Sample holder and measuring device

Abstract

To provide technology which, regarding a sample holder assumed to rotate on a sample stage, can more appropriately execute fixation of the sample holder.SOLUTION: According to an embodiment of the present invention, a sample holder used for measurement by a radiation ray is provided. This sample holder includes a base part and a holding part. The base part is constructed to rotate about a revolving shaft, and has a first plane and a second plane. The first plane connects to the holding part. The second face has a first recess and a second recess, and is located opposite the first plane in a direction in which the revolving shaft extends. The first recess is provided at a position on the revolving shaft. The second recess is provided at a position displaced from the revolving shaft. The holding part is constructed to be capable of holding a sample.SELECTED DRAWING: Figure 1

Description

[Technical Field]

[0001] The present invention relates to a sample holder and a measuring device. [Background technology]

[0002] Patent Document 1 discloses the provision of a sample mounting component for an X-ray CT measurement device that can perform a CT value calibration operation and a measurement of the sample to be measured at the same time without changing the sample, and that can eliminate the need for a positioning operation each time when the same sample container is used, and an X-ray CT measurement method that uses the sample mounting component of the X-ray CT measurement device. [Prior art documents] [Patent documents]

[0003] [Patent Document 1] Japanese Patent Application Publication No. 2022-144482 Summary of the Invention [Problem to be solved by the invention]

[0004] There is a need for a technique that can more appropriately perform measurements on a sample or sample holder on a sample stage while the sample or sample holder is fixed during the measurement.

[0005] In view of the above circumstances, the present invention provides a technique that can more appropriately fix a sample holder that is expected to rotate on a sample stage. [Means for solving the problem]

[0006] According to one aspect of the present invention, there is provided a sample holder for use in radiation measurements. The sample holder has a base and a holding part. The base is configured to rotate around a rotation axis and has a first surface and a second surface. The first surface is connected to the holding part. The second surface has a first recess and a second recess and is located opposite the first surface in the direction along which the rotation axis extends. The first recess is provided at a position on the rotation axis. The second recess is provided at a position offset from the rotation axis. The holding part is configured to be able to hold a sample.

[0007] According to the present disclosure, it is possible to more appropriately fix a sample holder that is expected to rotate on a sample stage. [Brief explanation of the drawings]

[0008] [Figure 1] FIG. 1 is a diagram illustrating an example of a measurement device 1. [Figure 2] FIG. 2 is a diagram showing an example of a perspective view of a sample holder 2. [Figure 3] FIG. 3 is a diagram showing an example of a perspective view of the sample holder 2 in FIG. 2. [Figure 4] FIG. 2 is a diagram showing an example of another perspective view of the sample holder 2. [Figure 5] 1 is a diagram illustrating the relationship between a sample holder 2, a sample stage 3, a holder standby unit 4, and a holder transport unit 5. FIG. [Figure 6] 6 is a diagram showing an example of a bottom view of the sample holder 2 and the sample stage 3 taken along line AA in FIG. 5. FIG. [Figure 7] FIG. 1 shows an example of a perspective view of a sample holder 1000. [Figure 8] FIG. 2 shows an example of a perspective view of a sample holder 2000. DETAILED DESCRIPTION OF THE INVENTION

[0009] [Embodiment] Hereinafter, embodiments of the present invention will be described with reference to the drawings. Various features shown in the following embodiments can be combined with each other. However, the present invention is not limited to these embodiments. Furthermore, in the drawings attached to this specification, components may be shown at different scales than in actuality in order to clearly show characteristic parts.

[0010] (Measuring device 1) In this example, a measuring device 1 will be described. FIG. 1 is a diagram showing an example of the measuring device 1. The measuring device 1 is a device for measuring radiation RD that has passed through a sample SN. For example, the measuring device 1 includes a sample holder 2, a sample stage 3, a holder standby unit 4, a holder transport unit 5, an irradiation unit 6, and a detection unit 7. "Passing through the sample SN" means that the sample SN is disposed on an optical path. For example, the radiation RD that has passed through the sample SN may include radiation that has undergone physical phenomena such as transmission, reflection, diffraction, and scattering in the sample SN. Examples of radiation RD include alpha rays, beta rays, gamma rays, X-rays, and neutron rays. This allows measurement of radiation RD using the sample holder 2 of this embodiment.

[0011] The sample holder 2 is a holder used for measurement using radiation RD. The sample holder 2 holds a sample SN. The sample holder 2 will be described in detail with reference to FIGS.

[0012] The sample SN is held by the sample holder 2. The sample SN is any object, such as a battery, a screw, or the like.

[0013] The sample stage 3 is configured so that the sample holder 2 can be placed thereon. The sample stage 3 will be described in detail with reference to FIGS.

[0014] The holder standby section 4 is configured so that a plurality of sample holders 2 in which pre-measurement and / or post-measurement samples SN are placed can be standby.

[0015] The holder transport unit 5 is configured to be able to transport the sample holder 2. The holder standby unit 4 and the holder transport unit 5 will be described in detail with reference to FIG.

