Thickness measurement system and thickness measurement method

JP2025125016APending Publication Date: 2025-08-27TLV CO LTD
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Patent Information

Application Number
JP2024020827
Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
Filing Date
2024-02-15
Publication Date
2025-08-27

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Abstract

To provide a thickness measurement system or the like for calculating a corrosion rate with high accuracy.SOLUTION: In a thickness measurement system, a second device includes a thickness calculation part for calculating the thickness of a point to be measured on the basis of measurement data, and calculating a corrosion rate (CR) on the basis of thickness of the measurement data measured in the past before a measurement period of the thickness and the measurement data in the case of receiving the measurement data, a storage part for storing a thickness measurement result obtained by associating at least the thickness and the CR with a measurement period of measurement data used to calculate the thickness, and with update information with an update propriety of the CR set, and a setting part for setting the update information in update execution about a thickness measurement result including a measurement period after a measurement period of received measurement data in the storage part. The thickness calculation part recalculates a CR of measurement data with the update execution set in the update information in the thickness measurement result of the storage part, and the setting part sets update information of the thickness measurement result with the CR recalculated to update impossibility.SELECTED DRAWING: Figure 5
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Citation Information

Patent Citations

  • Thickness measurement system, thickness measurement method, and thickness measurement program

    WO2021149228A1