes a stand (31) configured as a base for the calibration jig (30); a device holder (32) fixedly mounted on top of the stand (31), wherein the device holder (32) includes an area configured for receiving and accommodating the spectral measurement device (20); a vertical arm (33) removably attached to the device holder (32), wherein the vertical arm (33) extends in an upward direction and is configured to support a sample holder (35) and positioned the sample holder (35) at a pre-determined distance from sensing elements of the spectral measurement device (20); the sample holder (35) extending horizontally from the vertical arm (33), wherein the sample holder (35) is configured to support a sample kit (37); a ray gateway (36) formed at a center of a floor surface of the sample holder (35), wherein the ray gateway (36) is configured to provide a pathway for the light rays to travel between the object and the sensing elements of the spectral measurement device (20); and the sample kit (37) removably mounted to the sample holder (35), wherein the sample kit (37) is configured to hold the object.

[0009] Preferably, the calibration jig (30) includes a pair of engagement mechanisms (34) for attachment of the vertical arm (33) to the device holder (32). Preferably, the sensing elements of the spectral measurement device (20) include a plurality of light sources (21) configured to emit the light rays toward the object and a plurality of detectors (22) configured to collect the light rays that are reflected from the object.

[0010] Preferably, each of the detectors (22) is configured to collect specific wavelengths of the light rays and filter out any unwanted wavelengths of the light rays via a built-in aperture.

[0011] Preferably, the system (100) further comprises a processing unit (10) configured to compute measurement parameters of the system (100).

[0012] Preferably, the measurement parameters include a semi-perimeter value of a plurality of light sources (21) and detectors (22), the size of a detection area, the distance of a sample holder (35) from a plurality of light sources (21) and detectors (22), and a radius of a ray gateway (36).

[0013] Preferably, the system (100) further comprises a server unit (40) configured to perform an analysis of the at least one spectral property of the object using at least one artificial intelligence model.

[0014] BRIEF DESCRIPTION OF THE DRAWINGS

[0015] The accompanying drawings, which are incorporated in and constitute a part of the specification, illustrate embodiments of the invention and, together with the description, serve to explain the principles of the invention.

[0016] FIG. 1 illustrates a block diagram of a system (100) for optimising a calibration and measurement of a spectral measurement device (20) according to an embodiment of the present invention.

[0017] FIG. 2 illustrates a perspective view of the spectral measurement device (20) according to an example embodiment of the present invention.

[0018] FIG. 3 illustrates a diagram of a first example arrangement of a plurality of light sources (21) and detectors (22). FIG. 4 illustrates a diagram of a second example arrangement of the plurality of light sources (21) and detectors (22).

[0019] FIG. 5 illustrates an exploded perspective view of a calibration jig (30) according to an embodiment of the present invention.

[0020] FIG. 6 illustrates a flowchart of a method for optimising a calibration and measurement of the spectral measurement device (20) according to an embodiment of the present invention.

[0021] FIG. 7 illustrates a flowchart of the sub-steps of defining measurement parameters of the spectral measurement device (20) of the method of FIG. 6.

[0022] FIG. 8 illustrates a flowchart of the sub-steps of defining measurement parameters of the calibration jig (30) of the method of FIG. 6.

[0023] DESCRIPTION OF THE PREFERRED EMBODIMENT

[0024] A preferred embodiment of the present invention will be described herein below with reference to the accompanying drawings. In the following description, well known functions or constructions are not described in detail since they would obscure the description with unnecessary detail.

[0025] An initial reference is made to FIG. 1 which illustrates a block diagram of a system (100) for optimising a calibration and measurement of a spectral measurement device (20) according to an embodiment of the present invention. The system (100) is configured to optimise a calibration and measurement of the spectral measurement device (20) by ensuring a precise and consistent object positioning with respect to the arrangement of a plurality of light sources (21) and detectors (22). The system (100) is adapted for, but is not limited to, an application in blood testing and analysis, where it is used to determine at least one spectral property of the object. The object may be a reference standard or a sample such as a haemoglobin solution or a blood sample. Based on the spectral property, information regarding the object may be inferred such as the composition of the blood components, the presence of various proteins in the blood components, the presence of abnormalities such as pathogens or abnormal cell types, etc. The system (100) comprises a processing unit (10), the spectral measurement device (20), a calibration jig (30), and a server unit (40).