[0016] The irradiation unit 6 irradiates the sample SN provided in the sample holder 2 with radiation RD. A radiation source according to the type of radiation RD to be generated and the amount of energy of the radiation RD may be used in the irradiation unit 6. The irradiation unit 6 may be configured to be able to change the amount of energy of the radiation RD to be generated by any mechanism.

[0017] The detection unit 7 detects the radiation RD that has passed through the sample SN. The detection unit 7 may use a detector that is appropriate for the type of radiation RD.

[0018] (Sample holder 2) The XYZ coordinate system in the following FIGS. 2 to 8 is a Cartesian coordinate system set with the sample holder 2 as the reference. The X-axis, Y-axis, and Z-axis are as shown in the figures. For example, the X-axis extends in a direction parallel to a line connecting the center of the first recess (positioning portion 206) and the center of the second recess (spinning suppression portion 207). The positive and negative signs of the X-axis are positive (positive X-axis direction) on the first recess (positioning portion 206) side and negative (negative X-axis direction) on the second recess (spinning suppression portion 207) side. For example, the Y-axis extends in a direction perpendicular to the line connecting the center of the first recess (positioning portion 206) and the center of the second recess (spinning suppression portion 207). The positive and negative signs of the Y-axis are positive (positive Y-axis direction) on the first wall portion 202a side and negative (negative Y-axis direction) on the first wall portion 202b side, with respect to the rotation axis RA. For example, the Z axis extends in the same direction as the rotation axis RA. The Z axis is positive (positive Z direction) on the first surface 200 side and negative (negative Z direction) on the second surface 205 side.

[0019] The sample holder 2 of this embodiment will be described below with reference to Figures 2 to 4. Figure 2 is a diagram showing an example of a perspective view of the sample holder 2. Figure 3 is a diagram showing an example of a perspective view of the sample holder 2 of Figure 2. Figure 4 is a diagram showing another example of a perspective view of the sample holder 2.

[0020] The sample holder 2 may have a base 20 and a holding portion 21. The base 20 and the holding portion 21 may each be formed from a material that is transmissive to a certain degree of radiation RD. For example, the base 20 and the holding portion 21 may each be radiotransparent. The base 20 and the holding portion 21 are each formed primarily from a material that is low in density and suitable for transmitting radiation RD. For example, if the radiation RD is X-rays, the material may be a resin such as polystyrene or polypropylene. This reduces the effects of absorption, scattering, etc. of radiation RD by the sample holder 2. The base 20 and the holding portion 21 may be molded integrally or separately. If molded separately, the holding portion 21 may be replaced with one of various shapes depending on the type of sample SN.

[0021] The base 20 has a shape used for placement on the sample stage 3. The base 20 may also have a shape used for holding by the holder waiting unit 4 and the holder transport unit 5. The base 20 is configured to rotate about a rotation axis RA, and may have, in order from the positive direction of the Z axis to the negative direction of the Z axis (from the first surface 200 to the second surface 205), a first surface 200, a first cylindrical portion 201, a first pillar portion 202, a second cylindrical portion 203, a second pillar portion 204, and a second surface 205.

[0022] The first surface 200 is a surface to which the holding elements 210a, 210b, and 210c of the holding unit 21 are connected. The first surface 200 may be configured to be able to position the sample SN in the Z-axis direction by coming into contact with the sample SN. The shape of the first surface 200 may be circular with the rotation axis RA as the center when observed from the Z-axis direction (as viewed from the Z-axis direction). In addition, if the sample SN is a battery, the first surface 200 may be provided with electrodes (not shown) for applying electricity to the battery.

[0023] The first cylindrical portion 201 may have a cylindrical shape with the rotation axis RA as the center of the circle, and may have a holder connection surface 201a, an R-wall portion 201b, an outer peripheral wall portion 201c, an R-wall portion 201d, and a first-post connection surface 201e. The holder connection surface 201a may be a portion corresponding to the bottom surface of the cylinder, or may be formed by the first surface 200 as in the embodiment. The R-wall portion 201b connects the holder connection surface 201a and the outer peripheral wall portion 201c and may have an R-shape. The outer peripheral wall portion 201c may be a portion corresponding to the side surface of the cylinder. The R-wall portion 201d connects the outer peripheral wall portion 201c and the first-post connection surface 201e and may have an R-shape. The first post connecting surface 201e is connected to the ends of the first wall portions 202a and 202b in the short direction (negative Z-axis direction) and the ends of the first arc-shaped wall portions 202c and 202d in the axial direction (negative Z-axis direction). The first post connecting surface 201e may be a surface that pairs with the holder connecting surface 201a, and may have the same shape as the holder connecting surface 201a.

