Millimeter-wave vector network analyzer

HK40138130APending Publication Date: 2026-09-25OHIO STATE INNOVATION FOUND
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Patent Information

Application Number
HK62026126531
Authority / Receiving Office
HK · HK
Patent Type
Applications
Current Assignee / Owner
Priority Date
2023-03-23
Filing Date
2026-07-23
Publication Date
2026-09-25
Estimated Expiration
2044-03-20

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Abstract

Described and disclosed herein are embodiments of a millimeter-wave (mmW) vector network analyzer (VNA). In one aspect, the mmW VNA comprises a conventional automotive / industrial mmW radar circuit board modified to be connected to one or more devices (i.e., connectorized). The mmW radar circuit board comprises a multi-port board with a plurality of receive (Rx) channels and a plurality transmit (Tx) channels and a mmW radar chip; connectors in place of an on-board antenna, wherein the Rx and Tx channels are connected to the one or more devices; and one or more off-axis parabolic mirrors that are used to transmit signals to, from and / or through a sample using the devices.
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Description

This document describes and discloses embodiments of a millimeter-wave (mmW) vector network analyzer (VNA). In one aspect, the millimeter-wave vector network analyzer includes a conventional automotive / industrial millimeter-wave radar circuit board modified for connection to one or more devices (i.e., connectorized). The millimeter-wave radar circuit board includes: a multi-port board and a millimeter-wave radar chip having multiple receive (Rx) channels and multiple transmit (Tx) channels; a connector replacing the onboard antenna, wherein the Rx and Tx channels are connected to the one or more devices; and one or more off-axis parabolic reflectors for transmitting signals through the devices to a sample, transmitting signals from the sample, and / or transmitting signals through the sample. Abstract

Claims

CLAIMSWhat is claimed is:

1. A millimeter- wave (mmW) vector network analyzer (VNA) comprising: a mmW radar circuit board modified to be connected to one or more devices, wherein the mmW radar circuit board comprises: a plurality of board ports comprising a plurality of receive (Rx) channels and a plurality of (Tx) channels; a mmW radar chip; and a plurality of connectors, wherein one or more of the plurality of Rx channels and one or more of the plurality of Tx channels are connected to the one or more devices using the plurality of connectors; and one or more off-axis parabolic mirrors, wherein the one or more off-axis parabolic mirrors are used to transmit signals to, from and / or through a sample using the devices.

2. The mmW VNA of claim 1, wherein the plurality of board ports comprises seven board ports, comprising four Rx channels and three Tx channels.

3. The mmW VNA of any one of claim 1 or claim 2, wherein the plurality of connectors replace an on-board antenna on the mmW radar circuit board.

4. The mmW VNA of any one of claims 1-3, wherein leads are used to connect the Rx and Tx channels to the one or more devices.

5. The mmW VNA of any one of claims 1-4, wherein the one or more devices comprise one or more Tx antenna, and / or one or more Rx antenna, and / or one or more combination Tx / Rx antenna.

6. The mmW VNA of claim 5, wherein the one or more devices further comprise one or more circulators.

7. The mmW VNA of any one of claim 5 or claim 6, wherein the one or more devices further comprise one or more external directional couplers.

8. The mmW VNA of any one of claim 5 or claim 6, wherein the one or more devices further comprise one or more integrated directional couplers.

9. The mmW VNA of any one of claims 1-8, wherein a measurement scenario using the mmW VNA is considered with a target that is rotated in an azimuth and / or elevation direction for transmission and reflection imaging as a function of an incidence angle.

10. The mmW VNA of any one of claims 1-9, wherein the mmW VNA is used to determine properties of the sample including multi-port, calibrated, S-parameter measurements, antenna characterization (including input impedance and antenna pattern), scattering cross section measurements, material characterization (permittivity and permeability), and imaging.