Wafer inspection images

JP1820758SActive Publication Date: 2026-03-05HAMAMATSU PHOTONICS KK
View PDF 0 Cites 0 Cited by

Patent Information

Application Number
JP2025003738D
Authority / Receiving Office
JP · JP
Patent Type
Designs
Current Assignee / Owner
Filing Date
2025-02-27
Publication Date
2026-03-05
Estimated Expiration
2049-07-11

Smart Images

  • Figure 0001820758000001
    Figure 0001820758000001
  • Figure 0001820758000002
    Figure 0001820758000002
  • Figure 0001820758000003
    Figure 0001820758000003
Patent Text Reader

Abstract

The image of the present design is used to read and inspect the wafer to be analyzed, and is an image for setting the analysis range of the wafer. In this image, as shown in the "image diagram," the analysis range display section is displayed on the wafer display section to be analyzed, and as shown in the "image diagram of the changed state," the analysis range display section can be enlarged and set to the desired size.
Need to check novelty before this filing date? Find Prior Art