[0024] A holder identification part DI may be provided on the side surface of the outer peripheral wall part 201c. The holder identification part DI is configured to be able to identify information about the sample holder 2. The holder identification part DI may be provided on the outer peripheral wall part 201c at a position on the opposite side of the rotation axis RA from the slippage suppression part 207 in the radial direction of the rotation axis RA. For example, the holder identification part DI may be provided with information for identifying the sample holder 2 by any method such as a QR code (registered trademark), a bar code, an RF tag, or image recognition. This allows the position of the holder identification part DI to be fixed, thereby enabling efficient identification of information about the sample holder 2.

[0025] The first pillar portion 202 has a pillar shape. The first pillar portion 202 may have two first walls 202a, 202b and two first arc-shaped walls 202c, 202d radially inward from the cylindrical circle defined by the outer circumferential wall portion 201c.

[0026] For example, each of the two first walls 202a, 202b may have a rectangular shape parallel to the ZX plane, with the X-axis direction being the longitudinal direction and the Z-axis direction being the lateral direction. The two first walls 202a, 202b may have the same shape. The first wall 202a may be provided at a position opposite the first wall 202b in the radial direction of the rotation axis RA.

[0027] Each of the two first arcuate wall portions 202c, 202d may be formed to define the circumferential direction of each of the first arcuate wall portions 202c, 202d by bulging away from the rotation axis RA. Furthermore, each of the first arcuate wall portions 202c, 202d may be formed to define the axial direction of each of the first arcuate wall portions 202c, 202d by extending parallel to the rotation axis RA. The first wall portion 202a may be provided at a position opposite to the first wall portion 202b in the radial direction of the rotation axis RA.

[0028] For example, one longitudinal end (positive X-axis direction) of first wall portion 202a may be connected to one circumferential end (positive Y-axis direction) of first arcuate wall portion 202c, and one longitudinal end (negative X-axis direction) of first wall portion 202b may be connected to one circumferential end (negative Y-axis direction) of first arcuate wall portion 202d. For example, the other longitudinal end (negative X-axis direction) of first wall portion 202a may be connected to the other circumferential end (positive Y-axis direction) of first arcuate wall portion 202d, and the other longitudinal end (positive X-axis direction) of first wall portion 202b may be connected to the other circumferential end (negative Y-axis direction) of first arcuate wall portion 202c.

[0029] The second cylindrical portion 203 may have a cylindrical shape with the rotation axis RA as its center, and may have a first-post connecting surface 203a, an R-wall portion 203b, an outer peripheral wall portion 203c, an R-wall portion 203d, and a second-post connecting surface 203e. The shape of the second cylindrical portion 203 may be the same circular shape as the first cylindrical portion 201 when viewed in the Z-axis direction. The first-post connecting surface 203a may be a portion corresponding to the bottom surface of the cylinder. Furthermore, the first-post connecting surface 203a may be connected to the ends of the first wall portions 202a and 202b in the short direction (negative Z-axis direction) and the ends of the first arc-shaped wall portions 202c and 202d in the axial direction (negative Z-axis direction). The R-wall portion 203b connects the first-post connecting surface 203a and the outer peripheral wall portion 203c and may have an R-shape. The outer peripheral wall portion 203c may be a portion corresponding to the side surface of the cylinder. The R-wall portion 203d may connect the outer peripheral wall portion 203c and the second post connecting surface 203e and have an R-shape. The second post connecting surface 203e may be connected to the ends of the second wall portions 204a and 204b in the short side direction (positive direction of the Z axis) and the ends of the second arc-shaped wall portions 204c and 204d in the short side direction (positive direction of the Z axis). The second post connecting surface 203e may be a surface that pairs with the first post connecting surface 203a and may have the same shape as the first post connecting surface 203a.

[0030] The second pillar portion 204 has a pillar shape. When viewed in the Z-axis direction, the shape of the second pillar portion 204 may be the same circular shape as the first pillar portion 202. The second pillar portion 204 may have two second wall portions 204a, 204b, two second arc-shaped wall portions 204c, 204d, and an arrangement surface 204e located radially inward of the second cylindrical portion 203 with respect to the rotation axis RA.

[0031] For example, each of the two second walls 204a, 204b may have a rectangular shape parallel to the ZX plane, with the X-axis direction as the longitudinal direction and the Z-axis direction as the short side direction. The two second walls 204a, 204b may have the same shape. The second wall 204a may be provided at a position radially opposite the second wall 204b from the rotation axis RA.

[0032] The two second arcuate wall portions 204c, 204d may be formed to define the circumferential direction by bulging away from the rotation axis RA. Alternatively, each of the second arcuate wall portions 204c, 204d may be formed to define the axial direction of each of the second arcuate wall portions 204c, 204d by extending parallel to the rotation axis RA. The second arcuate wall portion 204c may be provided at a position opposite the second arcuate wall portion 204d in the radial direction of the rotation axis RA.

