Probe pin for integrated circuit testing

Abstract

The material of this design is metal. This design is a probe pin, used to connect electrodes, terminals, pads, etc., to circuits and to inspect electronic components such as semiconductor devices, semiconductor packages, integrated circuits, and printed circuit boards. The main feature of this design is the shape of the "integrated circuit inspection probe pin". 1.1) Perspective view; 1.2) Front view; 1.3) Rear view; 1.4) Left side view; 1.5) Right side view; 1.6) Top view; 1.7) Bottom view

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