Image processing device and image processing method
JP2025006429A5Pending Publication Date: 2026-07-23CANON KK
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Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- CANON KK
- Filing Date
- 2023-06-29
- Publication Date
- 2026-07-23
AI Technical Summary
Technical Problem
Existing visual inspection techniques struggle to detect fine linear irregularities on industrial products when the posture of the inspection object changes, as perpendicular lighting becomes ineffective, leading to weakened shadows and reduced detection accuracy.
Method used
An image processing device that acquires a normal map and a direction vector of a virtual light source to adjust lighting direction based on the object's posture, ensuring consistent perpendicular lighting for detecting linear irregularities.
Benefits of technology
Enables the detection of fine linear irregularities on industrial products even when the object's posture changes, maintaining detection accuracy by simulating perpendicular lighting conditions.
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Abstract
To provide a technique that enables detection of fine linear irregularities even when a posture of an object under inspection changes.SOLUTION: An image processing device provided herein is configured to acquire a normal line map indicating a spatial distribution of normal lines on a surface of an object, acquire a directional vector of a virtual light source corresponding to a change in the posture of the object, and perform detection processing for detecting linear irregularities on the surface based on the normal line map and the directional vector.SELECTED DRAWING: Figure 2
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