[0033] For example, one longitudinal end (positive X-axis direction) of second wall portion 204a may be connected to one circumferential end (positive Y-axis direction) of second arc-shaped wall portion 204c, and one longitudinal end (negative X-axis direction) of second wall portion 204b may be connected to one circumferential end (negative Y-axis direction) of second arc-shaped wall portion 204d. For example, the other longitudinal end (negative X-axis direction) of second wall portion 204a may be connected to the other circumferential end (positive Y-axis direction) of second arc-shaped wall portion 204d, and the other longitudinal end (positive X-axis direction) of second wall portion 204b may be connected to the other circumferential end (negative Y-axis direction) of second arc-shaped wall portion 204c.

[0034] The shape of the surface formed by the arrangement surface 204e may correspond to the shape of the area surrounded by the two second wall portions 204a, 204b and the two second arc-shaped wall portions 204c, 204d when viewed in the Z-axis direction. The arrangement surface 204e may be formed by the second surface 205 as in the embodiment.

[0035] The second surface 205 is configured to be able to fix the sample holder 2 to the sample stage 3. The second surface 205 may also have at least two recesses, and in the embodiment, has a positioning portion 206 (first recess) and an idling suppression portion 207 (second recess). The second surface 205 may be located opposite the first surface 200 in the direction in which the rotation axis RA extends. The XY plane may also be a plane parallel to the first surface 200 and the second surface 205.

[0036] The positioning portion 206 is provided to position the sample holder 2 on the sample stage 3. For example, the positioning portion 206 is provided at a position on the rotation axis RA. For example, the positioning portion 206 may be defined on the second surface 205 as a first recess into which a positioning portion 31 (for example, a first convex portion) provided on the rotation axis RA on the sample stage 3 is inserted. For example, the positioning portion 206 may be a recessed hole having a tapered portion 206a that defines a tapered shape and a cylindrical portion 206b that defines a cylindrical shape. For example, the tapered portion 206a may be located closer to the opening (negative direction of the Z axis) than the cylindrical portion 206b and may expand toward the opening side.

[0037] The spin suppression portion 207 is provided to suppress spinning of the sample holder 2 relative to the sample stage 3. For example, the spin suppression portion 207 is provided at a position offset from the rotation axis RA. For example, the spin suppression portion 207 may be defined on the second surface 205 as a second recess into which a spin suppression portion 32 (e.g., a second protrusion) provided at a position offset from the rotation axis RA on the sample stage 3 is inserted. For example, the spin suppression portion 207 as the second recess may be a hole recessed in the shape of an elliptical cylinder with its major axis directed in a direction perpendicular to the rotation axis RA. The spin suppression portion 207 as the second recess may be a hole recessed in a shape having a tapered portion 207a defining the tapered shape and an elliptical cylinder portion 207b defining the elliptical cylinder shape. The tapered portion 207a may be located closer to the opening (negative direction of the Z axis) than the elliptical cylinder portion 207b and may expand toward the opening side. The positioning unit 206 and the spinning prevention unit 207 can prevent the sample holder 2 from spinning freely relative to the sample stage 3 while positioning the sample holder 2 on the sample stage 3 during imaging using radiation RD, thereby making it less likely that the image obtained will be blurred.

[0038] The holder 21 is configured to be able to hold a sample SN. The shape of the holder 21 may be selected depending on the type of sample SN. In the embodiment, the holder 21 includes a first holding element 210a, a second holding element 210b, and a third holding element 210c as a plurality of holding elements for holding the sample SN by deformation.

[0039] Each of the plurality of retaining elements 210a, 210b, and 210c may have a proximal end 211a, 211b, and 211c, a distal end 212a, 212b, and 212c, an inner wall 213a, 213b, and 213c, and an outer wall 214a, 214b, and 214c. Each of the plurality of retaining elements 210a, 210b, and 210c may have the same shape.

[0040] Each of the multiple holding elements 210a, 210b, and 210c may be configured to extend in the positive direction of the Z axis from a base end 211a, 211b, or 211c connected to the first surface 200 to a tip end 212a, 212b, or 212c. The length from the base end 211a, 211b, or 211c to the tip end 212a, 212b, or 212c is, for example, about 30 mm, but is not limited to this. Each of the tip ends 212a, 212b, and 212c may have an R-shape.

[0041] Each of the inner wall portions 213a, 213b, and 213c may be formed so as to describe an arc of a circle centered on the rotation axis RA. Also, each of the outer wall portions 214a, 214b, and 214c may be formed so as to describe an arc of a circle centered on the rotation axis RA. The diameter of the circle of the inner wall portions 213a, 213b, and 213c is smaller than the diameter of the circle of the outer wall portions 214a, 214b, and 214c.

[0042] The spacing between adjacent holding elements may be adjusted to make sample identification information (not shown) attached to the sample SN visible. For example, the sample SN may be positioned between the first holding element 210a and the second holding element 210b so that the sample identification information is located between them. In this case, the size of the spacing L1 between the first holding element 210a and the second holding element 210b may be greater than the spacing L2 between the second holding element 210b and the third holding element 210c and the spacing L3 between the third holding element 210c and the first holding element 210a. For example, the spacing L1 may be approximately 12 mm, and the spacings L2 and L3 may be approximately 5 mm, but are not limited to these. The sample identification information may include information used to identify the sample SN using any method, such as a QR code (registered trademark), a barcode, an RF tag, or image recognition. This allows the information attached to the sample SN to be read through the gap between the holding elements.

