Substrate processing method, storage medium, and substrate processing device

The method addresses pattern collapse in substrate processing by replacing liquid in recesses with a solid reinforcing material and reducing molecular bonds, allowing for stable drying without pattern distortion.

JP2024170630AActive Publication Date: 2024-12-10TOKYO ELECTRON LTD
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Patent Information

Application Number
JP2024158388
Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
Priority Date
2020-08-20
Filing Date
2024-09-12
Publication Date
2024-12-10
Estimated Expiration
2041-08-10

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Abstract

To provide a substrate processing method and a substrate processing device that are effective in suppressing pattern collapse of uneven patterns.SOLUTION: The substrate processing method includes replacing a liquid in a recess of a substrate on which an uneven surface pattern is formed with a reinforcement material in a solid state and applying a low molecular weight processing to the substrate to reduce the number of bonds between molecules in the reinforcement material while maintaining the reinforcement material in a solid state.SELECTED DRAWING: Figure 8
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Citation Information

Patent Citations

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  • Line pattern collapse mitigation through gap-fill material application

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