Thickness measurement system and thickness measurement method
JP2025125016APending Publication Date: 2025-08-27TLV CO LTD
Patent Information
- Application Number
- JP2024020827
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2024-02-15
- Publication Date
- 2025-08-27
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Figure 2025125016000001_ABST
Abstract
To provide a thickness measurement system or the like for calculating a corrosion rate with high accuracy.SOLUTION: In a thickness measurement system, a second device includes a thickness calculation part for calculating the thickness of a point to be measured on the basis of measurement data, and calculating a corrosion rate (CR) on the basis of thickness of the measurement data measured in the past before a measurement period of the thickness and the measurement data in the case of receiving the measurement data, a storage part for storing a thickness measurement result obtained by associating at least the thickness and the CR with a measurement period of measurement data used to calculate the thickness, and with update information with an update propriety of the CR set, and a setting part for setting the update information in update execution about a thickness measurement result including a measurement period after a measurement period of received measurement data in the storage part. The thickness calculation part recalculates a CR of measurement data with the update execution set in the update information in the thickness measurement result of the storage part, and the setting part sets update information of the thickness measurement result with the CR recalculated to update impossibility.SELECTED DRAWING: Figure 5
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Citation Information
Patent Citations
Thickness measurement system, thickness measurement method, and thickness measurement program
WO2021149228A1