PARTICLE MEASUREMENT EQUIPMENT, METHODS, AND PROGRAMS

ID202605961APending Publication Date: 2026-07-17KK TOSHIBA

Patent Information

Authority / Receiving Office
ID · ID
Patent Type
Applications
Current Assignee / Owner
KK TOSHIBA
Filing Date
2024-10-07
Publication Date
2026-07-17
Patent Text Reader

Abstract

The present invention aims to provide a particle measurement apparatus that can be realized at low cost and also enables particle measurement through easy operation. According to an embodiment, a particle measurement apparatus includes a light source configured to supply illumination light to illuminate a particle in a liquid, an imaging unit configured to image the illumination light that has been transmitted through the particle, and a measurement unit configured to measure the distance between the particle and the imaging unit based on the transmitted light intensity of the illumination light imaged by the imaging unit and the known particle size and refractive index of the particle.
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