[0026] The processing unit (10) is used to compute the measurement parameters of the system (100). In particular, the processing unit (10) computes the measurement parameters of the spectral measurement device (20) and the calibration jig (30). The measurement parameters are used, preferably by a human user, to optimise the arrangements of components of the spectral measurement device (20) and the calibration jig (30). Examples of the measurement parameters include the distance between the light sources (21) and the detectors (22) of the spectral measurement device (20), a sample area size and a detection area size on the spectral measurement device (20), a distance of a sample holder (35) of the calibration jig (30) from sensing elements of the spectral measurement device (20), a radius of a ray gateway (36) of the calibration jig (30), etc. The processing unit (10) may be any computing device that includes one or more of a microprocessor, processor, microcontroller, microcomputer, or other programmable circuits capable of processing data for the computation of the measurement parameters.

[0027] The spectral measurement device (20) is configured to optically analyse the object to generate the spectral property of the object. The spectral measurement device (20) may specifically be a compact, portable spectrometer device in suitable shape and dimension that allows it to be carried by the human user with a single hand. FIG. 2 illustrates a perspective view of the spectral measurement device (20) according to an example embodiment of the present invention. The spectral measurement device (20) comprises a housing made of suitable material that is configured to provide a full or partial mechanical cover for one or more components of the spectral measurement device (20). A window (23) is provided on a top surface of the spectral measurement device (20), wherein the window (23) is defined as an area where the sensing elements of the spectral measurement device (20) are positioned. The window (23) may be an optically transparent element made of a glazed surface such as glass or plastic material that provides a protective cover to the sensing elements while allowing light rays to be transmitted to and from the sensing elements.

[0028] The sensing elements of the spectral measurement device (100) include the light sources (21) and the detectors (22). Each of the light sources (21) is preferably a light-emitting diode or LED, wherein the light sources (21) are configured to emit the light rays toward the object. The light rays may be in a broad-spectrum range with different intensities, for example, the light rays may have wavelengths in one or more of the visible and infrared portions of the electromagnetic spectrum with wavelengths that include, but are not limited to, 400 nm until 1000 nm. The detectors (22) are configured to collect the light rays that are reflected from the object. The detectors (22) measure the reflected light rays and generate a signal such as an electronic signal or a voltage signal indicating the spectral property of the object. The spectral property may be the intensity and wavelength of the light rays. Each of the detectors (22) may be configured to collect specific wavelengths of the light rays via a built-in aperture. At the same time, the aperture filters out any unwanted wavelengths of the light rays.

[0029] The spectral measurement device (20) may include various pre-determined arrangements of each of the light sources (21) and the detectors (22). These arrangements are preferably chosen to maximise the amount of light rays collected, wherein these arrangements define the distances between the light sources (21) and the detectors (22) as well as the fixed angles of the light sources (21) and the detectors (22) relative to the design of the housing of the spectral measurement device (20). FIG. 3 illustrates a diagram of a first example arrangement of the light sources (21) and the detectors (22). A first light source (21) is positioned between a first and second detectors (22) in one direction at pre-determined distances from each other. This arrangement ensures that the light rays are distributed equivalently from the light sources (21) to the detectors (22).

[0030] The area of placement of the light sources (21) and the detectors (22) makes up a sensing elements configuration area while the area surrounding the light sources

[0031] (21) and the detectors (22) makes up a sample area. A detection area is defined within the sample area. The size of the sample area is preferably the same or bigger than the size of the detection area to adequately cover the entire detection area. FIG. 4 illustrates a second example arrangement of the light sources (21) and the detectors

[0032] (22). The dashed circle represents the sample area. One light source (21) and at least three detectors (22) are positioned within the sample area, with the one light source (21) positioned in the centre of the sample area and the three detectors (22) positioned so as to form edges of a triangle. Alternatively, one detector (22) and at least three light sources (21) are positioned within the sample area, with the one detector (22) positioned in the centre of the sample area and the three light sources (21) positioned so as to form edges of a triangle. Variables a and p represent the distances between the light sources (21) or the detectors (22) and variable 5 is used to define the size of the sample area. For instance, in this second example arrangement, the value of variable a may fall within the range of 0.6 to 0.8 millimetres, the value of variable may fall within the range of 0.8 to 12 millimetres, and the value of variable 5 may be more than 3mm or exactly 3mm to adequately cover the entire detection area.

