Abnormality detection device, abnormality detection system, and abnormality detection method

JP2025007543APending Publication Date: 2025-01-17HITACHI LTD

Patent Information

Application Number
JP2023109014
Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
Filing Date
2023-07-03
Publication Date
2025-01-17

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  • Figure 2025007543000001_ABST
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Abstract

To provide an abnormality detection method that can detect abnormality in micro-service with high accuracy.SOLUTION: An abnormality detection device includes: a telemetry information acquisition unit that acquires first telemetry information including log information, trace information, and metric information from a first set of micro-service; an embedding generation unit that generates trace embedding corresponding to the trace information, generates log embedding corresponding to the log information, and generates metric embedding corresponding to the metric information; a model generation unit that generates, on the basis of the trace embedding, the log embedding, and the metric embedding, a machine learning model for abnormality detection that determines presence or absence of abnormality in the micro-service; and an abnormality detection unit that analyzes, using the machine learning model for abnormality detection, second telemetry information acquired for a second set of micro-service and then generates an abnormality detection result indicating presence or absence of abnormality in the second micro-service.SELECTED DRAWING: Figure 2
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Citation Information

Patent Citations

  • Automated anomaly detection service on heterogeneous log streams

    US9928155B2

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