[0043] At least a portion of each of the inner walls 213a, 213b, and 213c may have multiple protrusions 215a, 215b, and 215c. The multiple protrusions 215a, 215b, and 215c may each contact the sample SN and hold the sample SN. For example, the protrusions 215a, 215b, and 215c may be provided closer to the tip ends 212a, 212b, and 212c than the base ends 211a, 211b, and 211c and protrude closer to the rotation axis RA. In an embodiment, the sample SN may be cylindrical and held by being clamped between the protrusions 215a, 215b, and 215c. This allows for the holding of a cylindrical sample SN up to the diameter of the circle defined by the inner walls 213a, 213b, and 213c. Moreover, since the sample SN can be sandwiched between the protrusions 215a, 215b, and 215c, there is no need to fix the sample SN with adhesive, double-sided tape, etc., and the sample SN can be easily attached and detached. Furthermore, since the sample SN can be sandwiched between the protrusions 215a, 215b, and 215c, if the sample SN is a battery, it can accommodate the thermal expansion of the battery.

[0044] 5 is a diagram illustrating the relationship between the sample holder 2, sample stage 3, holder waiting section 4, and holder transport section 5. When viewed from the Z axis direction, the X axis defines the direction in which the sample holder 2 moves between the holder waiting section 4 and the holder transport section 5. The Z axis defines the direction in which the sample holder 2 is placed on the sample stage 3 by the holder transport section 5.

[0045] (Sample Stage 3) The sample stage 3 may have a rotating part (not shown), a stage part 30, a positioning part 31, and an idling suppression part 32. The rotating part may rotate the stage part 30 and the sample holder 2 arranged on the stage part 30 around a rotation axis RA. The sample holder 2 may be arranged on the stage part 30 by being in surface contact with the second surface 205.

[0046] For example, the positioning portion 31 may be cylindrical and provided at a position on the rotation axis RA. For example, the positioning portion 31 as a first convex portion can be fitted into the positioning portion 206 as a first concave portion, thereby enabling the sample SN on the sample stage 3 to be more accurately positioned at the center of the optical axis of the radiation RD. Note that it is only necessary to form concaves and convexes for positioning the sample holder 2 on the sample stage 3, and the convex portion may be formed on the sample holder 2 side and the concave portion may be formed on the sample stage 3 side.

[0047] For example, the spin suppression unit 32 may be cylindrical and disposed at a position offset from the rotation axis RA. For example, the spin suppression unit 32 as a second convex portion can be fitted into the spin suppression unit 207 as a second concave portion to prevent the sample holder 2 from spinning idly independently of the sample stage 3. Note that it is sufficient to form projections and recesses that can prevent spinning between the sample holder 2 and the sample stage 3, and the projections may be formed on the sample holder 2 side and the recesses may be formed on the sample stage 3 side. The first convex portion and the second convex portion may have the same shape. This allows the sample holder 2 to be positioned on the sample stage 3 so that the sample holder 2 does not spin idly relative to the sample stage 3.

[0048] FIG. 6 is a diagram showing an example of a bottom view of the sample holder 2 and the sample stage 3 along line AA in FIG. 5. Since the anti-slip portion 32 is a cylindrical second convex portion and the anti-slip portion 207 is an elliptical cylindrical second concave portion, as shown in FIG. 6, the second convex portion fits into the second concave portion with a clearance in the X-axis direction (radial direction). The clearance may be provided on both sides of the X-axis positive direction and the X-axis negative direction, or on either side. This makes it easier for the holder transport unit 5 to insert the sample holder 2, since the concave portion is larger than the convex portion.

[0049] (Holder standby section 4) The holder standby section 4 has a plurality of holding sections 40 for holding the sample holders 2. The holding sections 40 may have a shape suitable for arranging the sample holders 2. For example, the holding sections 40 may have a step section 400 and a notch section 401. The step section 400 may be formed to be recessed in a circular shape relative to other sections of the holder standby section 4. The notch section 401 may define a space into which the second column section 204 can be inserted.

[0050] The holding unit 40 may be configured to cooperate with the second cylindrical portion 203 and the second pillar portion 204 to enable the holder standby unit 4 to hold the sample holder 2. For example, the second pillar connection surface 203e may function as a surface supported by the stepped portion 400. The notch 401 may be shaped so that it fits the two second walls 204a, 204b and the second arc-shaped wall 204d when the second pillar portion 204 is inserted, or may have a small clearance. This enables the holder standby unit 4 to hold the sample holder 2. Furthermore, when the holder standby unit 4 holds the sample holder 2, the sample holder 2 can be positioned circumferentially about the rotation axis RA.