[0033] The distances between the light sources (21) or the detectors (22) are used by the processing unit (10) to compute a semi-perimeter value and the size of the detection area. Preferably, the semi-perimeter value is computed based on the formula below: whereby sp represents the semi-perimeter value, and distancel, distance!, distance!, and distanceN represent the distances between the light sources (21) or the detectors (22) respectively.

[0034] The size of the detection area is preferably computed using a formula below: whereby sp represents the value of the semi-perimeter, and distancel, distance!, distance!, and distanceN represent the the distances between the light sources (21) or the detectors (22) respectively.

[0035] Further to this, it should be noted that the spectral measurement device (20) may also comprise various other components. Examples of such components are power sources such as batteries for supplying power to the spectral measurement device (20), an operating button for powering the device on / off, an LED for indicating the power level, etc. The spectral measurement device (20) may also comprise peripheral connections such as a serial bus connector or Wifi connection for data transfer and communication, a temperature sensor for monitoring the temperature of the object or the components of the spectral measurement device (20), etc. The spectral measurement device (20) may further comprise a controller board for processing, controlling, and analysing data of the spectral measurement device (20). The controller board may partially analyse the data of the spectral measurement device (20) prior to transmission to the server unit (40).

[0036] The calibration jig (30) is configured to hold the spectral measurement device (20) during a calibration process. FIG. 5 illustrates an exploded perspective view of the calibration jig (30) according to an embodiment of the present invention. The calibration jig (30) comprises a stand (31), a device holder (32), a pair of engagement mechanisms (34), a vertical arm (33), the sample holder (35), the ray gateway (36), and a sample kit (37).

[0037] The stand (31) is configured to serve as a base for the calibration jig (30). The stand (31) preferably resembles an A-shaped fixture having a low centre of gravity such that the stand (31) provides support for the placement of the calibration jig (30) on any respective surfaces and prevents the calibration jig (30) from tipping over. The device holder (32) is fixedly mounted on top of the stand (31) via a suitable attachment means. The device holder (32) is configured to hold the spectral measurement device (20) during the calibration process. The device holder (32) has a floor surface, a front perimeter edge, a back perimeter edge, a left perimeter edge, and a right perimeter edge that define an area for receiving and accommodating the spectral measurement device (20). The device holder (32) is preferably of the same shape as the spectral measurement device (20) and is of sufficient size to snugly hold the spectral measurement device (20).

[0038] The vertical arm (33) is removably attached to the device holder (32) via the pair of engagement mechanisms (34). Preferably, the engagement mechanisms (34) are a pair of magnets, each disposed on the back perimeter edge of the device holder

[0039] (32) and a lower portion of the vertical arm (33). The vertical arm (33) extends in an upward direction, wherein the vertical arm (33) is configured to support the sample holder (35) that is fixedly mounted at an upper-end portion of the vertical arm (33). The sample holder (35) may be mounted via a suitable attachment means. The vertical arm

[0040] (33) permits the positioning of the sample holder (35) at the pre-determined distance from the light sources (21) and detectors (22) of the spectral measurement device (20). Preferably, the distance is computed by the processing unit (10) based on a formula below: whereby hb refers to the distance of the sample holder (35) from the light sources (21) and detectors (22), Si refers to a constant value of a surface increment, SA refers to the detectors’ (22) aperture, and the field of detection angle refers to an angle at which the detectors (22) capture the light rays.

