X-ray fluorescence analyzer

JP1798490SActive Publication Date: 2025-05-14譜睿儀器(深せん)有限公司
View PDF 0 Cites 0 Cited by

Patent Information

Application Number
JP2024025970D
Authority / Receiving Office
JP · JP
Patent Type
Designs
Current Assignee / Owner
Filing Date
2024-12-17
Publication Date
2025-05-14
Estimated Expiration
2049-12-17

Smart Images

  • Figure 0001798490000001
    Figure 0001798490000001
  • Figure 0001798490000002
    Figure 0001798490000002
  • Figure 0001798490000003
    Figure 0001798490000003
Patent Text Reader

Abstract

This product is an X-ray fluorescence analysis device that irradiates a sample with X-rays and analyzes the elements in the sample using the fluorescent X-rays emitted from the sample.
Need to check novelty before this filing date? Find Prior Art