Switching of semiconductor switch using measuring circuit and control device
JP2025092461APending Publication Date: 2025-06-19DSPACE DIGITAL SIGNAL PROCESSING & CONTROL ENGINEERING GMBH
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Patent Information
- Application Number
- JP2024210783
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2023-12-08
- Filing Date
- 2024-12-03
- Publication Date
- 2025-06-19
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Figure 2025092461000001_ABST
Abstract
To provide a device that includes a semiconductor switch 1, a measuring circuit 2, and a control device 3 and that is simple and efficient for overload protection of the semiconductor switch.SOLUTION: In a defect generation unit, an overload detector of a measuring circuit 2 detects that an overload is occurring in a load path 6 and outputs an overload signal to a control device 3 via an overload signal output unit 13 when the overload is occurring. The control device is connected to a switch signal input section 7 of a semiconductor switch 1 via a switch signal line 14 and supplies a switch signal to the semiconductor switch for opening the semiconductor switch when the overload signal is received, supplies a switch signal to the semiconductor switch for closing after the overload signal disappears when the overload is maximum and reaches a predetermined maximum overload, and no longer generates the switch signal for closing the switch even after the overload signal disappears when the overload exceeds the predetermined maximum overload.SELECTED DRAWING: Figure 1
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