[0041] The sample holder (35) extends horizontally from the vertical arm (33) and faces towards the device holder (32). The sample holder (35) may be of suitable size and shape. The sample holder (35) is configured to support the sample kit (37). Typically, the sample kit (37) has the object attached to it. Thus, the sample holder

[0042] (35) is used to ensure the proper positioning of the object in the sample kit (37) with respect to the sensing elements of the spectral measurement device (20). The sample holder (35) includes a floor surface, a front perimeter edge, and a back perimeter edge that define an area for the placement of the sample kit (37). At the centre of the floor surface of the sample holder (35), the ray gateway (36) is formed. The ray gateway

[0043] (36) is configured to collect the light rays by providing a pathway for the light rays to travel between the object and the sensing elements of the spectral measurement device (20). The ray gateway (36) is preferably circular in shape and has the predetermined radius. Preferably, the radius of the ray gateway (36) is computed by the processing unit (10) based on a formula below: gateway = LITL + P (4) whereby the gateway refers to the radius of the ray gateway (36), LITL refers to the longest incenter of the triangle length, and P refers to a parameter or thickness of the calibration jig (30).

[0044] The sample kit (37) is removably mounted to the sample holder (36), wherein the sample kit (37) is configured to hold the object. At the centre of the sample kit (37), an aperture is formed to provide a placement for a vessel that holds the object in place. The vessel may be a petri dish. The sample kit (37) may be in a suitable shape and size to receive the vessel and may further include other interchangeable holders or fixtures to securely hold the object on the vessel such as adjustable clamps, vials, wells, or other mechanisms. The interchangeable holders or fixtures may be of adjustable sizes to accommodate objects of different sizes and shapes.

[0045] The calibration jig (30) may be made from suitable materials such as polymer, composite material, etc. The calibration jig (30) ensures precise positioning and orientation of the object relative to the arrangements of the light sources (21) and the detectors (22). The object positioning as well as the arrangement of the light sources (21) and detectors (22) are adapted to minimise measurement inaccuracies that may arise from intrinsic or extrinsic interferences. Using the calibration jig (30), the object is placed at the pre-determined distance from the arrangements of the light sources (21) and detectors (22). This is done to reduce light loss and dispersion as the light rays would have a shorter distance to travel. Placing the object closer to the light sources (21) and the detectors (22) also reduces a placement radius. The placement radius may be referred to as an angular extent of the sample area. Reducing the placement radius allows the light sources (21) and the detectors (22) to focus on a specific region of interest to precisely illuminate the entire object and capture all of the reflected light rays.

[0046] Referring back to FIG. 1 , the server unit (40) is connected to the spectral measurement device (20), preferably via a wireless connection. The server unit (40) is configured to perform an analysis of the spectral property of the object using at least one artificial intelligence model. Some examples of the artificial intelligence models may include machine learning models such as a Support Vector regression model, a Decision Tree Regression model, and a Random Forest Regression model or deep learning models such as a TabNet model, an adaptive relation modelling network or Arm-Net model, etc. Based on the analysis, the server unit (40) may obtain various information regarding the characteristics of the object. For instance, the server unit (40) may obtain information such as the composition of the blood components, the presence of various proteins in the blood components, the presence of abnormalities such as pathogens or abnormal cell types, etc. Reference is now made to FIG. 6 which illustrates a flowchart of a method for optimising a calibration and measurement of the spectral measurement device (20) according to an embodiment of the present invention. Initially, the processing unit (10) defines the measurement parameters of the spectral measurement device (20) as in step 200, wherein the measurement parameters include the detection area size and the sample area size. The detection area size and the sample area size are defined to ensure that the sample area size is equal to or bigger than the detection area size. The sub-steps of defining the measurement parameters of the spectral measurement device (20) will be described in detail in relation to FIG. 7.

[0047] Next, the processing unit (10) defines the measurement parameters of the calibration jig (30) as in step 201. The measurement parameters are used to determine the distance of the sample holder (35) from the sensing elements of the spectral measurement device (20) as well as the radius of the ray gateway (36). The sub-steps of defining the measurement parameters of the calibration jig (30) will be described in detail in relation to FIG. 8.

[0048] Once the measurement parameters have been defined, the method then proceeds to the step of assembling the calibration jig (30) as in step 202. Preferably, the calibration jig (30) is assembled manually by the human user. Alternatively, the calibration jig (200) may also be assembled by a machine or robotic components. To assemble the calibration jig (30), the user initially attaches the vertical arm (33) to the device holder (32) via the pair of engagement mechanisms (34). The user then places the spectral measurement device (20) onto the device holder (32). Next, the user adjusts the sample holder (35) to its pre-determined distance from the sensing elements of the spectral measurement device (20). The adjustment may be made by utilising any suitable levelling mechanisms. Then, the user attaches the sample kit (37) to the sample holder (35) and places the vessel containing the object, which is the reference standard, onto the sample kit (37). The user may then re-check or make adjustments to ensure that the calibration jig (30) is assembled properly according to its computed measurement parameters and that all the components of the calibration jig (30) are properly secured to each other to prevent movement of misalignment.

