Probe pin for integrated circuits testing

Abstract

The material of this design is metal. This design is a probe pin that contacts electrodes, terminals, pads, etc., and is used for inspecting electronic components such as semiconductor devices, semiconductor packages, integrated circuits (ICs), and printed circuit boards. This design increases the stability of contact with IC terminals by forming a crown-shaped contact terminal at the top. Shoulders (projections) are formed on the upper and lower pins, allowing adjustment of how much the pins protrude from the socket. The main feature of this creation is the shape and combination of shapes of the IC inspection probe pin. 1.1) Perspective view; 1.2) Front view; 1.3) Rear view; 1.4) Left side view; 1.5) Right side view; 1.6) Top view; 1.7) Bottom view; 1.8) Reference drawing

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