[0051] (Holder transport section 5) The holder transport unit 5 transports the sample holder 2 between the holder waiting unit 4 and the sample stage 3. The holder transport unit 5 may have a shape suitable for transporting the sample holder 2. For example, the holder transport unit 5 may have two parallel portions 50a, 50b and a curved portion 51. The parallel portions 50a, 50b extend parallel to each other. The curved portion 51 may be connected to the ends of the parallel portions 50a, 50b on the same side, and may have an arc shape corresponding to the first arc-shaped wall portion 202d.

[0052] The holder transport unit 5 may be configured to cooperate with the first cylindrical portion 201 and the first pillar portion 202 to hold the sample holder 2. For example, the holder transport unit 5 moves in the negative direction of the X-axis so that the first pillar portion 202 is positioned in the space defined by the parallel portions 50a, 50b and the curved portion 51. The holder transport unit 5 then moves in the positive direction of the Z-axis to support the sample holder 2 with the first pillar connection surface 201e. As the holder transport unit 5 moves while supporting the sample holder 2, the holder transport unit 5 transports the sample holder 2. The parallel portions 50a, 50b and the curved portion 51 may be shaped to fit the two first walls 202a, 202b and the first arc-shaped wall 202d, or may have a shape that provides a slight clearance. This allows the holder transport unit 5 to hold the sample holder 2. Furthermore, when the sample holder 2 is held by the holder transport unit 5, the sample holder 2 can be positioned in the circumferential direction of the rotation axis RA.

[0053] According to the present disclosure, the sample holder 2 that is expected to rotate on the sample stage 3 can be more appropriately fixed.

[0054] [others] Next, modified sample holders 1000 and 2000 will be described with reference to FIGS.

[0055] 7 is a diagram showing an example of a perspective view of a sample holder 1000. A base 1020 of the sample holder 1000 of the modified example has substantially the same configuration as the base 20 of the embodiment. The holding portion 1021 has a first holding element 1021a, a second holding element 1021b, and a third holding element 1021c. The first holding element 1021a, the second holding element 1021b, and the third holding element 1021c each have a larger arc formed about the rotation axis RA than the first holding element 210a, the second holding element 210b, and the third holding element 210c, respectively.

[0056] 8 is a diagram showing an example of a perspective view of a sample holder 2000. A base 2020 of the sample holder 2000 of the modified example has substantially the same configuration as the base 20 of the embodiment. The holding portion 2021 further has a fourth holding element 2021d in addition to a first holding element 2021a, a second holding element 2021b, and a third holding element 2021c, and these holding elements are arranged to describe an arc around the rotation axis RA.

[0057] In the embodiment, the holder identification portion DI is described as being provided on the first cylindrical portion 201, but in a modified example, it may be provided at any position, for example, on the second cylindrical portion 203, etc.

[0058] In the modified example, the holder standby unit 4 does not need to use the second pillar connecting surface 203e, the second wall portions 204a, 204b, and the second arc-shaped wall portion 204d to hold the sample holder 2, but may use the second pillar connecting surface 203e, the second wall portions 204a, 204b, and the second arc-shaped wall portion 204c, or may use the first pillar connecting surface 201e, the first wall portions 202a, 202b, and the first arc-shaped wall portion 202c, or may use the first pillar connecting surface 201e, the first wall portions 202a, 202b, and the first arc-shaped wall portion 202d. The same applies to the holder transport unit 5.

[0059] The present disclosure may be provided in the following aspects:

[0060] (1) A sample holder used for radiation measurements, comprising a base and a holding portion, the base configured to rotate around a rotation axis, having a first surface and a second surface, the first surface connected to the holding portion, the second surface having a first recess and a second recess, and positioned opposite the first surface in the direction of extension of the rotation axis, the first recess being provided at a position on the rotation axis and the second recess being provided at a position offset from the rotation axis, and the holding portion configured to be able to hold a sample.

[0061] According to this aspect, it is possible to more appropriately fix the sample holder, which is expected to rotate on the sample stage.

[0062] (2) A sample holder as described in (1) above, wherein the first surface defines a cylindrical recess as the first recess, and the first surface defines an elliptical cylindrical recess with its major axis directed perpendicular to the rotation axis as the second recess.

[0063] According to this aspect, the sample holder can be prevented from rotating freely relative to the sample stage while being positioned on the sample stage.

[0064] (3) In the sample holder described in (2) above, the sample holder is configured to be able to be placed on a sample stage, the sample stage having a rotating portion, a first convex portion, and a second convex portion, the rotating portion rotates the sample holder around the rotation axis, the first convex portion is cylindrical, is located at a position on the rotation axis, and engages with the first concave portion, and the second convex portion is cylindrical, is located at a position offset from the rotation axis, and engages with the second concave portion with clearance in the radial direction of the rotation axis.

[0065] According to this aspect, the sample holder can be positioned on the sample stage so that the sample holder does not rotate freely relative to the sample stage.