[0049] Thereon, the user initiates the calibration process of the spectral measurement device (20) as in step 203. The user initially powers the spectral measurement device (20). The light sources (21) then emit the light rays, whereby the light rays travel through the ray gateway (36), hit the reference standard, and are reflected toward the detectors (22). Each of the detectors (22) collects specific wavelengths of the light rays via the built-in aperture and simultaneously filters out any unwanted wavelengths of the light rays. The collected light rays are then analysed by the spectral measurement device (20) to determine the spectral property of the reference standard. Based on the spectral property data, any adjustments may then be made to the spectral measurement device’s (20) settings such as adjusting the wavelength settings, plotting a calibration curve, establishing a baseline absorbance level, etc. The spectral measurement device (20) may also automatically transmit all data to the server unit (40) for storage or further analysis via the wireless connection.

[0050] Once the calibration process has been carried out, the user then initiates the measurement process on the real sample as in step 204. Initially, the user removes the spectral measurement device (20) from the device holder (32). The user then places the sample onto the window (23) of the spectral measurement device (20) where the sensing elements are positioned. Thereon, the light sources (21) emit the light rays, whereby the light rays travel through the ray gateway (36), hit the sample, and are reflected toward the detectors (22). Each of the detectors (22) collects specific wavelengths of the light rays via the built-in aperture and simultaneously filters out any unwanted wavelengths of the light rays. The collected light rays are then analysed by the spectral measurement device (20) to determine the spectral property of the sample. Based on the spectral property data, various information regarding the characteristics of the sample may be computed. For instance, the spectral measurement device (20) may compute an absorbance value of the sample. The spectral measurement device (20) may also automatically transmit all data to the server unit (40) for storage or further analysis via the wireless connection.

[0051] Thereon, the server unit (40) may perform further analysis of the sample based on the transmitted data using the artificial intelligence model as in step 205. Generally, the server unit (40) determines various information about the sample based on the computed absorbance value. For example, for an application in blood testing and analysis, the server unit (40) may determine information about the blood sample such as the composition of the blood components, the presence of various proteins in the blood components, the presence of abnormalities such as pathogens or abnormal cell types, etc. The result of the analysis may then be displayed on an interface device such as a monitor screen, a liquid crystal display or LCD, a mobile application screen display, etc.

[0052] Reference is now made to FIG. 7 which illustrates a flowchart of the sub-steps of defining the measurement parameters of the spectral measurement device (20) as done in step 200 of the method of FIG. 6. Initially, to compute the detection area size, the processing unit (10) determines and labels the distances between the light sources (21) or the detectors (22) as in step 300. These distances may be provided to the processing unit (10) by the human user. The processing unit (10) then proceeds to compute the semi-perimeter value using the formula (1) as in step 301. Once the semiperimeter value is obtained, the processing unit (10) computes the detection area size using the formula (2). Once the detection area size is obtained, the processing unit (10) defines the suitable sample area size as in step 303, wherein the sample area size has to be equal to or bigger than the detection area size. The processing unit (10) then determines if the sample area size is equal to or bigger than the detection area size as in step 304. If the sample area size is smaller than the detection area size, the method returns to step 300. On the other hand, if the sample area size is equal to or bigger than the detection area size, the method then proceeds to step 201 of the FIG. 5 which is to define the measurement parameters of the calibration jig (30).

[0053] Reference is now made to FIG. 8 which illustrates a flowchart of the sub-steps of defining the measurement parameters of the calibration jig (30) as done in step 201 of the method of FIG. 5. Firstly, the processing unit (10) computes the distance of the sample holder (32) from the sensing elements of the spectral measurement device (20) using the formula (3) as in step 400. Then, the processing unit (10) proceeds to compute the radius of the ray gateway (36) using the formula (4) as in step 401 .

