NON-INVASIVE DETECTION SYSTEM AND METHODS FOR EVALUATION OF MATERIAL UNIFORMITY AND GAMMA PHOTON FIELD BASED ON LOW RESOLUTION SPECTROMETERS

Abstract

The present invention discloses a non-invasive detection system and method for evaluating the uniformity of materials and gamma photon fields using a low energy resolution spectrometer. The system includes a gamma detection unit, a digital signal amplifier and processor, an analysis module implementing an empirical weighting function G(L), a real-time display interface, and a standalone power source to support portable operation. The proposed method operates in the time series domain by utilizing spectral relationships in the Pulse Height Spectrum (PHS) to obtain two global parameters, namely the magnitude of the radiation power H*(10) and the weighted average photon energy Ä'H*(10). The basic characteristics of the system are determined by an empirical distribution function (EDF) that provides a statistical deviation threshold as a reference for determining uniformity.Global parameter dynamics are compared between the control and test time groups and then quantitatively analyzed against predefined EDF deviation limits. A statistical smoothing mechanism is used to reduce random fluctuations so that significant changes in the material or gamma photon field can be identified as anomalies. This approach enables adaptive, real-time uniformity evaluation without the need for spectrum unfolding or high-resolution detectors, providing an efficient solution for technical inspection, quality control, and radiation safety monitoring in various industrial and research applications.