[0066] (4) In the sample holder described in any one of (1) to (3) above, the base portion has a first cylindrical portion, a first pillar portion, a second cylindrical portion, and a second pillar portion extending from the first surface toward the second surface, the first cylindrical portion has a cylindrical shape and has the first surface, the first pillar portion is connected to the first cylindrical portion, has a pillar shape, and has two first wall portions radially inward of the first cylindrical portion with respect to the rotation axis, and one of the two first wall portions is inclined to the other first wall portion. a second cylindrical portion connected to the first cylindrical portion and having a cylindrical shape; the second cylindrical portion connected to the second cylindrical portion, having the second surface, and having a cylindrical shape; and two second wall portions located radially inward of the second cylindrical portion with respect to the rotation axis, one of the two second wall portions being located radially opposite to the other second wall portion with respect to the rotation axis.

[0067] According to this aspect, it is possible to hold the sample holder by the holder standby unit and the holder transport unit.

[0068] (5) In the sample holder described in (4) above, the first pillar portion has a first arcuate wall portion, which is connected to the two first wall portions and bulges away from the rotation axis, the second pillar portion has a second arcuate wall portion, which is connected to the two second wall portions and bulges away from the rotation axis, and the first arcuate wall portion is located at an opposite position to the second arcuate wall portion in the radial direction of the rotation axis.

[0069] According to this aspect, when the sample holder is held by the holder standby unit and the holder transport unit, the sample holder can be positioned in the circumferential direction of the rotation axis.

[0070] (6) A sample holder according to (4) or (5) above, wherein the first cylindrical portion has a holder identification portion, the holder identification portion is configured to be able to identify information about the sample holder, and is provided on the side surface of the first cylindrical portion and at a position opposite the second recess via the rotation axis in the radial direction of the rotation axis.

[0071] According to this aspect, the position of the holder identification portion can be fixed, so that the information on the sample holder can be efficiently identified.

[0072] (7) A sample holder according to any one of (1) to (6) above, wherein the holding portion includes a plurality of holding elements for holding the sample, each of the plurality of holding elements having a base end and an inner wall portion, each of the base ends being connected to the first surface, and at least a portion of each of the inner wall portions having a convex portion that protrudes toward the rotation axis.

[0073] According to this aspect, the sample can be held by the plurality of protrusions.

[0074] (8) A sample holder according to any one of (1) to (7) above, wherein the holding portion includes a plurality of holding elements for holding the sample by deformation, the plurality of holding elements including a first holding element, a second holding element, and a third holding element, and the size of the distance between the first holding element and the second holding element is larger than the distance between the second holding element and the third holding element.

[0075] According to this aspect, the information imparted to the sample can be read from the gaps between the holding elements.

[0076] (9) A sample holder as described in (8) above, wherein each of the first holding element, the second holding element, and the third holding element has an inner wall portion that describes an arc of a circle centered on the first surface and the rotation axis, and the sample is cylindrical in shape and is held by contact with the inner wall portion.

[0077] According to this aspect, a cylindrical sample can be held by the inner wall portion.

[0078] (10) The sample holder according to any one of (1) to (9) above, wherein the base and the holder are radiotransparent.

[0079] According to this aspect, it is possible to reduce the influence of absorption, scattering, etc. of radiation by the sample holder.

[0080] (11) A radiation measurement device comprising a sample holder arranged on a sample stage, an irradiation unit, and a detection unit, wherein the sample holder is a sample holder described in any one of (1) to (10) above, the irradiation unit irradiates radiation onto the sample placed on the sample holder, and the detection unit detects radiation that has passed through the sample.

[0081] According to this aspect, radiation measurement can be performed using the sample holder of this embodiment. Of course, this is not the case.

[0082] Finally, while various embodiments of the present disclosure have been described, they are presented as examples and are not intended to limit the scope of the invention. The novel embodiments may be embodied in various other forms, and various omissions, substitutions, and modifications may be made without departing from the spirit of the invention. Such embodiments and modifications are intended to be included within the scope and spirit of the invention, as well as within the scope of the inventions and their equivalents as defined in the claims. [Explanation of symbols]

[0083] 1: Measuring equipment 2: Sample holder 20: Base 200: 1st page 201: First cylindrical section 201a: Retaining part connection surface 201b:R wall section 201c: Outer wall 201d:R wall section 201e: First pillar connection surface 202: 1st pillar part 202a: 1st wall part 202b: 1st wall part 202c: 1st arc wall part 202d: First arc wall part 203: Second cylindrical section 203a: First pillar connection surface 203b:R wall section 203c: Outer wall 203d:R wall section 203e: Second pillar connection surface 204:Second pillar part 204a: 2nd wall part 204b: 2nd wall part 204c: Second arc wall part 204d: Second arc wall part 204e: Placement plane 205: 2nd side 206: Positioning section 206a: Tapered section 206b: Cylinder 207: Idling prevention part 207a: Tapered section 207b: Oval cylinder part 21: Holding part 210a: First holding element 210b:Second holding element 210c: Third holding element 211a: Proximal end 211b: Proximal end 211c: Proximal end 212a:Tip 212b:Tip 212c: Tip 213a:Inner wall 213b:Inner wall 213c:Inner wall 214a: Exterior wall 214b: External wall part 214c: Exterior wall 215a: Convex part 215b: Convex part 215c: Convex part 3: Sample stage 30: Stage section 31: Positioning section 32: Idling prevention section 4: Holder standby section 40: Holding part 400: Stepped section 401: Notch 5: Holder transport section 50a: Parallel section 50b: Parallel part 51:Curve section 6: Irradiation unit 7: Detection unit DI: Holder identification part L1: Interval L2: Spacing L3: Spacing RA: Rotation axis RD: Radiation SN: Sample 1000: Sample holder 1020: Base 1021: Holding part 1021a: 1st holding element 10210:Second holding element 1021c: Third holding element 2000: Sample holder 2020: Base 2021: Holding part 2021a: 1st holding element 2021b:Second holding element 2021c: 3rd retention element 2021d: 4th holding element