[0054] A person of ordinary skill in the art will recognize many variations, alterations, and adaptations based on the disclosure provided. For example, the order of the steps of the method can be changed, some of the steps removed, some of the steps duplicated, and additional steps added as appropriate. Some of the steps may be executed automatically and some of the steps may be executed manually. While embodiments of the invention have been illustrated and described, it is not intended that these embodiments illustrate and describe all possible forms of the invention. Rather, the words used in the specifications are words of description rather than limitation and various changes may be made without departing from the scope of the invention.

Claims

CLAIMS1. A system (100) for optimising a calibration and measurement of a spectral measurement device (20) comprises: a) the spectral measurement device (20) configured to optically analyse an object to generate at least one spectral property of the object; and b) a calibration jig (30) configured to hold the spectral measurement device (20) during a calibration process, characterised in that the calibration jig (30) includes: i) a stand (31) configured as a base for the calibration jig (30); ii) a device holder (32) fixedly mounted on top of the stand (31), wherein the device holder (32) includes an area configured for receiving and accommodating the spectral measurement device (20); iii) a vertical arm (33) removably attached to the device holder (32), wherein the vertical arm (33) extends in an upward direction and is configured to support a sample holder (35) and positioned the sample holder (35) at a pre-determined distance from sensing elements of the spectral measurement device (20); iv) the sample holder (35) extending horizontally from the vertical arm (33), wherein the sample holder (35) is configured to support a sample kit (37); v) a ray gateway (36) formed at a centre of a floor surface of the sample holder (35), wherein the ray gateway (36) is configured to provide a pathway for the light rays to travel between the object and the sensing elements of the spectral measurement device (20); and vi) the sample kit (37) removably mounted to the sample holder (35), wherein the sample kit (37) is configured to hold the object.

2. The system (100) as claimed in Claim 1 , wherein the calibration jig (30) includes a pair of engagement mechanisms (34) for attachment of the vertical arm (33) to the device holder (32).

3. The system (100) as claimed in Claim 1 , wherein the sensing elements of the spectral measurement device (20) include a plurality of light sources (21) configured to emit the light rays toward the object and a plurality of detectors (22) configured to collect the light rays that are reflected from the object.

4. The system (100) as claimed in Claim 3, wherein each of the detectors (22) is configured to collect specific wavelengths of the light rays and filter out any unwanted wavelengths via a built-in aperture.

5. The system (100) as claimed in Claim 1 , wherein the system (100) further comprises a processing unit (10) configured to compute measurement parameters of the system (100).

6. The system (100) as claimed in Claim 5, wherein the measurement parameters include a semi-perimeter value of a plurality of light sources (21) and detectors (22), and wherein the semi-perimeter value is computed based on a formula below:whereby sp represents the semi-perimeter value, and distancel, distance!, distance!, and distanceN represent the distances between the plurality of light sources (21) or detectors (22) respectively.

7. The system (100) as claimed in Claim 5, wherein the measurement parameters include the size of a detection area, and wherein the size of the detection area is computed using a formula below:whereby sp represents a semi-perimeter value, and distancel, distance!, distance!, and distanceN represent the distances between a plurality of light sources (21) or detectors (22) respectively.

8. The system (100) as claimed in Claim 5, wherein the measurement parameters include a distance of a sample holder (35) from a plurality of light sources (21) and detectors (22), and wherein the distance is computed based on a formula below:whereby hb refers to the distance of the sample holder (35) from the plurality of light sources (21) and detectors (22), Si refers to a constant value of a surface increment, SA refers to the detectors’ (22) aperture, and the field of detection angle refers to an angle at which the detectors (22) capture light rays.

9. The system (100) as claimed in Claim 5, wherein the measurement parameters include a radius of a ray gateway (36), and wherein the radius of the ray gateway (36) is computed based on a formula below: gateway = LITE + P whereby the gateway refers to the radius of the ray gateway (36), LITL refers to the longest incenter of a triangle length, and P refers to a parameter or thickness of a calibration jig (30).

10. The system (100) as claimed in Claim 1 , wherein the system (100) further comprises a server unit (40) configured to perform an analysis of the at least one spectral property of the object using at least one artificial intelligence model.

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