Electrical Measuring Instrument Probe Heads

JP1754440SActive Publication Date: 2024-12-10TEKTRONIX INC
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Patent Information

Application Number
JP2023004220D
Authority / Receiving Office
JP · JP
Patent Type
Designs
Current Assignee / Owner
Priority Date
2022-09-07
Filing Date
2023-03-03
Publication Date
2024-12-10
Estimated Expiration
2048-03-03

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Abstract

This product is a probe head for electrical measuring instruments that is used with electrical measuring instruments. On the front side of this product, there is a connector for electrically connecting various probe tips. By contacting the probe tip with a measurement point on the electrical circuit to be measured, an electrical signal is picked up into the probe head via the probe tip. On the back side of this product, there is a signal cable for transmitting the electrical signal picked up through the probe tip to the electrical measuring instrument.
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