X-ray analysis equipment image

JP1795059SActive Publication Date: 2025-04-03SHIMADZU SEISAKUSHO LTD
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Patent Information

Application Number
JP2024018165D
Authority / Receiving Office
JP · JP
Patent Type
Designs
Current Assignee / Owner
Filing Date
2024-09-02
Publication Date
2025-04-03
Estimated Expiration
2049-09-02

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Abstract

The image of the present design is used in an "X-ray analysis device" that performs composition analysis by irradiating a sample with X-rays, and is particularly used on a screen that allows the user to grasp the progress of the analysis. The display state of the screen changes depending on the user's actions of storing the sample to be analyzed in the storage unit of the device, registering an analysis schedule, or performing an analysis by the analysis device.
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