Probe pin for integrated circuits testing

JP1821884SActive Publication Date: 2026-03-17HICON CO LTD +2
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Patent Information

Authority / Receiving Office
JP · JP
Patent Type
Designs
Current Assignee / Owner
Filing Date
2024-07-17
Publication Date
2026-03-17

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Abstract

The material of this design is metal. This design is a probe pin that contacts electrodes, terminals, pads, etc., and is used for inspecting electronic components such as semiconductor devices, semiconductor packages, integrated circuits, and printed circuit boards. The main feature of this design is the shape of the probe pin for inspecting integrated circuits. 1.1) Perspective view; 1.2) Front view; 1.3) Rear view; 1.4) Left side view; 1.5) Right side view; 1.6) Top view; 1.7) Bottom view
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