Claims

1. A sample holder used for radiation measurements, It has a base and a retaining part, The base is configured to rotate about a rotation axis and has a first surface and a second surface. The first surface is connected to the holding portion, The second surface has a first recess and a second recess, and is located opposite the first surface in the direction in which the rotation axis extends. The first recess is provided at a position on the rotation axis, The second recess is provided at a position offset from the axis of rotation, The holding part is configured to be able to hold a sample. Sample holder.

2. In the sample holder described in claim 1, On the second surface, a cylindrical recess is defined as the first recess. On the second surface, a hole is defined as the second recess, which is shaped like an elliptical cylinder with its major axis perpendicular to the axis of rotation. Sample holder.

3. In the sample holder described in claim 2, The sample holder is configured to be placed on the sample stage, The sample stage has a rotating part, a first protrusion, and a second protrusion. The rotating part rotates the sample holder around the rotation axis, The first protrusion is cylindrical in shape, positioned on the axis of rotation, and fits into the first recess. The second protrusion is cylindrical in shape, positioned offset from the axis of rotation, and fits with the second recess with clearance in the radial direction of the axis of rotation. Sample holder.

4. In the sample holder described in claim 1, The base portion has a first cylindrical portion, a first column portion, a second cylindrical portion, and a second column portion, extending from the first surface to the second surface. The first cylindrical portion has a cylindrical shape and has the first surface, The first column portion is connected to the first cylindrical portion, has a columnar shape, and has two first wall portions located radially inward of the rotation axis than the first cylindrical portion, and one of the two first wall portions is provided at a position opposite to the other first wall portion in the radial direction of the rotation axis. The second cylindrical portion is connected to the first cylindrical portion and has a cylindrical shape. The second column is connected to the second cylindrical portion, has the second surface, has a columnar shape, and has two second wall portions located radially inward of the rotation axis than the second cylindrical portion, with one of the two second wall portions positioned opposite the other second wall portion in the radial direction of the rotation axis. Sample holder.

5. In the sample holder described in claim 4, The first column portion has a first arc-shaped wall portion, the first arc-shaped wall portion is connected to the two first wall portions and bulges outward away from the axis of rotation, The second column portion has a second arc-shaped wall portion, which is connected to the two second wall portions and bulges outward away from the axis of rotation. The first arc-shaped wall portion is provided at a position opposite to the second arc-shaped wall portion in the radial direction of the rotation axis, via the rotation axis. Sample holder.

6. In the sample holder described in claim 4, The first cylindrical portion has a holder identification portion, The holder identification unit is, The information in the sample holder is configured to be identifiable, On the side surface of the first cylindrical portion, and in a position opposite to the second recess with respect to the radial direction of the rotation axis, Sample holder.

7. In the sample holder described in claim 1, The holding portion includes a plurality of holding elements for holding the sample, Each of the plurality of retaining elements has a base end and an inner wall portion, Each of the base ends is connected to the first surface, Each of the aforementioned inner wall portions has a protrusion, The aforementioned protrusion is positioned to protrude toward the axis of rotation. Sample holder.

8. In the sample holder described in claim 1, The holding portion includes a plurality of holding elements for holding the sample by deformation, The plurality of retaining elements include a first retaining element, a second retaining element, and a third retaining element. The distance between the first retaining element and the second retaining element is greater than the distance between the second retaining element and the third retaining element. Sample holder.

9. In the sample holder according to claim 8, Each of the first retaining element, the second retaining element, and the third retaining element has an inner wall portion that traces an arc of a circle centered on the axis of rotation, The sample is cylindrical in shape and is held by contact with the inner wall. Sample holder.

10. In the sample holder described in claim 1, The base and the holding portion are radiotransparent, Sample holder.

11. A radiation measuring device, It comprises a sample holder positioned on a sample stage, an irradiation unit, and a detection unit. The sample holder is the sample holder described in any one of claims 1 to 10. The irradiation unit irradiates the sample provided in the sample holder with radiation, The detection unit detects radiation that has passed through the sample. Measuring device.

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